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Author |
Title |
Year |
Publication |
Volume |
Times cited  |
Additional Links |
Links |
|
|
Niermann, T.; Verbeeck, J.; Lehmann, M. |
Creating arrays of electron vortices |
2014 |
Ultramicroscopy |
136 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Fatermans, J.; den Dekker, Aj.; Müller-Caspary, K.; Gauquelin, N.; Verbeeck, J.; Van Aert, S. |
Atom column detection from simultaneously acquired ABF and ADF STEM images |
2020 |
Ultramicroscopy |
219 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
Direct structure inversion from exit waves : part 2 : a practical example |
2012 |
Ultramicroscopy |
116 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
de Backer, A.; Van Aert, S.; van Dyck, D. |
High precision measurements of atom column positions using model-based exit wave reconstruction |
2011 |
Ultramicroscopy |
111 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J. |
Interpretation of “Energy-filtered electron-diffracted beam holography” by R.A. Herring |
2006 |
Ultramicroscopy |
106 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Müller, K.; Schowalter, M.; Jansen, J.; Tsuda, K.; Titantah, J.; Lamoen, D.; Rosenauer, A. |
Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data |
2009 |
Ultramicroscopy |
109 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Amelinckx, S.; Milat, O.; Van Tendeloo, G. |
Selective imaging of sublattices in complex structures |
1993 |
Ultramicroscopy |
51 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. |
Locating light and heavy atomic column positions with picometer precision using ISTEM |
2016 |
Ultramicroscopy |
172 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
De wael, A.; De Backer, A.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Hybrid statistics-simulations based method for atom-counting from ADF STEM images |
2017 |
Ultramicroscopy |
177 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Zhong, Z.; Aveyard, R.; Rieger, B.; Bals, S.; Palenstijn, W.J.; Batenburg, K.J. |
Automatic correction of nonlinear damping effects in HAADF-STEM tomography for nanomaterials of discrete compositions |
2018 |
Ultramicroscopy |
184 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Eyndhoven, G.; Kurttepeli, M.; van Oers, C.J.; Cool, P.; Bals, S.; Batenburg, K.J.; Sijbers, J. |
Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials |
2015 |
Ultramicroscopy |
148 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. |
Throughput maximization of particle radius measurements by balancing size and current of the electron probe |
2011 |
Ultramicroscopy |
111 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. |
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation |
2018 |
Ultramicroscopy |
184 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Korneychuk, S.; Partoens, B.; Guzzinati, G.; Ramaneti, R.; Derluyn, J.; Haenen, K.; Verbeeck, J. |
Exploring possibilities of band gap measurement with off-axis EELS in TEM |
2018 |
Ultramicroscopy |
189 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Broek, W.; Verbeeck, J.; de Backer, S.; Scheunders, P.; Schryvers, D. |
Acquisition of the EELS data cube by tomographic reconstruction |
2006 |
Ultramicroscopy |
106 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Lobato, I.; van Dyck, D. |
Improved multislice calculations for including higher-order Laue zones effects |
2012 |
Ultramicroscopy |
119 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases |
1993 |
Ultramicroscopy |
48 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; Chen, J.H.; van Dyck, D. |
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. |
A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM |
2014 |
Ultramicroscopy |
141 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Heidari, H.; van den Broek, W.; Bals, S. |
Quantitative electron tomography : the effect of the three-dimensional point spread function |
2013 |
Ultramicroscopy |
135 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design |
2016 |
Ultramicroscopy |
170 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Grieb, T.; Krause, F.F.; Mahr, C.; Zillmann, D.; Müller-Caspary, K.; Schowalter, M.; Rosenauer, A. |
Optimization of NBED simulations for disc-detection measurements |
2017 |
Ultramicroscopy |
181 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Radtke, G.; Botton, G.A.; Verbeeck, J. |
Electron inelastic, scattering and anisotropy: the two-dimensional point of view |
2006 |
Ultramicroscopy |
106 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. |
Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? |
2012 |
Ultramicroscopy |
114 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Milat, O.; Van Tendeloo, G.; Amelinckx, S. |
Selective imaging of the “substructures” in incommensurately modulated intergrowth crystal structures |
1992 |
Ultramicroscopy |
41 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Martinez, G.T.; van den Bos, K.H.W.; Alania, M.; Nellist, P.D.; Van Aert, S. |
Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy |
2018 |
Ultramicroscopy |
187 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Bos, K.H.W.; Janssens, L.; De Backer, A.; Nellist, P.D.; Van Aert, S. |
The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials |
2019 |
Ultramicroscopy |
203 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Leuthner, G.T.; Hummel, S.; Mangler, C.; Pennycook, T.J.; Susi, T.; Meyer, J.C.; Kotakoski, J. |
Scanning transmission electron microscopy under controlled low-pressure atmospheres |
2019 |
Ultramicroscopy |
203 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Prabhakara, V.; Jannis, D.; Guzzinati, G.; Béché, A.; Bender, H.; Verbeeck, J. |
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale |
2020 |
Ultramicroscopy |
219 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process |
2022 |
Ultramicroscopy |
|
4 |
UA library record; WoS full record; WoS citing articles |
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