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Author Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. pdf  doi
openurl 
  Title Direct structure inversion from exit waves: part 1: theory and simulations Type A1 Journal article
  Year (down) 2010 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 110 Issue 5 Pages 527-534  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract In order to interpret the amplitude and phase of the exit wave in terms of mass and position of the atoms, one has to invert the dynamic scattering of the electrons in the object so as to obtain a starting structure which can then be used as a seed for further quantitative structure refinement. This is especially challenging in case of a zone axis condition when the interaction of the electrons with the atom column is very strong. Based on the channelling theory we will show that the channelling map not only yields a circle on the Argand plot but also a circular defocus curve for every column. The former gives the number of atoms in each column, while the latter provides the defocus value for each column, which reveals the surface roughness at the exit plane with single atom sensitivity.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000279065700019 Publication Date 2009-12-12  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 25 Open Access  
  Notes Fwo Approved Most recent IF: 2.843; 2010 IF: 2.063  
  Call Number UA @ lucian @ c:irua:83691 Serial 723  
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