| |
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Milagres de Oliveira, T.; Albrecht, W.; González-Rubio, G.; Altantzis, T.; Lobato Hoyos, I.P.; Béché, A.; Van Aert, S.; Guerrero-Martínez, A.; Liz-Marzán, L.M.; Bals, S. |
3D Characterization and Plasmon Mapping of Gold Nanorods Welded by Femtosecond Laser Irradiation |
2020 |
Acs Nano |
14 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; De Backer, A.; Jones, L.; Martinez, G.T.; Béché, A.; Nellist, P.D. |
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy |
2019 |
Physical review letters |
122 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
De wael, A.; De Backer, A.; Lobato, I.; Van Aert, S. |
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt |
2021 |
Ultramicroscopy |
|
|
UA library record; WoS full record; WoS citing articles |
|
|
|
De wael, A.; De Backer, A.; Van Aert, S. |
Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations |
2020 |
Ultramicroscopy |
219 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. |
Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM |
2022 |
Microscopy and microanalysis |
|
|
UA library record; WoS full record |
|
|
|
De wael, A.; De Backer, A.; Jones, L.; Varambhia, A.; Nellist, P.D.; Van Aert, S. |
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy |
2020 |
Physical Review Letters |
124 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Skorikov, A.; Albrecht, W.; Bladt, E.; Xie, X.; van der Hoeven, J.E.S.; van Blaaderen, A.; Van Aert, S.; Bals, S. |
Quantitative 3D Characterization of Elemental Diffusion Dynamics in Individual Ag@Au Nanoparticles with Different Shapes |
2019 |
ACS nano |
13 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Varambhia, A.M.; Jones, L.; De Backer, A.; Fauske, V.T.; Van Aert, S.; Ozkaya, D.; Nellist, P.D. |
Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM |
2016 |
Particle and particle systems characterization |
33 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Hudry, D.; De Backer, A.; Popescu, R.; Busko, D.; Howard, I.A.; Bals, S.; Zhang, Y.; Pedrazo‐Tardajos, A.; Van Aert, S.; Gerthsen, D.; Altantzis, T.; Richards, B.S. |
Interface Pattern Engineering in Core‐Shell Upconverting Nanocrystals: Shedding Light on Critical Parameters and Consequences for the Photoluminescence Properties |
2021 |
Small |
|
17 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Molina-Luna, L.; Duerrschnabel, M.; Turner, S.; Erbe, M.; Martinez, G.T.; Van Aert, S.; Holzapfel, B.; Van Tendeloo, G. |
Atomic and electronic structures of BaHfO3-doped TFA-MOD-derived YBa2Cu3O7−δthin films |
2015 |
Superconductor science and technology |
28 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Thiel, T. c.; Brzezicki, W.; Autieri, C.; Hortensius, J. r.; Afanasiev, D.; Gauquelin, N.; Jannis, D.; Janssen, N.; Groenendijk, D. j.; Fatermans, J.; Van Aert, S.; Verbeeck, J.; Cuoco, M.; Caviglia, A. d. |
Coupling Charge and Topological Reconstructions at Polar Oxide Interfaces |
2021 |
Physical Review Letters |
127 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. |
Advanced electron crystallography through model-based imaging |
2016 |
IUCrJ |
3 |
30 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Müller-Caspary, K.; Grieb, T.; Müßener, J.; Gauquelin, N.; Hille, P.; Schörmann, J.; Verbeeck, J.; Van Aert, S.; Eickhoff, M.; Rosenauer, A. |
Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy |
2019 |
Physical review letters |
122 |
26 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Jany, B.R.; Gauquelin, N.; Willhammar, T.; Nikiel, M.; van den Bos, K.H.W.; Janas, A.; Szajna, K.; Verbeeck, J.; Van Aert, S.; Van Tendeloo, G.; Krok, F. |
Controlled growth of hexagonal gold nanostructures during thermally induced self-assembling on Ge(001) surface |
2017 |
Scientific reports |
7 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
|
De Backer, A.; Jones, L.; Lobato, I.; Altantzis, T.; Goris, B.; Nellist, P.D.; Bals, S.; Van Aert, S. |
Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities |
2017 |
Nanoscale |
9 |
33 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question |
2016 |
Ultramicroscopy |
174 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Fatermans, J.; Romolini, G.; Altantzis, T.; Hofkens, J.; Roeffaers, M.B.J.; Bals, S.; Van Aert, S. |
Atomic-scale detection of individual lead clusters confined in Linde Type A zeolites |
2022 |
Nanoscale |
|
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Albrecht, W.; Van Aert, S.; Bals, S. |
Three-Dimensional Nanoparticle Transformations Captured by an Electron Microscope |
2021 |
Accounts Of Chemical Research |
54 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Bos, K.H. W.; De Backer, A.; Martinez, G.T.; Winckelmans, N.; Bals, S.; Nellist, P.D.; Van Aert, S. |
Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy |
2016 |
Physical review letters |
116 |
46 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Fatermans, J.; den Dekker, A. J.; Müller-Caspary, K.; Lobato, I.; O’Leary, C. M.; Nellist, P. D.; Van Aert, S. |
Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images |
2018 |
Physical review letters |
121 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Fatermans, J.; den Dekker, Aj.; Müller-Caspary, K.; Gauquelin, N.; Verbeeck, J.; Van Aert, S. |
Atom column detection from simultaneously acquired ABF and ADF STEM images |
2020 |
Ultramicroscopy |
219 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Fatermans, J.; Van Aert, S.; den Dekker, A.J. |
The maximum a posteriori probability rule for atom column detection from HAADF STEM images |
2019 |
Ultramicroscopy |
201 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. |
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images |
2016 |
Ultramicroscopy |
171 |
43 |
UA library record; WoS full record; WoS citing articles |
|
|
|
De wael, A.; De Backer, A.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Hybrid statistics-simulations based method for atom-counting from ADF STEM images |
2017 |
Ultramicroscopy |
177 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. |
Locating light and heavy atomic column positions with picometer precision using ISTEM |
2016 |
Ultramicroscopy |
172 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Bos, K.H.W.; Janssens, L.; De Backer, A.; Nellist, P.D.; Van Aert, S. |
The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials |
2019 |
Ultramicroscopy |
203 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design |
2016 |
Ultramicroscopy |
170 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Martinez, G.T.; van den Bos, K.H.W.; Alania, M.; Nellist, P.D.; Van Aert, S. |
Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy |
2018 |
Ultramicroscopy |
187 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
De Backer, A.; De Wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits? |
2015 |
Journal of physics : conference series |
644 |
|
UA library record; WoS full record |
|
|
|
Schryvers, D.; Salje, E.K.H.; Nishida, M.; De Backer, A.; Idrissi, H.; Van Aert, S. |
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations |
2017 |
Ultramicroscopy |
176 |
1 |
UA library record; WoS full record; WoS citing articles |
|
