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Author |
Title |
Year |
Publication  |
Volume |
Times cited |
Additional Links |
Links |
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Heidari, H.; Rivero, G.; Idrissi, H.; Ramachandran, D.; Cakir, S.; Egoavil, R.; Kurttepeli, M.; Crabbé, A.C.; Hauffman, T.; Terryn, H.; Du Prez, F.; Schryvers, D. |
Melamine–Formaldehyde Microcapsules: Micro- and Nanostructural Characterization with Electron Microscopy |
2016 |
Microscopy and microanalysis |
22 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. |
Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record |
|
|
|
Nord, M.; Verbeeck, J. |
Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis |
2019 |
Microscopy And Microanalysis |
25 |
|
|
|
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Denecke, M.A.; Somogyi, A.; Janssens, K.; Simon, R.; Dardenne, K.; Noseck, U. |
Microanalysis (micro-XRF, micro-XANES, and micro-XRD) of a tertiary sediment using microfocused synchrotron radiation |
2007 |
Microscopy and microanalysis |
13 |
31 |
UA library record; WoS full record; WoS citing articles |
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van der Linden, V.; Meesdom, E.; Devos, A.; van Dooren, R.; Nieuwdorp, H.; Janssen, E.; Balace, S.; Vekemans, B.; Vincze, L.; Janssens, K. |
PXRF, \mu-XRF, vacuum \mu-XRF, and EPMA analysis of Email Champlevé objects present in Belgian museums |
2011 |
Microscopy and microanalysis |
17 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Pennycook, T.J.; Martinez, G.T.; O'Leary, C.M.; Yang, H.; Nellist, P.D. |
Efficient Phase Contrast Imaging via Electron Ptychography, a Tutorial |
2019 |
Microscopy and microanalysis |
25 |
|
UA library record |
|
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Nord, M.; Webster, R.W.H.; Paton, K.A.; McVitie, S.; McGrouther, D.; MacLaren, I.; Paterson, G.W. |
Fast pixelated detectors in scanning transmission electron microscopy. Part I: data acquisition, live processing, and storage |
2020 |
Microscopy And Microanalysis |
26 |
4 |
UA library record; WoS full record; WoS citing articles |
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Paterson, G.W.; Webster, R.W.H.; Ross, A.; Paton, K.A.; Macgregor, T.A.; McGrouther, D.; MacLaren, I.; Nord, M. |
Fast pixelated detectors in scanning transmission electron microscopy. part II : post-acquisition data processing, visualization, and structural characterization |
2020 |
Microscopy And Microanalysis |
26 |
3 |
UA library record; WoS full record; WoS citing articles |
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MacArthur, K.E.; Yankovich, A.B.; Béché, A.; Luysberg, M.; Brown, H.G.; Findlay, S.D.; Heggen, M.; Allen, L.J. |
Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale |
2021 |
Microscopy And Microanalysis |
|
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UA library record; WoS full record; WoS citing articles |
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Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. |
Fast electron low dose tomography for beam sensitive materials |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
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Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. |
Novel thin film lift-off process for in situ TEM tensile characterization |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
|
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Ning, S.; Xu, W.; Ma, Y.; Loh, L.; Pennycook, T.J.; Zhou, W.; Zhang, F.; Bosman, M.; Pennycook, S.J.; He, Q.; Loh, N.D. |
Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets |
2022 |
Microscopy and microanalysis |
|
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UA library record; WoS full record; WoS citing articles |
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Yu, C.-P.; Friedrich, T.; Jannis, D.; Van Aert, S.; Verbeeck, J. |
Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM |
2022 |
Microscopy and microanalysis |
|
7 |
UA library record; WoS full record; WoS citing articles |
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De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. |
Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM |
2022 |
Microscopy and microanalysis |
|
|
UA library record; WoS full record |
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Vega Ibañez, F.; Béché, A.; Verbeeck, J. |
Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? |
2022 |
Microscopy and microanalysis |
|
3 |
UA library record; WoS full record; WoS citing articles |
|
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Friedrich, T.; Yu, C.-P.; Verbeeck, J.; Van Aert, S. |
Phase object reconstruction for 4D-STEM using deep learning |
2023 |
Microscopy and microanalysis |
29 |
1 |
UA library record; WoS full record; WoS citing articles |
|
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Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Microscopy of Semiconducting Materials |
107 |
|
UA library record; WoS full record; |
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Schryvers, D.; Goessens, C.; Safran, G.; Toth, L. |
Internal calibration technique for HREM studies of nanoscale particles |
1993 |
Microscopy research and technique
T2 – JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM |
25 |
1 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A.; Xu, Y.-E.; Wang, S.-E.; Park, I.-Y.; Kang, T.-S. |
Combined characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques |
1998 |
Microscopy research and technique |
42 |
4 |
UA library record; WoS full record; WoS citing articles |
|
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Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. |
Evaluation of top, angle, and side cleaned FIB samples for TEM analysis |
2007 |
Microscopy research and technique |
70 |
36 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bertoni, G.; Verbeeck, J.; Brosens, F. |
Fitting the momentum dependent loss function in EELS |
2011 |
Microscopy research and technique |
74 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
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Zelaya, E.; Schryvers, D. |
Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite |
2011 |
Microscopy research and technique |
74 |
2 |
UA library record; WoS full record; WoS citing articles |
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Van Tendeloo, G.; Krekels, T.; Amelinckx, S.; Babu, T.G.N.; Greaves, C.; Hervieu, M.; Michel, C.; Raveau, B. |
Structural investigations of recently discovered high Tc superconductors |
1995 |
Microscopy research and technique |
30 |
4 |
UA library record; WoS full record; WoS citing articles |
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De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. |
The study of partially ordered 11/20 alloys by HREM |
1993 |
Microscopy research and technique |
25 |
|
UA library record; WoS full record |
|
|
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Goessens, C.; Schryvers, D.; van Landuyt, J. |
Transmission electron microscopy studies of (111) twinned silver halide microcrystals |
1998 |
Microscopy research and technique |
42 |
8 |
UA library record; WoS full record; WoS citing articles |
|
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Pourbabak, S.; Orekhov, A.; Schryvers, D. |
Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires |
2020 |
Microscopy Research And Technique |
|
|
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.; Gijbels, R.; Jacob, W.; Lakiere, F.; van Daele, A.; Silaev, E.; Kaplun, L. |
Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis |
1995 |
Microscopy, microanalysis, microstructures |
6 |
7 |
UA library record; WoS full record; WoS citing articles |
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Verbist, K.; Van Tendeloo, G.; Ye, M.; Schroeder, J.; Mehbod, M.; Deltour, R. |
Inclusions in magnetron sputtered YBa2Cu3-x MxO7-d thin films: a study by means of electron microscopy |
1996 |
Microscopy, microanalysis, microstructures |
7 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
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Hervieu; Van Tendeloo, G.; Michel; Pelloquin; Raveau |
Mixed layers in copper based superconducting materials |
1996 |
Microscopy, microanalysis, microstructures |
7 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Dyck, D.; Van Aert, S.; Croitoru, M.D. |
Obstacles on the road towards atomic resolution tomography |
2005 |
Microscoy and microanalysis |
11 |
|
UA library record |
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