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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Shpanchenko, R.V.; Nistor, L.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. |
Structural studies on new ternary oxides Ba8Ta4Ti3O24 and Ba10Ta7.04Ti1.2O30 |
1995 |
Journal of solid state chemistry |
114 |
23 |
UA library record; WoS full record; WoS citing articles |
|
|
Shpanchenko, R.V.; Abakumov, A.M.; Antipov, E.V.; Nistor, L.; Van Tendeloo, G.; Amelinckx, S. |
Structural study of the new complex oxides Ba5-ySryR2-xAl2Zr1+xO13+x/2 (R=Gd-Lu, Y, Sc) |
1995 |
Journal of solid state chemistry |
118 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
Milat, O.; Van Tendeloo, G.; Amelinckx, S.; Babu, T.G.N.; Greaves, C. |
Structural variants of Ca0.85CuO2(Ca5+xCu6O12) |
1992 |
Journal of solid state chemistry |
101 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
Milat, O.; Van Tendeloo, G.; Amelinckx, S.; Babu, T.G.N.; Greaves, C. |
Superstructure and structural variants in Sr2CuO2(CO3) |
1994 |
Journal of solid state chemistry |
109 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
Hervieu, M.; Van Tendeloo, G.; Michel, C.; Martin, C.; Maignan, A.; Raveau, B. |
Synthesis and characterization of mercury based “1222” cuprates (Hg1-xMx)(Sr,Ba)2Pr2Cu2O9-\delta (M = Pr, Pb, Bi, Tl) |
1995 |
Journal of solid state chemistry |
115 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
Milat, O.; Van Tendeloo, G.; Amelinckx, S.; Babu, T.G.N.; Greaves, C. |
The modulated structure of Ca.85CuO2 as studied by means of electron diffraction and microscopy |
1992 |
Journal of solid state chemistry |
97 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
Lebedev, O.I.; Verbeeck, J.; Van Tendeloo, G.; Amelinckx, S.; Ravazi, F.S.; Habermeier, H.-U. |
Structure and microstructure of La1-xSrxMnO3 (x=0.16) films grown on a SrTiO3(110) substrate |
2001 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
81 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
Vandebroek, M.; Belis, J.; Louter, C.; Van Tendeloo, G. |
Experimental validation of edge strength model for glass with polished and cut edge finishing |
2012 |
Engineering fracture mechanics |
96 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
Laffez, P.; Van Tendeloo, G.; Seshadri, R.; Hervieu, M.; Martin, C.; Maignan, A.; Raveau, B. |
Microstructural and physical properties of layered manganite oxides related to the magnetoresistive perovskites |
1996 |
Journal of applied physics |
80 |
36 |
UA library record; WoS full record; WoS citing articles |
|
|
Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; Hevesi, K.; Gensterblum, G.; Yu, L.M.; Pireaux, J.J.; Grey, F.; Bohr, J. |
Structural defects and epitaxial rotation of C60 and C70 (111) films on GeS(001) |
1996 |
Journal of applied physics |
80 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
Evans, T.; Kiflawi, I.; Luyten, W.; Van Tendeloo, G.; Woods, G.S. |
Conversion of platelets into dislocation loops and voidite formation in type IaB diamonds |
1995 |
Proceedings of the Royal Society of London: series A: mathematical and physical sciences |
449 |
32 |
UA library record; WoS full record; WoS citing articles |
|
|
Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. |
Evaluation of different rectangular scan strategies for STEM imaging |
2020 |
Ultramicroscopy |
|
13 |
UA library record; WoS full record; WoS citing articles |
|
|
Fatermans, J.; den Dekker, Aj.; Müller-Caspary, K.; Gauquelin, N.; Verbeeck, J.; Van Aert, S. |
Atom column detection from simultaneously acquired ABF and ADF STEM images |
2020 |
Ultramicroscopy |
219 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
Prabhakara, V.; Jannis, D.; Guzzinati, G.; Béché, A.; Bender, H.; Verbeeck, J. |
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale |
2020 |
Ultramicroscopy |
219 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
De wael, A.; De Backer, A.; Van Aert, S. |
Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations |
2020 |
Ultramicroscopy |
219 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings |
2022 |
Ultramicroscopy |
232 |
18 |
UA library record; WoS full record; WoS citing articles |
|
|
Jannis, D.; Hofer, C.; Gao, C.; Xie, X.; Béché, A.; Pennycook, Tj.; Verbeeck, J. |
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications |
2022 |
Ultramicroscopy |
233 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
Hofer, C.; Pennycook, T.J. |
Reliable phase quantification in focused probe electron ptychography of thin materials |
2023 |
Ultramicroscopy |
254 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Gorji, S.; Kashiwar, A.; Mantha, L.S.; Kruk, R.; Witte, R.; Marek, P.; Hahn, H.; Kübel, C.; Scherer, T. |
Nanowire facilitated transfer of sensitive TEM samples in a FIB |
2020 |
Ultramicroscopy |
219 |
|
UA library record |
|
|
Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. |
Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution |
2022 |
Ultramicroscopy |
233 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process |
2022 |
Ultramicroscopy |
|
4 |
UA library record; WoS full record; WoS citing articles |
|
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Hofer, C.; Gao, C.; Chennit, T.; Yuan, B.; Pennycook, T.J. |
Phase offset method of ptychographic contrast reversal correction |
2024 |
Ultramicroscopy |
|
|
UA library record; WoS full record |
|
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Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S. |
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors |
2022 |
Ultramicroscopy |
242 |
|
UA library record; WoS full record; WoS citing articles |
|
|
De Backer, A.; Bals, S.; Van Aert, S. |
A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection |
2023 |
Ultramicroscopy |
|
3 |
UA library record; WoS full record; WoS citing articles |
|
|
Zhang, Z.; Lobato, I.; De Backer, A.; Van Aert, S.; Nellist, P. |
Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions |
2023 |
Ultramicroscopy |
246 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Lobato, I.; De Backer, A.; Van Aert, S. |
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network |
2023 |
Ultramicroscopy |
251 |
|
UA library record; WoS full record |
|
|
Denisov, N.; Jannis, D.; Orekhov, A.; Müller-Caspary, K.; Verbeeck, J. |
Characterization of a Timepix detector for use in SEM acceleration voltage range |
2023 |
Ultramicroscopy |
253 |
|
UA library record; WoS full record |
|
|
Şentürk, DG.; Yu, CP.; De Backer, A.; Van Aert, S. |
Atom counting from a combination of two ADF STEM images |
2024 |
Ultramicroscopy |
255 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Van den Broek, W.; Jannis, D.; Verbeeck, J. |
Convexity constraints on linear background models for electron energy-loss spectra |
2023 |
Ultramicroscopy |
254 |
|
UA library record |
|
|
Şentürk, D.G.; De Backer, A.; Van Aert, S. |
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination |
2024 |
Ultramicroscopy |
259 |
|
UA library record |
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