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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. Novel thin film lift-off process for in situ TEM tensile characterization 2021 Microscopy And Microanalysis 27 UA library record doi
Idrissi, H.; Kobler, A.; Amin-Ahmadi, B.; Coulombier, M.; Galceran, M.; Raskin, J.-P.; Godet, S.; Kuebel, C.; Pardoen, T.; Schryvers, D. Plasticity mechanisms in ultrafine grained freestanding aluminum thin films revealed by in-situ transmission electron microscopy nanomechanical testing 2014 Applied physics letters 104 24 UA library record; WoS full record; WoS citing articles doi
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