toggle visibility
Search within Results:
Display Options:

Select All    Deselect All
List View
 |   | 
   print
  Author Title Year Publication Volume Times cited Additional Links (up) Links
Nord, M.; Verbeeck, J. Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis 2019 Microscopy And Microanalysis 25 pdf doi
Bals, S.; Kisielowski, C.; Croitoru, M.; Van Tendeloo, G. Tomography using annular dark field imaging in TEM 2005 Microscopy and microanalysis 11 UA library record
Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D. Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction 2005 Microscopy and microanalysis 11 UA library record pdf
Verlinden, G.; Gijbels, R.; Geuens, I. Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS 2002 Microscopy and microanalysis 8 1 UA library record; WoS full record; WoS citing articles doi
Leroux, F.; Bladt, E.; Timmermans, J.-P.; Van Tendeloo, G.; Bals, S. Annular dark-field transmission electron microscopy for low contrast materials 2013 Microscopy and microanalysis 19 5 UA library record; WoS full record; WoS citing articles doi
Lu, J.; Roeffaers, M.B.J.; Bartholomeeusen, E.; Sels, B.F.; Schryvers, D. Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy 2014 Microscopy and microanalysis 20 7 UA library record; WoS full record; WoS citing articles doi
Masenelli-Varlot, K.; Malchere, A.; Ferreira, J.; Heidari Mezerji, H.; Bals, S.; Messaoudi, C.; Garrido, S.M. Wet-STEM tomography : principles, potentialities and limitations 2014 Microscopy and microanalysis 20 9 UA library record; WoS full record; WoS citing articles url doi
Grieten, E.; Caen, J.; Schryvers, D. Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM 2014 Microscopy and microanalysis 20 UA library record; WoS full record; WoS citing articles pdf doi
Goris, B.; Freitag, B.; Zanaga, D.; Bladt, E.; Altantzis, T.; Ringnalda, J.; Bals, S. Towards quantitative EDX results in 3 dimensions 2014 Microscopy and microanalysis 20 UA library record pdf url doi
Gjorgievska, E.; Van Tendeloo, G.; Nicholson, J.W.; Coleman, N.J.; Slipper, I.J.; Booth, S. The incorporation of nanoparticles into conventional glass-ionomer dental restorative cements 2015 Microscopy and microanalysis 21 15 UA library record; WoS full record; WoS citing articles pdf doi
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM 2014 Microscopy and microanalysis 20 UA library record doi
Heidari, H.; Rivero, G.; Idrissi, H.; Ramachandran, D.; Cakir, S.; Egoavil, R.; Kurttepeli, M.; Crabbé, A.C.; Hauffman, T.; Terryn, H.; Du Prez, F.; Schryvers, D. Melamine–Formaldehyde Microcapsules: Micro- and Nanostructural Characterization with Electron Microscopy 2016 Microscopy and microanalysis 22 2 UA library record; WoS full record; WoS citing articles pdf doi
Nord, M.; Verbeeck, J. Towards Reproducible and Transparent Science of (Big) Electron Microscopy Data Using Version Control 2019 Microscopy and microanalysis T2 – Microscopy & Microanalysis 2019, 4-8 August, 2019, Portland, Oregon 25 UA library record pdf doi
Nord, M.; Webster, R.W.H.; Paton, K.A.; McVitie, S.; McGrouther, D.; MacLaren, I.; Paterson, G.W. Fast pixelated detectors in scanning transmission electron microscopy. Part I: data acquisition, live processing, and storage 2020 Microscopy And Microanalysis 26 4 UA library record; WoS full record; WoS citing articles url doi
Pennycook, T.J.; Martinez, G.T.; O'Leary, C.M.; Yang, H.; Nellist, P.D. Efficient Phase Contrast Imaging via Electron Ptychography, a Tutorial 2019 Microscopy and microanalysis 25 UA library record pdf url doi
Paterson, G.W.; Webster, R.W.H.; Ross, A.; Paton, K.A.; Macgregor, T.A.; McGrouther, D.; MacLaren, I.; Nord, M. Fast pixelated detectors in scanning transmission electron microscopy. part II : post-acquisition data processing, visualization, and structural characterization 2020 Microscopy And Microanalysis 26 3 UA library record; WoS full record; WoS citing articles url doi
MacArthur, K.E.; Yankovich, A.B.; Béché, A.; Luysberg, M.; Brown, H.G.; Findlay, S.D.; Heggen, M.; Allen, L.J. Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale 2021 Microscopy And Microanalysis UA library record; WoS full record; WoS citing articles pdf url doi
Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. Fast electron low dose tomography for beam sensitive materials 2021 Microscopy And Microanalysis 27 UA library record pdf url doi
Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. Novel thin film lift-off process for in situ TEM tensile characterization 2021 Microscopy And Microanalysis 27 UA library record doi
Ning, S.; Xu, W.; Ma, Y.; Loh, L.; Pennycook, T.J.; Zhou, W.; Zhang, F.; Bosman, M.; Pennycook, S.J.; He, Q.; Loh, N.D. Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets 2022 Microscopy and microanalysis UA library record; WoS full record; WoS citing articles pdf url doi
Yu, C.-P.; Friedrich, T.; Jannis, D.; Van Aert, S.; Verbeeck, J. Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM 2022 Microscopy and microanalysis 7 UA library record; WoS full record; WoS citing articles pdf url doi
De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM 2022 Microscopy and microanalysis UA library record; WoS full record pdf url doi
Vega Ibañez, F.; Béché, A.; Verbeeck, J. Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? 2022 Microscopy and microanalysis 3 UA library record; WoS full record; WoS citing articles url doi
Friedrich, T.; Yu, C.-P.; Verbeeck, J.; Van Aert, S. Phase object reconstruction for 4D-STEM using deep learning 2023 Microscopy and microanalysis 29 1 UA library record; WoS full record; WoS citing articles url doi
van Dyck, D.; Van Aert, S.; den Dekker, A.J. Physical limits on atomic resolution 2004 Microscopy and microanalysis 10 14 UA library record; WoS full record; WoS citing articles doi
Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Verbeeck, J. EELS investigations of different niobium oxide phases 2006 Microscopy and microanalysis 12 50 UA library record; WoS full record; WoS citing articles doi
Denecke, M.A.; Somogyi, A.; Janssens, K.; Simon, R.; Dardenne, K.; Noseck, U. Microanalysis (micro-XRF, micro-XANES, and micro-XRD) of a tertiary sediment using microfocused synchrotron radiation 2007 Microscopy and microanalysis 13 31 UA library record; WoS full record; WoS citing articles doi
Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. High-quality sample preparation by low kV FIB thinning for analytical TEM measurements 2007 Microscopy and microanalysis 13 82 UA library record; WoS full record; WoS citing articles doi
Tian, H.; Schryvers, D.; Shabalovskaya, S.; van Humbeeck, J. Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwire 2009 Microscopy and microanalysis 15 15 UA library record; WoS full record; WoS citing articles url doi
Bach, D.; Schneider, R.; Gerthsen, D.; Verbeeck, J.; Sigle, W. EELS of niobium and stoichiometric niobium-oxide phases: part 1: plasmon and Near-edges fine structure 2009 Microscopy and microanalysis 15 55 UA library record; WoS full record; WoS citing articles doi
Select All    Deselect All
List View
 |   | 
   print

Save Citations:
Export Records: