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  Author Title Year (down) Publication Volume Times cited Additional Links Links
De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM 2022 Microscopy and microanalysis UA library record; WoS full record pdf url doi
Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S. Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors 2022 Ultramicroscopy 242 UA library record; WoS full record; WoS citing articles pdf url doi
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