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Author Leroux, F.; Bladt, E.; Timmermans, J.-P.; Van Tendeloo, G.; Bals, S. doi  openurl
  Title Annular dark-field transmission electron microscopy for low contrast materials Type A1 Journal article
  Year (down) 2013 Publication Microscopy and microanalysis Abbreviated Journal Microsc Microanal  
  Volume 19 Issue 3 Pages 629-634  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract Imaging soft matter by transmission electron microscopy (TEM) is anything but straightforward. Recently, interest has grown in developing alternative imaging modes that generate contrast without additional staining. Here, we present a dark-field TEM technique based on the use of an annular objective aperture. Our experiments demonstrate an increase in both contrast and signal-to-noise ratio in comparison to conventional bright-field TEM. The proposed technique is easy to implement and offers an alternative imaging mode to investigate soft matter.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Cambridge, Mass. Editor  
  Language Wos 000319126300014 Publication Date 2013-04-04  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1431-9276;1435-8115; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.891 Times cited 5 Open Access  
  Notes 262348 Esmi; Fwo G002410n G018008 Approved Most recent IF: 1.891; 2013 IF: 2.161  
  Call Number UA @ lucian @ c:irua:108712 Serial 133  
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