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	Author	Pourbabak, S.; Orekhov, A.; Schryvers, D.
	Title	Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires			Type	A1 Journal article
	Year	2020	Publication	Microscopy Research And Technique	Abbreviated Journal	Microsc Res Techniq
	Volume		Issue		Pages	1-7
	Keywords	A1 Journal article; Electron microscopy for materials research (EMAT)
	Abstract	A method to prepare TEM specimens from metallic microwires and based on conventional twin-jet electropolishing is introduced. The wire is embedded in an opaque epoxy resin medium and the hardened resin is mechanically polished to reveal the wire on both sides. The resin containing wire is then cut into discs of the appropriate size. The obtained embedded wire is electropolished in a conventional twin-jet electropolishing machine until electron transparency in large areas without radiation damage is achieved.
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	Corporate Author				Thesis
	Publisher		Place of Publication		Editor
	Language		Wos	000567944200001	Publication Date	2020-09-28
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	1059-910x	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor	2.5	Times cited		Open Access	OpenAccess
	Notes	; Fonds Wetenschappelijk Onderzoek, Grant/Award Number: G.0366.15N ;			Approved	Most recent IF: 2.5; 2020 IF: 1.147
	Call Number	UA @ admin @ c:irua:171969			Serial	6642
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