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Record |
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Author |
Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Verbeeck, J. |
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Title |
EELS investigations of different niobium oxide phases |
Type |
A1 Journal article |
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Year |
2006 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
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Volume |
12 |
Issue |
5 |
Pages |
416-423 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
Electron energy loss spectra in conjunction with near-edge fine structures of purely stoichiometric niobium monoxide (NbO) and niobium pentoxide (Nb2O5) reference materials were recorded. The structures of the niobium oxide reference materials were checked by selected area electron diffraction to ensure a proper assignment of the fine structures. NbO and Nb2O5 show clearly different energy loss near-edge fine structures of the Nb-M-4,M-5 and -M-2,M-3 edges and of the O-K edge, reflecting the specific local environments of the ionized atoms. To distinguish the two oxides in a quantitative manner, the intensities under the Nb-M-4,M-5 as well as Nb-M-2,M-3 edges and the O-K edge were measured and their ratios calculated. k-factors were also derived from these measurements. |
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Publisher |
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Place of Publication |
Cambridge, Mass. |
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Wos |
000241181400007 |
Publication Date |
2006-09-19 |
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Series Volume |
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Edition |
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ISSN |
1431-9276;1435-8115; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.891 |
Times cited |
50 |
Open Access |
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Notes |
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Approved |
Most recent IF: 1.891; 2006 IF: 2.108 |
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Call Number |
UA @ lucian @ c:irua:60979UA @ admin @ c:irua:60979 |
Serial |
789 |
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Permanent link to this record |