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  Author Title Year Publication (up) Volume Times cited Additional Links Links
Nord, M.; Webster, R.W.H.; Paton, K.A.; McVitie, S.; McGrouther, D.; MacLaren, I.; Paterson, G.W. Fast pixelated detectors in scanning transmission electron microscopy. Part I: data acquisition, live processing, and storage 2020 Microscopy And Microanalysis 26 4 UA library record; WoS full record; WoS citing articles url doi
Paterson, G.W.; Webster, R.W.H.; Ross, A.; Paton, K.A.; Macgregor, T.A.; McGrouther, D.; MacLaren, I.; Nord, M. Fast pixelated detectors in scanning transmission electron microscopy. part II : post-acquisition data processing, visualization, and structural characterization 2020 Microscopy And Microanalysis 26 3 UA library record; WoS full record; WoS citing articles url doi
MacArthur, K.E.; Yankovich, A.B.; Béché, A.; Luysberg, M.; Brown, H.G.; Findlay, S.D.; Heggen, M.; Allen, L.J. Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale 2021 Microscopy And Microanalysis UA library record; WoS full record; WoS citing articles pdf url doi
Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. Fast electron low dose tomography for beam sensitive materials 2021 Microscopy And Microanalysis 27 UA library record pdf url doi
Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. Novel thin film lift-off process for in situ TEM tensile characterization 2021 Microscopy And Microanalysis 27 UA library record doi
Ning, S.; Xu, W.; Ma, Y.; Loh, L.; Pennycook, T.J.; Zhou, W.; Zhang, F.; Bosman, M.; Pennycook, S.J.; He, Q.; Loh, N.D. Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets 2022 Microscopy and microanalysis UA library record; WoS full record; WoS citing articles pdf url doi
Yu, C.-P.; Friedrich, T.; Jannis, D.; Van Aert, S.; Verbeeck, J. Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM 2022 Microscopy and microanalysis 7 UA library record; WoS full record; WoS citing articles pdf url doi
De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM 2022 Microscopy and microanalysis UA library record; WoS full record pdf url doi
Vega Ibañez, F.; Béché, A.; Verbeeck, J. Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? 2022 Microscopy and microanalysis 3 UA library record; WoS full record; WoS citing articles url doi
Friedrich, T.; Yu, C.-P.; Verbeeck, J.; Van Aert, S. Phase object reconstruction for 4D-STEM using deep learning 2023 Microscopy and microanalysis 29 1 UA library record; WoS full record; WoS citing articles url doi
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. Measurement of the mean inner potential of ZnO nanorods by transmission electron holography 2005 Microscopy of Semiconducting Materials 107 UA library record; WoS full record; pdf
Schryvers, D.; Goessens, C.; Safran, G.; Toth, L. Internal calibration technique for HREM studies of nanoscale particles 1993 Microscopy research and technique T2 – JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM 25 1 UA library record; WoS full record; WoS citing articles pdf doi
Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A.; Xu, Y.-E.; Wang, S.-E.; Park, I.-Y.; Kang, T.-S. Combined characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques 1998 Microscopy research and technique 42 4 UA library record; WoS full record; WoS citing articles doi
Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. Evaluation of top, angle, and side cleaned FIB samples for TEM analysis 2007 Microscopy research and technique 70 36 UA library record; WoS full record; WoS citing articles pdf doi
Bertoni, G.; Verbeeck, J.; Brosens, F. Fitting the momentum dependent loss function in EELS 2011 Microscopy research and technique 74 6 UA library record; WoS full record; WoS citing articles pdf doi
Zelaya, E.; Schryvers, D. Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite 2011 Microscopy research and technique 74 2 UA library record; WoS full record; WoS citing articles pdf doi
Van Tendeloo, G.; Krekels, T.; Amelinckx, S.; Babu, T.G.N.; Greaves, C.; Hervieu, M.; Michel, C.; Raveau, B. Structural investigations of recently discovered high Tc superconductors 1995 Microscopy research and technique 30 4 UA library record; WoS full record; WoS citing articles pdf doi
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. The study of partially ordered 11/20 alloys by HREM 1993 Microscopy research and technique 25 UA library record; WoS full record pdf doi
Goessens, C.; Schryvers, D.; van Landuyt, J. Transmission electron microscopy studies of (111) twinned silver halide microcrystals 1998 Microscopy research and technique 42 8 UA library record; WoS full record; WoS citing articles doi
Pourbabak, S.; Orekhov, A.; Schryvers, D. Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires 2020 Microscopy Research And Technique UA library record; WoS full record; WoS citing articles pdf url doi
Oleshko, V.; Gijbels, R.; Jacob, W.; Lakiere, F.; van Daele, A.; Silaev, E.; Kaplun, L. Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis 1995 Microscopy, microanalysis, microstructures 6 7 UA library record; WoS full record; WoS citing articles doi
Verbist, K.; Van Tendeloo, G.; Ye, M.; Schroeder, J.; Mehbod, M.; Deltour, R. Inclusions in magnetron sputtered YBa2Cu3-x MxO7-d thin films: a study by means of electron microscopy 1996 Microscopy, microanalysis, microstructures 7 6 UA library record; WoS full record; WoS citing articles doi
Hervieu; Van Tendeloo, G.; Michel; Pelloquin; Raveau Mixed layers in copper based superconducting materials 1996 Microscopy, microanalysis, microstructures 7 2 UA library record; WoS full record; WoS citing articles doi
van Dyck, D.; Van Aert, S.; Croitoru, M.D. Obstacles on the road towards atomic resolution tomography 2005 Microscoy and microanalysis 11 UA library record
Van Tendeloo, G. TEM of phase transitions in tridymite and cristobalite based materials 2000 Microscoy and microanalysis 6 UA library record
Giorgio, S.; Henry, C.R.; Pauwels, B.; Van Tendeloo, G. Au particles supported on (110) anatase-TiO2 2001 Microstructure And Processing 297 40 UA library record; WoS full record; WoS citing articles pdf doi
Weng, Y.; Jia, Z.; Ding, L.; Muraishi, S.; Liu, Q. Clustering behavior during natural aging and artificial aging in Al-Mg-Si alloys with different Ag and Cu addition 2018 Microstructure And Processing 732 11 UA library record; WoS full record; WoS citing articles pdf url doi
Zhao, L.; Macias, J.G.S.; Ding, L.; Idrissi, H.; Simar, A. Damage mechanisms in selective laser melted AlSi10Mg under as built and different post-treatment conditions 2019 Microstructure And Processing 764 1 UA library record; WoS full record; WoS citing articles pdf doi
Chakravorty, R.; Van Grieken, R. Radiochemical study of Cd, Co and Eu-coprecititation with iron hydroxide in seawater 1986 Mikrochimica acta 3 UA library record
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Combined characterization of nanostructures by AEM and STM 1996 Mikrochimica acta: supplementum 13 UA library record; WoS full record;
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