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  Author Title Year Publication (down) Volume Times cited Additional Links Links
Jannis, D.; Hofer, C.; Gao, C.; Xie, X.; Béché, A.; Pennycook, Tj.; Verbeeck, J. Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications 2022 Ultramicroscopy 233 31 UA library record; WoS full record; WoS citing articles pdf url doi
Madsen, J.; Pennycook, T.J.; Susi, T. ab initio description of bonding for transmission electron microscopy 2021 Ultramicroscopy 231 UA library record; WoS full record; WoS citing articles url doi
Hofer, C.; Pennycook, T.J. Reliable phase quantification in focused probe electron ptychography of thin materials 2023 Ultramicroscopy 254 UA library record; WoS full record; WoS citing articles pdf url doi
Gorji, S.; Kashiwar, A.; Mantha, L.S.; Kruk, R.; Witte, R.; Marek, P.; Hahn, H.; Kübel, C.; Scherer, T. Nanowire facilitated transfer of sensitive TEM samples in a FIB 2020 Ultramicroscopy 219 UA library record doi
Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution 2022 Ultramicroscopy 233 UA library record; WoS full record; WoS citing articles url doi
Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process 2022 Ultramicroscopy 4 UA library record; WoS full record; WoS citing articles url doi
Hofer, C.; Gao, C.; Chennit, T.; Yuan, B.; Pennycook, T.J. Phase offset method of ptychographic contrast reversal correction 2024 Ultramicroscopy UA library record pdf url doi
Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S. Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors 2022 Ultramicroscopy 242 UA library record; WoS full record; WoS citing articles pdf url doi
De Backer, A.; Bals, S.; Van Aert, S. A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection 2023 Ultramicroscopy 3 UA library record; WoS full record; WoS citing articles pdf url doi
Zhang, Z.; Lobato, I.; De Backer, A.; Van Aert, S.; Nellist, P. Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions 2023 Ultramicroscopy 246 UA library record; WoS full record; WoS citing articles pdf url doi
Lobato, I.; De Backer, A.; Van Aert, S. Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network 2023 Ultramicroscopy 251 UA library record; WoS full record pdf url doi
Denisov, N.; Jannis, D.; Orekhov, A.; Müller-Caspary, K.; Verbeeck, J. Characterization of a Timepix detector for use in SEM acceleration voltage range 2023 Ultramicroscopy 253 UA library record; WoS full record pdf url doi
Şentürk, DG.; Yu, CP.; De Backer, A.; Van Aert, S. Atom counting from a combination of two ADF STEM images 2024 Ultramicroscopy 255 UA library record; WoS full record pdf url doi
Van den Broek, W.; Jannis, D.; Verbeeck, J. Convexity constraints on linear background models for electron energy-loss spectra 2023 Ultramicroscopy 254 UA library record pdf url doi
Şentürk, D.G.; De Backer, A.; Van Aert, S. Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination 2024 Ultramicroscopy 259 url doi
Gao, C.; Hofer, C.; Pennycook, T.J. On central focusing for contrast optimization in direct electron ptychography of thick samples 2024 Ultramicroscopy 256 UA library record; WoS full record; WoS citing articles url doi
van Landuyt, J. The evolution of HVEM application in antwerp 1991 Ultramicroscopy T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan 39 UA library record; WoS full record doi
Verbeeck, J.; Bertoni, G.; Schattschneider, P. The Fresnel effect of a defocused biprism on the fringes in inelastic holography 2008 Ultramicroscopy T2 – 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN 108 15 UA library record; WoS full record; WoS citing articles pdf doi
Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. EM study of twinning in the Ni5Al3 bainitic phase 1993 Twinning in advanced materials UA library record; WoS full record;
