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  Author Title Year Publication Volume Times cited Additional Links Links
De Backer, A.; Zhang, Z.; van den Bos, K.H.W.; Bladt, E.; Sánchez‐Iglesias, A.; Liz‐Marzán, L.M.; Nellist, P.D.; Bals, S.; Van Aert, S. Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X‐ray Spectroscopy 2022 Small methods 5 UA library record; WoS full record; WoS citing articles url doi
Hudry, D.; De Backer, A.; Popescu, R.; Busko, D.; Howard, I.A.; Bals, S.; Zhang, Y.; Pedrazo‐Tardajos, A.; Van Aert, S.; Gerthsen, D.; Altantzis, T.; Richards, B.S. Interface Pattern Engineering in Core‐Shell Upconverting Nanocrystals: Shedding Light on Critical Parameters and Consequences for the Photoluminescence Properties 2021 Small 17 UA library record; WoS full record; WoS citing articles pdf url doi
Arslan Irmak, E.; Liu, P.; Bals, S.; Van Aert, S. 3D Atomic Structure of Supported Metallic Nanoparticles Estimated from 2D ADF STEM Images: A Combination of Atom – Counting and a Local Minima Search Algorithm 2021 Small methods 12 UA library record; WoS full record; WoS citing articles pdf url doi
Albrecht, W.; Arslan Irmak, E.; Altantzis, T.; Pedrazo‐Tardajos, A.; Skorikov, A.; Deng, T.‐S.; van der Hoeven, J.E.S.; van Blaaderen, A.; Van Aert, S.; Bals, S. 3D Atomic‐Scale Dynamics of Laser‐Light‐Induced Restructuring of Nanoparticles Unraveled by Electron Tomography 2021 Advanced Materials 8 UA library record; WoS full record; WoS citing articles pdf url doi
Nerl, H.C.; Pokle, A.; Jones, L.; Müller‐Caspary, K.; Bos, K.H.W.; Downing, C.; McCarthy, E.K.; Gauquelin, N.; Ramasse, Q.M.; Lobato, I.; Daly, D.; Idrobo, J.C.; Van Aert, S.; Van Tendeloo, G.; Sanvito, S.; Coleman, J.N.; Cucinotta, C.S.; Nicolosi, V. Self‐Assembly of Atomically Thin Chiral Copper Heterostructures Templated by Black Phosphorus 2019 Advanced functional materials 29 1 UA library record; WoS full record; WoS citing articles pdf url doi
Amini, M.N.; Altantzis, T.; Lobato, I.; Grzelczak, M.; Sánchez-Iglesias, A.; Van Aert, S.; Liz-Marzán, L.M.; Partoens, B.; Bals, S.; Neyts, E.C. Understanding the Effect of Iodide Ions on the Morphology of Gold Nanorods 2018 Particle and particle systems characterization 35 6 UA library record; WoS full record; WoS citing articles url doi
Liao, Z.; Gauquelin, N.; Green, R.J.; Macke, S.; Gonnissen, J.; Thomas, S.; Zhong, Z.; Li, L.; Si, L.; Van Aert, S.; Hansmann, P.; Held, K.; Xia, J.; Verbeeck, J.; Van Tendeloo, G.; Sawatzky, G.A.; Koster, G.; Huijben, M.; Rijnders, G. Thickness dependent properties in oxide heterostructures driven by structurally induced metal-oxygen hybridization variations 2017 Advanced functional materials 27 55 UA library record; WoS full record; WoS citing articles pdf doi
van den Bos, K.H.W.; Altantzis, T.; De Backer, A.; Van Aert, S.; Bals, S. Recent breakthroughs in scanning transmission electron microscopy of small species 2018 Advances in Physics: X 3 8 UA library record; WoS full record; WoS citing articles pdf url doi
van den Bos, K.H. W.; De Backer, A.; Martinez, G.T.; Winckelmans, N.; Bals, S.; Nellist, P.D.; Van Aert, S. Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy 2016 Physical review letters 116 46 UA library record; WoS full record; WoS citing articles pdf url doi
Boschker, H.; Huijben, M.; Vailinois, A.; Verbeeck, J.; Van Aert, S.; Luysberg, M.; Bals, S.; Van Tendeloo, G.; Houwman, E.P.; Koster, G.; Blank, D.H.A.; Rijnders, G. Optimized fabrication of high-quality La0.67Sr0.33MnO3 thin films considering all essential characteristics 2011 Journal of physics: D: applied physics 44 99 UA library record; WoS full record; WoS citing articles pdf doi
Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures 2013 Physical review : B : condensed matter and materials physics 88 15 UA library record; WoS full record; WoS citing articles url doi
van Thiel, T. c.; Brzezicki, W.; Autieri, C.; Hortensius, J. r.; Afanasiev, D.; Gauquelin, N.; Jannis, D.; Janssen, N.; Groenendijk, D. j.; Fatermans, J.; Van Aert, S.; Verbeeck, J.; Cuoco, M.; Caviglia, A. d. Coupling Charge and Topological Reconstructions at Polar Oxide Interfaces 2021 Physical Review Letters 127 17 UA library record; WoS full record; WoS citing articles url doi
