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Author Zelaya, E.; Schryvers, D. pdf  doi
openurl 
  Title Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite Type A1 Journal article
  Year (down) 2011 Publication Microscopy research and technique Abbreviated Journal Microsc Res Techniq  
  Volume 74 Issue 1 Pages 84-91  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract The irradiation effects of thinning a sample of a Cu-Zn-Al shape memory alloy to electron transparency by a Ga+ focused ion beam were investigated. This thinning method was compared with conventional electropolishing and Ar+ ion milling. No implanted Ga was detected but surface FCC precipitation was found as a result of the focused ion beam sample preparation. Decreasing the irradiation dose by lowering the energy and current of the Ga+ ions did not lead to a complete disappearance of the FCC structure. The latter could only be removed after gentle Ar+ ion milling of the sample. It was further concluded that the precipitation of the FCC is independent of the crystallographic orientation of the surface.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York, N.Y. Editor  
  Language Wos 000285976000012 Publication Date 2010-05-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1059-910X; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.147 Times cited 2 Open Access  
  Notes Approved Most recent IF: 1.147; 2011 IF: 1.792  
  Call Number UA @ lucian @ c:irua:85994 Serial 2852  
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