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	Author	Bertoni, G.; Verbeeck, J.; Brosens, F.
	Title	Fitting the momentum dependent loss function in EELS			Type	A1 Journal article
	Year	2011	Publication	Microscopy research and technique	Abbreviated Journal	Microsc Res Techniq
	Volume	74	Issue	3	Pages	212-218
	Keywords	A1 Journal article; Electron microscopy for materials research (EMAT); Theory of quantum systems and complex systems
	Abstract	Momentum dependent inelastic plasmon scattering can be measured by electron energy loss in a transmission electron microscope. From energy filtered diffraction, the characteristic angle of scattering and the cutoff angle are measured, using a thin film of aluminum as a model test. Rather than deconvolving the data (as done in previous works), a fitting technique is used to extract the loss function from angular resolved spectra, starting from a simple model simulation.
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	Corporate Author				Thesis
	Publisher		Place of Publication	New York, N.Y.	Editor
	Language		Wos	000288095200002	Publication Date	2010-07-06
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	1059-910X;	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor	1.147	Times cited	6	Open Access
	Notes	Fwo; Esteem; Iap; Goa			Approved	Most recent IF: 1.147; 2011 IF: 1.792
	Call Number	UA @ lucian @ c:irua:88782UA @ admin @ c:irua:88782			Serial	1222
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