Müller-Caspary, K.; Duchamp, M.; Roesner, M.; Migunov, V.; Winkler, F.; Yang, H.; Huth, M.; Ritz, R.; Simson, M.; Ihle, S.; Soltau, H.; Wehling, T.; Dunin-Borkowski, R.E.; Van Aert, S.; Rosenauer, A. Atomic-scale quantification of charge densities in two-dimensional materials 2018 Physical review B 98 10 UA library record; WoS full record; WoS citing articles url doi
Molina-Luna, L.; Duerrschnabel, M.; Turner, S.; Erbe, M.; Martinez, G.T.; Van Aert, S.; Holzapfel, B.; Van Tendeloo, G. Atomic and electronic structures of BaHfO3-doped TFA-MOD-derived YBa2Cu3O7−δthin films 2015 Superconductor science and technology 28 4 UA library record; WoS full record; WoS citing articles pdf doi
Şentürk, D.G.; De Backer, A.; Van Aert, S. Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination 2024 Ultramicroscopy 259 UA library record pdf url doi
Şentürk, DG.; Yu, CP.; De Backer, A.; Van Aert, S. Atom counting from a combination of two ADF STEM images 2024 Ultramicroscopy 255 UA library record; WoS full record; WoS citing articles pdf url doi
Lobato, I.; De Backer, A.; Van Aert, S. Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network 2023 Ultramicroscopy 251 UA library record; WoS full record pdf url doi
De Backer, A.; Bals, S.; Van Aert, S. A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection 2023 Ultramicroscopy 3 UA library record; WoS full record; WoS citing articles pdf url doi
Zhang, Z.; Lobato, I.; De Backer, A.; Van Aert, S.; Nellist, P. Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions 2023 Ultramicroscopy 246 UA library record; WoS full record; WoS citing articles pdf url doi
Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S. Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors 2022 Ultramicroscopy 242 UA library record; WoS full record; WoS citing articles pdf url doi
Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution 2022 Ultramicroscopy 233 UA library record; WoS full record; WoS citing articles url doi
De wael, A.; De Backer, A.; Lobato, I.; Van Aert, S. Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt 2021 Ultramicroscopy UA library record; WoS full record; WoS citing articles pdf url doi
De wael, A.; De Backer, A.; Van Aert, S. Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations 2020 Ultramicroscopy 219 UA library record; WoS full record; WoS citing articles pdf url doi
Fatermans, J.; den Dekker, Aj.; Müller-Caspary, K.; Gauquelin, N.; Verbeeck, J.; Van Aert, S. Atom column detection from simultaneously acquired ABF and ADF STEM images 2020 Ultramicroscopy 219 9 UA library record; WoS full record; WoS citing articles url doi
De wael, A.; De Backer, A.; Jones, L.; Varambhia, A.; Nellist, P.D.; Van Aert, S. Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy 2020 Physical Review Letters 124 UA library record; WoS full record; WoS citing articles pdf url doi
Müller-Caspary, K.; Grieb, T.; Müßener, J.; Gauquelin, N.; Hille, P.; Schörmann, J.; Verbeeck, J.; Van Aert, S.; Eickhoff, M.; Rosenauer, A. Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy 2019 Physical review letters 122 26 UA library record; WoS full record; WoS citing articles pdf url doi
Jain, N.; Hao, Y.; Parekh, U.; Kaltenegger, M.; Pedrazo-Tardajos, A.; Lazzaroni, R.; Resel, R.; Geerts, Y.H.; Bals, S.; Van Aert, S. Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals 2023 Micron 169 1 UA library record; WoS full record; WoS citing articles pdf url doi
Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D. Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range 2006 Physical review letters 96 69 UA library record; WoS full record; WoS citing articles url doi
Van Aert, S.; De Backer, A.; Jones, L.; Martinez, G.T.; Béché, A.; Nellist, P.D. Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy 2019 Physical review letters 122 3 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S.; de Backer, A.; Martinez, G.T.; Goris, B.; Bals, S.; Van Tendeloo, G.; Rosenauer, A. Procedure to count atoms with trustworthy single-atom sensitivity 2013 Physical review : B : condensed matter and materials physics 87 106 UA library record; WoS full record; WoS citing articles url doi
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