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  Author Title Year Publication Volume Times cited Additional Links Links
Verbeeck, J.; Van Aert, S.; Bertoni, G. Model-based quantification of EELS spectra: including the fine structure 2006 Ultramicroscopy 106 38 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Van Aert, S.; van Dyck, D. A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy 2010 Ultramicroscopy 110 16 UA library record; WoS full record; WoS citing articles pdf doi
de Backer, A.; De wael, A.; Gonnissen, J.; Van Aert, S. Optimal experimental design for nano-particle atom-counting from high-resolution STEM images 2015 Ultramicroscopy 151 24 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. Optimal experimental design of STEM measurement of atom column positions 2002 Ultramicroscopy 90 35 UA library record; WoS full record; WoS citing articles doi
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? 2012 Ultramicroscopy 114 5 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy 2009 Ultramicroscopy 109 166 UA library record; WoS full record; WoS citing articles pdf doi
Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy 2014 Ultramicroscopy 137 74 UA library record; WoS full record; WoS citing articles pdf doi
Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. Quantitative STEM normalisation : the importance of the electron flux 2015 Ultramicroscopy 159 27 UA library record; WoS full record; WoS citing articles pdf url doi
van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. Throughput maximization of particle radius measurements by balancing size and current of the electron probe 2011 Ultramicroscopy 111 7 UA library record; WoS full record; WoS citing articles pdf doi
Lobato, I.; Van Aert, S.; Verbeeck, J. Progress and new advances in simulating electron microscopy datasets using MULTEM 2016 Ultramicroscopy 168 43 UA library record; WoS full record; WoS citing articles pdf doi
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design 2016 Ultramicroscopy 170 6 UA library record; WoS full record; WoS citing articles pdf url doi
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images 2016 Ultramicroscopy 171 43 UA library record; WoS full record; WoS citing articles pdf url doi
Martinez, G.T.; van den Bos, K.H.W.; Alania, M.; Nellist, P.D.; Van Aert, S. Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy 2018 Ultramicroscopy 187 4 UA library record; WoS full record; WoS citing articles pdf url doi
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. Locating light and heavy atomic column positions with picometer precision using ISTEM 2016 Ultramicroscopy 172 8 UA library record; WoS full record; WoS citing articles url doi
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question 2016 Ultramicroscopy 174 2 UA library record; WoS full record; WoS citing articles url doi
Alania, M.; Altantzis, T.; De Backer, A.; Lobato, I.; Bals, S.; Van Aert, S. Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure 2016 Ultramicroscopy 177 13 UA library record; WoS full record; WoS citing articles pdf url doi
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? 2017 Ultramicroscopy 181 3 UA library record; WoS full record; WoS citing articles pdf url doi
Gauquelin, N.; van den Bos, K.H.W.; Béché, A.; Krause, F.F.; Lobato, I.; Lazar, S.; Rosenauer, A.; Van Aert, S.; Verbeeck, J. Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques 2017 Ultramicroscopy 181 34 UA library record; WoS full record; WoS citing articles pdf url doi
De wael, A.; De Backer, A.; Jones, L.; Nellist, P.D.; Van Aert, S. Hybrid statistics-simulations based method for atom-counting from ADF STEM images 2017 Ultramicroscopy 177 8 UA library record; WoS full record; WoS citing articles pdf url doi
Alania, M.; Lobato Hoyos, I.P.; Van Aert, S. Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy : a comparison study in terms of integrated intensity and atomic column position measurement 2018 Ultramicroscopy 184 UA library record; WoS full record; WoS citing articles pdf url doi
Schryvers, D.; Salje, E.K.H.; Nishida, M.; De Backer, A.; Idrissi, H.; Van Aert, S. Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations 2017 Ultramicroscopy 176 1 UA library record; WoS full record; WoS citing articles pdf url doi
van den Bos, K.H.W.; Janssens, L.; De Backer, A.; Nellist, P.D.; Van Aert, S. The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials 2019 Ultramicroscopy 203 4 UA library record; WoS full record; WoS citing articles url doi
Fatermans, J.; Van Aert, S.; den Dekker, A.J. The maximum a posteriori probability rule for atom column detection from HAADF STEM images 2019 Ultramicroscopy 201 1 UA library record; WoS full record; WoS citing articles url doi
Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose 2019 Ultramicroscopy 203 25 UA library record; WoS full record; WoS citing articles pdf url doi
De wael, A.; De Backer, A.; Lobato, I.; Van Aert, S. Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt 2021 Ultramicroscopy UA library record; WoS full record; WoS citing articles pdf url doi
Yu, C.-P.; Friedrich, T.; Jannis, D.; Van Aert, S.; Verbeeck, J. Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM 2022 Microscopy and microanalysis 7 UA library record; WoS full record; WoS citing articles pdf url doi
De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM 2022 Microscopy and microanalysis UA library record; WoS full record pdf url doi
Friedrich, T.; Yu, C.-P.; Verbeeck, J.; Van Aert, S. Phase object reconstruction for 4D-STEM using deep learning 2023 Microscopy and microanalysis 29 1 UA library record; WoS full record; WoS citing articles url doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. High-resolution electron microscopy and electron tomography: resolution versus precision 2002 Journal of structural biology 138 33 UA library record; WoS full record; WoS citing articles doi
Guzzinati, G.; Altantzis, T.; Batuk, M.; De Backer, A.; Lumbeeck, G.; Samaee, V.; Batuk, D.; Idrissi, H.; Hadermann, J.; Van Aert, S.; Schryvers, D.; Verbeeck, J.; Bals, S. Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp 2018 Materials 11 15 UA library record; WoS full record; WoS citing articles url doi
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