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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Verbist, K.; Van Tendeloo, G.; Ye, M.; Schroeder, J.; Mehbod, M.; Deltour, R. |
Inclusions in magnetron sputtered YBa2Cu3-x MxO7-d thin films: a study by means of electron microscopy |
1996 |
Microscopy, microanalysis, microstructures |
7 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Hervieu; Van Tendeloo, G.; Michel; Pelloquin; Raveau |
Mixed layers in copper based superconducting materials |
1996 |
Microscopy, microanalysis, microstructures |
7 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Oleshko, V.; Gijbels, R.; Jacob, W.; Lakiere, F.; van Daele, A.; Silaev, E.; Kaplun, L. |
Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis |
1995 |
Microscopy, microanalysis, microstructures |
6 |
7 |
UA library record; WoS full record; WoS citing articles |
|