Shenderova, O.; Vargas, A.; Turner, S.; Ivanov, D.M.; Ivanov, M.G. Nanodiamond-based nanolubricants : investigation of friction surfaces 2014 Tribology transactions 57 23 UA library record; WoS full record; WoS citing articles doi
Janssens, K.; van der Snickt, G.; Vanmeert, F.; Legrand, S.; Nuyts, G.; Alfeld, M.; Monico, L.; Anaf, W.; de Nolf, W.; Vermeulen, M.; Verbeeck, J.; De Wael, K. Non-invasive and non-destructive examination of artistic pigments, paints, and paintings by means of X-Ray methods 2016 Topics in Current Chemistry 374 50 UA library record; WoS full record; WoS citing articles pdf doi
Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L. Electron microscopy study of twinning in the Ni5Al3 bainitic phase 1994 TMS pdf
Amin-Ahmadi, B.; Idrissi, H.; Galceran, M.; Colla, M.S.; Raskin, J.P.; Pardoen, T.; Godet, S.; Schryvers, D. Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films 2013 Thin solid films : an international journal on the science and technology of thin and thick films 539 13 UA library record; WoS full record; WoS citing articles pdf doi
E. Zaghi, A.; Buffière, M.; Koo, J.; Brammertz, G.; Batuk, M.; Verbist, C.; Hadermann, J.; Kim, W.K.; Meuris, M.; Poortmans, J.; Vleugels, J.; Effect of selenium content of CuInSex alloy nanopowder precursors on recrystallization of printed CuInSe2 absorber layers during selenization heat treatment 2014 Thin solid films : an international journal on the science and technology of thin and thick films 7 UA library record; WoS full record; WoS citing articles pdf doi
Batuk, M.; Buffiere, M.; Zaghi, A.E.; Lenaers, N.; Verbist, C.; Khelifi, S.; Vleugels, J.; Meuris, M.; Hadermann, J. Effect of the burn-out step on the microstructure of the solution-processed Cu(In,Ga)Se2 solar cells 2015 Thin solid films : an international journal on the science and technology of thin and thick films 583 5 UA library record; WoS full record; WoS citing articles pdf doi
Laffez, P.; Chen, X.Y.; Banerjee, G.; Pezeril, T.; Rossell, M.D.; Van Tendeloo, G.; Lacorre, P.; Liu, J.M.; Liu, Z.-G. Growth of La2Mo2O9 films on porous Al2O3 substrates by radio frequency magnetron sputtering 2006 Thin solid films : an international journal on the science and technology of thin and thick films 500 15 UA library record; WoS full record; WoS citing articles pdf doi
Jehanathan, N.; Georgieva, V.; Saraiva, M.; Depla, D.; Bogaerts, A.; Van Tendeloo, G. The influence of Cr and Y on the micro structural evolution of Mg―Cr―O and Mg―Y―O thin films 2011 Thin solid films : an international journal on the science and technology of thin and thick films 519 4 UA library record; WoS full record; WoS citing articles pdf doi
Mahieu, S.; Ghekiere, P.; de Winter, G.; Depla, D.; de Gryse, R.; Lebedev, O.I.; Van Tendeloo, G. Influence of the Ar/O2 ratio on the growth and biaxial alignment of yttria stabilized zirconia layers during reactive unbalanced magnetron sputtering 2005 Thin solid films : an international journal on the science and technology of thin and thick films 484 23 UA library record; WoS full record; WoS citing articles pdf doi
Espinosa, E.H.; Lonescu, R.; Bittencourt, C.; Felten, A.; Erni, R.; Van Tendeloo, G.; Pireaux, J.-J.; Llobet, E. Metal-decorated multi-wall carbon nanotubes for low temperature gas sensing 2007 Thin solid films : an international journal on the science and technology of thin and thick films 515 86 UA library record; WoS full record; WoS citing articles pdf doi
Schryvers, D.; Yandouzi, M.; Toth, L. TEM study of B2 + L12 decomposition in a nanoscale Ni-rich Ni-Al film 1998 Thin solid films : an international journal on the science and technology of thin and thick films 326 1 UA library record; WoS full record; WoS citing articles doi
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