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  Author Title Year Publication Volume Times cited Additional Links Links
De Backer, A.; Van Aert, S.; Faes, C.; Arslan Irmak, E.; Nellist, P.D.; Jones, L. Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm 2022 N P J Computational Materials 8 UA library record; WoS full record; WoS citing articles url doi
De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM 2022 Microscopy and microanalysis UA library record; WoS full record pdf url doi
Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S. Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors 2022 Ultramicroscopy 242 UA library record; WoS full record; WoS citing articles pdf url doi
De Backer, A.; Bals, S.; Van Aert, S. A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection 2023 Ultramicroscopy 3 UA library record; WoS full record; WoS citing articles pdf url doi
Zhang, Z.; Lobato, I.; De Backer, A.; Van Aert, S.; Nellist, P. Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions 2023 Ultramicroscopy 246 UA library record; WoS full record; WoS citing articles pdf url doi
Jain, N.; Hao, Y.; Parekh, U.; Kaltenegger, M.; Pedrazo-Tardajos, A.; Lazzaroni, R.; Resel, R.; Geerts, Y.H.; Bals, S.; Van Aert, S. Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals 2023 Micron 169 1 UA library record; WoS full record; WoS citing articles pdf url doi
Samal, D.; Gauquelin, N.; Takamura, Y.; Lobato, I.; Arenholz, E.; Van Aert, S.; Huijben, M.; Zhong, Z.; Verbeeck, J.; Van Tendeloo, G.; Koster, G. Unusual structural rearrangement and superconductivity in infinite layer cuprate superlattices 2023 Physical review materials 7 UA library record; WoS full record url doi
Lobato, I.; De Backer, A.; Van Aert, S. Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network 2023 Ultramicroscopy 251 UA library record; WoS full record pdf url doi
Lobato, I.; Friedrich, T.; Van Aert, S. Deep convolutional neural networks to restore single-shot electron microscopy images 2024 N P J Computational Materials 10 UA library record; WoS full record pdf url doi
Friedrich, T.; Yu, C.-P.; Verbeeck, J.; Van Aert, S. Phase object reconstruction for 4D-STEM using deep learning 2023 Microscopy and microanalysis 29 1 UA library record; WoS full record; WoS citing articles url doi
Şentürk, DG.; Yu, CP.; De Backer, A.; Van Aert, S. Atom counting from a combination of two ADF STEM images 2024 Ultramicroscopy 255 UA library record; WoS full record; WoS citing articles pdf url doi
Hugenschmidt, M.; Jannis, D.; Kadu, A.A.; Grünewald, L.; De Marchi, S.; Perez-Juste, J.; Verbeeck, J.; Van Aert, S.; Bals, S. Low-dose 4D-STEM tomography for beam-sensitive nanocomposites 2023 ACS materials letters 6 UA library record; WoS full record pdf doi
van Dyck, D.; Van Aert, S.; Croitoru, M. Atomic resolution electron tomography: a dream? 2006 International journal of materials research 97 6 UA library record; WoS full record; WoS citing articles pdf doi
Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images 2006 Ultramicroscopy 106 18 UA library record; WoS full record; WoS citing articles pdf doi
Ren, P.; Zhang, T.; Jain, N.; Ching, H.Y.V.; Jaworski, A.; Barcaro, G.; Monti, S.; Silvestre-Albero, J.; Celorrio, V.; Chouhan, L.; Rokicinska, A.; Debroye, E.; Kustrowski, P.; Van Doorslaer, S.; Van Aert, S.; Bals, S.; Das, S. An atomically dispersed Mn-photocatalyst for generating hydrogen peroxide from seawater via the Water Oxidation Reaction (WOR) 2023 Journal of the American Chemical Society 145 21 UA library record; WoS full record; WoS citing articles pdf doi
Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. An alternative approach to determine attainable resolution directly from HREM images 2013 Ultramicroscopy 133 UA library record; WoS full record pdf url doi
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy 2009 Microscopy and microanalysis 15 1 UA library record; WoS full record; WoS citing articles url doi
van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. Correction of non-linear thickness effects in HAADF STEM electron tomography 2012 Ultramicroscopy 116 67 UA library record; WoS full record; WoS citing articles pdf doi
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. Direct structure inversion from exit waves: part 1: theory and simulations 2010 Ultramicroscopy 110 25 UA library record; WoS full record; WoS citing articles pdf doi
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. Direct structure inversion from exit waves : part 2 : a practical example 2012 Ultramicroscopy 116 8 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; van Dyck, D. Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? 2001 Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties 81 11 UA library record; WoS full record; WoS citing articles pdf doi
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. Does a monochromator improve the precision in quantitative HRTEM? 2001 Ultramicroscopy 89 22 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. Electron channelling based crystallography 2007 Ultramicroscopy 107 32 UA library record; WoS full record; WoS citing articles doi
den Dekker, A.J.; Gonnissen, J.; de Backer, A.; Sijbers, J.; Van Aert, S. Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits? 2013 Ultramicroscopy 134 31 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Van Aert, S.; van Dyck, D. Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency 2012 Microscopy and microanalysis 18 15 UA library record; WoS full record; WoS citing articles doi
de Backer, A.; Van Aert, S.; van Dyck, D. High precision measurements of atom column positions using model-based exit wave reconstruction 2011 Ultramicroscopy 111 8 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. High-resolution electron microscopy and electron tomography: resolution versus precision 2002 Journal of structural biology 138 33 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. High-resolution electron microscopy : from imaging toward measuring 2002 IEEE transactions on instrumentation and measurement 51 13 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D. How to optimize the experimental design of quantitative atomic resolution TEM experiments? 2004 Micron 35 14 UA library record; WoS full record; WoS citing articles pdf doi
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? 2003 Ultramicroscopy 98 26 UA library record; WoS full record; WoS citing articles doi
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