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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Lumbeeck, G.; Delvaux, A.; Idrissi, H.; Proost, J.; Schryvers, D. Analysis of internal stress build-up during deposition of nanocrystalline Ni thin films using transmission electron microscopy 2020 Thin solid films : an international journal on the science and technology of thin and thick films 707 UA library record; WoS full record; WoS citing articles url doi
Chizhov, A.S.; Rumyantseva, M.N.; Vasiliev, R.B.; Filatova, D.G.; Drozdov, K.A.; Krylov, I.V.; Marchevsky, A.V.; Karakulina, O.M.; Abakumov, A.M.; Gaskov, A.M. Visible light activation of room temperature NO2 gas sensors based on ZnO, SnO2 and In2O3 sensitized with CdSe quantum dots 2016 Thin solid films : an international journal on the science and technology of thin and thick films 618 19 UA library record; WoS full record; WoS citing articles pdf url doi
Forsh, E.A.; Abakumov, A.M.; Zaytsev, V.B.; Konstantinova, E.A.; Forsh, P.A.; Rumyantseva, M.N.; Gaskov, A.M.; Kashkarov, P.K. Optical and photoelectrical properties of nanocrystalline indium oxide with small grains 2015 Thin solid films : an international journal on the science and technology of thin and thick films 595 18 UA library record; WoS full record; WoS citing articles pdf doi
Batuk, M.; Buffiere, M.; Zaghi, A.E.; Lenaers, N.; Verbist, C.; Khelifi, S.; Vleugels, J.; Meuris, M.; Hadermann, J. Effect of the burn-out step on the microstructure of the solution-processed Cu(In,Ga)Se2 solar cells 2015 Thin solid films : an international journal on the science and technology of thin and thick films 583 5 UA library record; WoS full record; WoS citing articles pdf doi
Samani, M.K.; Ding, X.Z.; Khosravian, N.; Amin-Ahmadi, B.; Yi, Y.; Chen, G.; Neyts, E.C.; Bogaerts, A.; Tay, B.K. Thermal conductivity of titanium nitride/titanium aluminum nitride multilayer coatings deposited by lateral rotating cathode arc 2015 Thin solid films : an international journal on the science and technology of thin and thick films 578 41 UA library record; WoS full record; WoS citing articles pdf doi
Oueslati, S.; Brammertz, G.; Buffiere, M.; ElAnzeery, H.; Touayar, O.; Koeble, C.; Bekaert, J.; Meuris, M.; Poortmans, J. Physical and electrical characterization of high-performance Cu2ZnSnSe4 based thin film solar cells 2015 Thin solid films : an international journal on the science and technology of thin and thick films 582 49 UA library record; WoS full record; WoS citing articles pdf doi
E. Zaghi, A.; Buffière, M.; Koo, J.; Brammertz, G.; Batuk, M.; Verbist, C.; Hadermann, J.; Kim, W.K.; Meuris, M.; Poortmans, J.; Vleugels, J.; Effect of selenium content of CuInSex alloy nanopowder precursors on recrystallization of printed CuInSe2 absorber layers during selenization heat treatment 2014 Thin solid films : an international journal on the science and technology of thin and thick films 7 UA library record; WoS full record; WoS citing articles pdf doi
Amin-Ahmadi, B.; Idrissi, H.; Galceran, M.; Colla, M.S.; Raskin, J.P.; Pardoen, T.; Godet, S.; Schryvers, D. Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films 2013 Thin solid films : an international journal on the science and technology of thin and thick films 539 13 UA library record; WoS full record; WoS citing articles pdf doi
Jehanathan, N.; Georgieva, V.; Saraiva, M.; Depla, D.; Bogaerts, A.; Van Tendeloo, G. The influence of Cr and Y on the micro structural evolution of Mg―Cr―O and Mg―Y―O thin films 2011 Thin solid films : an international journal on the science and technology of thin and thick films 519 4 UA library record; WoS full record; WoS citing articles pdf doi
Espinosa, E.H.; Lonescu, R.; Bittencourt, C.; Felten, A.; Erni, R.; Van Tendeloo, G.; Pireaux, J.-J.; Llobet, E. Metal-decorated multi-wall carbon nanotubes for low temperature gas sensing 2007 Thin solid films : an international journal on the science and technology of thin and thick films 515 86 UA library record; WoS full record; WoS citing articles pdf doi
Laffez, P.; Chen, X.Y.; Banerjee, G.; Pezeril, T.; Rossell, M.D.; Van Tendeloo, G.; Lacorre, P.; Liu, J.M.; Liu, Z.-G. Growth of La2Mo2O9 films on porous Al2O3 substrates by radio frequency magnetron sputtering 2006 Thin solid films : an international journal on the science and technology of thin and thick films 500 15 UA library record; WoS full record; WoS citing articles pdf doi
Mahieu, S.; Ghekiere, P.; de Winter, G.; Depla, D.; de Gryse, R.; Lebedev, O.I.; Van Tendeloo, G. Influence of the Ar/O2 ratio on the growth and biaxial alignment of yttria stabilized zirconia layers during reactive unbalanced magnetron sputtering 2005 Thin solid films : an international journal on the science and technology of thin and thick films 484 23 UA library record; WoS full record; WoS citing articles pdf doi
Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers 1999 Thin solid films : an international journal on the science and technology of thin and thick films 343/344 1 UA library record; WoS full record; WoS citing articles doi
Schryvers, D.; Yandouzi, M.; Toth, L. TEM study of B2 + L12 decomposition in a nanoscale Ni-rich Ni-Al film 1998 Thin solid films : an international journal on the science and technology of thin and thick films 326 1 UA library record; WoS full record; WoS citing articles doi
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