|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design |
2016 |
Ultramicroscopy |
170 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question |
2016 |
Ultramicroscopy |
174 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S. |
Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images |
2014 |
Applied physics letters |
105 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
Gonnissen, J.; Batuk, D.; Nataf, G.F.; Jones, L.; Abakumov, A.M.; Van Aert, S.; Schryvers, D.; Salje, E.K.H. |
Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall-Meanders, Kinks, and Local Electric Charges |
2016 |
Advanced functional materials |
26 |
23 |
UA library record; WoS full record; WoS citing articles |
|
|
Geuchies, J.J.; van Overbeek, C.; Evers, W.H.; Goris, B.; de Backer, A.; Gantapara, A.P.; Rabouw, F.T.; Hilhorst, J.; Peters, J.L.; Konovalov, O.; Petukhov, A.V.; Dijkstra, M.; Siebbeles, L.D.A.; van Aert, S.; Bals, S.; Vanmaekelbergh, D. |
In situ study of the formation mechanism of two-dimensional superlattices from PbSe nanocrystals |
2016 |
Nature materials |
15 |
182 |
UA library record; WoS full record; WoS citing articles |
|
|
Gauquelin, N.; van den Bos, K.H.W.; Béché, A.; Krause, F.F.; Lobato, I.; Lazar, S.; Rosenauer, A.; Van Aert, S.; Verbeeck, J. |
Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques |
2017 |
Ultramicroscopy |
181 |
34 |
UA library record; WoS full record; WoS citing articles |
|
|
Friedrich, T.; Yu, C.-P.; Verbeek, J.; Pennycook, T.; Van Aert, S. |
Phase retrieval from 4-dimensional electron diffraction datasets |
2021 |
Proceedings
T2 – IEEE International Conference on Image Processing (ICIP), SEP 19-22, 2021, Electr. network |
|
|
UA library record; WoS full record; WoS citing articles |
|
|
Friedrich, T.; Yu, C.-P.; Verbeeck, J.; Van Aert, S. |
Phase object reconstruction for 4D-STEM using deep learning |
2023 |
Microscopy and microanalysis |
29 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Fatermans, J.; Van Aert, S.; den Dekker, A.J. |
The maximum a posteriori probability rule for atom column detection from HAADF STEM images |
2019 |
Ultramicroscopy |
201 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Fatermans, J.; Romolini, G.; Altantzis, T.; Hofkens, J.; Roeffaers, M.B.J.; Bals, S.; Van Aert, S. |
Atomic-scale detection of individual lead clusters confined in Linde Type A zeolites |
2022 |
Nanoscale |
|
2 |
UA library record; WoS full record; WoS citing articles |
|
|
Fatermans, J.; den Dekker, Aj.; Müller-Caspary, K.; Gauquelin, N.; Verbeeck, J.; Van Aert, S. |
Atom column detection from simultaneously acquired ABF and ADF STEM images |
2020 |
Ultramicroscopy |
219 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
Fatermans, J.; den Dekker, A. J.; Müller-Caspary, K.; Lobato, I.; O’Leary, C. M.; Nellist, P. D.; Van Aert, S. |
Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images |
2018 |
Physical review letters |
121 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Atom column detection |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
|
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Image-quality evaluation and model selection with maximum a posteriori probability |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
|
Egoavil, R.; Gauquelin, N.; Martinez, G.T.; Van Aert, S.; Van Tendeloo, G.; Verbeeck, J. |
Atomic resolution mapping of phonon excitations in STEM-EELS experiments |
2014 |
Ultramicroscopy |
147 |
22 |
UA library record; WoS full record; WoS citing articles |
|
|
Dunin-Borkowski, R.E.; Lichte, H.; Tillmann, K.; Van Aert, S.; Van Tendeloo, G. |
Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays |
2013 |
Ultramicroscopy |
134 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. |
Does a monochromator improve the precision in quantitative HRTEM? |
2001 |
Ultramicroscopy |
89 |
22 |
UA library record; WoS full record; WoS citing articles |
|
|
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework |
2005 |
Ultramicroscopy |
104 |
70 |
UA library record; WoS full record; WoS citing articles |
|
|
den Dekker, A.J.; Gonnissen, J.; de Backer, A.; Sijbers, J.; Van Aert, S. |
Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits? |
2013 |
Ultramicroscopy |
134 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
Delfino, C.L.; Hao, Y.; Martin, C.; Minoia, A.; Gopi, E.; Mali, K.S.; Van der Auweraer, M.; Geerts, Y.H.; Van Aert, S.; Lazzaroni, R.; De Feyter, S. |
Conformation-Dependent Monolayer and Bilayer Structures of an Alkylated TTF Derivative Revealed using STM and Molecular Modeling |
2023 |
The Journal of Physical Chemistry C |
127 |
|
UA library record; WoS full record |
|
|
De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. |
Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM |
2022 |
Microscopy and microanalysis |
|
|
UA library record; WoS full record |
|
|
De wael, A.; De Backer, A.; Van Aert, S. |
Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations |
2020 |
Ultramicroscopy |
219 |
|
UA library record; WoS full record; WoS citing articles |
|
|
De wael, A.; De Backer, A.; Lobato, I.; Van Aert, S. |
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt |
2021 |
Ultramicroscopy |
|
|
UA library record; WoS full record; WoS citing articles |
|
|
De wael, A.; De Backer, A.; Jones, L.; Varambhia, A.; Nellist, P.D.; Van Aert, S. |
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy |
2020 |
Physical Review Letters |
124 |
|
UA library record; WoS full record; WoS citing articles |
|
|
De wael, A.; De Backer, A.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Hybrid statistics-simulations based method for atom-counting from ADF STEM images |
2017 |
Ultramicroscopy |
177 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
De Backer, A.; Zhang, Z.; van den Bos, K.H.W.; Bladt, E.; Sánchez‐Iglesias, A.; Liz‐Marzán, L.M.; Nellist, P.D.; Bals, S.; Van Aert, S. |
Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X‐ray Spectroscopy |
2022 |
Small methods |
|
5 |
UA library record; WoS full record; WoS citing articles |
|
|
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. |
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images |
2016 |
Ultramicroscopy |
171 |
43 |
UA library record; WoS full record; WoS citing articles |
|
|
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. |
StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images |
2017 |
Journal of physics : conference series
T2 – Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK |
902 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
de Backer, A.; Van Aert, S.; van Dyck, D. |
High precision measurements of atom column positions using model-based exit wave reconstruction |
2011 |
Ultramicroscopy |
111 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
De Backer, A.; Van Aert, S.; Faes, C.; Arslan Irmak, E.; Nellist, P.D.; Jones, L. |
Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm |
2022 |
N P J Computational Materials |
8 |
|
UA library record; WoS full record; WoS citing articles |
|