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  Author Title Year Publication Volume Times cited Additional Links Links
Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures 2013 Physical review : B : condensed matter and materials physics 88 15 UA library record; WoS full record; WoS citing articles url doi
Vanrompay, H.; Béché, A.; Verbeeck, J.; Bals, S. Experimental Evaluation of Undersampling Schemes for Electron Tomography of Nanoparticles 2019 Particle and particle systems characterization 36 12 UA library record; WoS full record; WoS citing articles pdf doi
Vanrompay, H.; Bladt, E.; Albrecht, W.; Béché, A.; Zakhozheva, M.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Bals, S. 3D characterization of heat-induced morphological changes of Au nanostars by fast in situ electron tomography 2018 Nanoscale 10 55 UA library record; WoS full record; WoS citing articles url doi
Ghidelli, M.; Orekhov, A.; Bassi, A.L.; Terraneo, G.; Djemia, P.; Abadias, G.; Nord, M.; Béché, A.; Gauquelin, N.; Verbeeck, J.; Raskin, J.-p.; Schryvers, D.; Pardoen, T.; Idrissi, H. Novel class of nanostructured metallic glass films with superior and tunable mechanical properties 2021 Acta Materialia 27 UA library record; WoS full record; WoS citing articles url doi
Idrissi, H.; Ghidelli, M.; Béché, A.; Turner, S.; Gravier, S.; Blandin, J.-J.; Raskin, J.-P.; Schryvers, D.; Pardoen, T. Atomic-scale viscoplasticity mechanisms revealed in high ductility metallic glass films 2019 Scientific reports 9 UA library record; WoS full record; WoS citing articles url doi
Juchtmans, R.; Béché, A.; Abakumov, A.; Batuk, M.; Verbeeck, J. Using electron vortex beams to determine chirality of crystals in transmission electron microscopy 2015 Physical review : B : condensed matter and materials physics 91 54 UA library record; WoS full record; WoS citing articles url doi
Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. Spectroscopic coincidence experiments in transmission electron microscopy 2019 Applied physics letters 114 18 UA library record; WoS full record; WoS citing articles pdf url doi
Jannis, D.; Müller-Caspary, K.; Béché, A.; Verbeeck, J. Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope 2021 Applied Sciences-Basel 11 9 UA library record; WoS full record; WoS citing articles pdf url doi
Gao, C.; Hofer, C.; Jannis, D.; Béché, A.; Verbeeck, J.; Pennycook, T.J. Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science 2022 Applied physics letters 121 9 UA library record; WoS full record; WoS citing articles pdf url doi
Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping 2019 Applied physics letters 114 17 UA library record; WoS full record; WoS citing articles url doi
Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process 2022 Ultramicroscopy 4 UA library record; WoS full record; WoS citing articles url doi
Vega Ibañez, F.; Béché, A.; Verbeeck, J. Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? 2022 Microscopy and microanalysis 3 UA library record; WoS full record; WoS citing articles url doi
Bliokh, K.Y.; Ivanov, I.P.; Guzzinati, G.; Clark, L.; Van Boxem, R.; Béché, A.; Juchtmans, R.; Alonso, M.A.; Schattschneider, P.; Nori, F.; Verbeeck, J. Theory and applications of free-electron vortex states 2017 Physics reports 690 210 UA library record; WoS full record; WoS citing articles url doi
Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings 2022 Ultramicroscopy 232 18 UA library record; WoS full record; WoS citing articles url doi
Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. Evaluation of different rectangular scan strategies for STEM imaging 2020 Ultramicroscopy 13 UA library record; WoS full record; WoS citing articles url doi
Prabhakara, V.; Jannis, D.; Guzzinati, G.; Béché, A.; Bender, H.; Verbeeck, J. HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale 2020 Ultramicroscopy 219 4 UA library record; WoS full record; WoS citing articles url doi
Béché, A.; Juchtmans, R.; Verbeeck, J. Efficient creation of electron vortex beams for high resolution STEM imaging 2017 Ultramicroscopy 178 30 UA library record; WoS full record; WoS citing articles pdf url doi
Béché, A.; Winkler, R.; Plank, H.; Hofer, F.; Verbeeck, J. Focused electron beam induced deposition as a tool to create electron vortices 2015 Micron 80 21 UA library record; WoS full record; WoS citing articles pdf url doi
Béché, A.; Goris, B.; Freitag, B.; Verbeeck, J. Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy 2016 Applied physics letters 108 40 UA library record; WoS full record; WoS citing articles pdf url doi
Guzzinati, G.; Béché, A.; Lourenço-Martins, H.; Martin, J.; Kociak, M.; Verbeeck, J. Probing the symmetry of the potential of localized surface plasmon resonances with phase-shaped electron beams 2017 Nature communications 8 84 UA library record; WoS full record; WoS citing articles pdf url doi
Van den Broek, W.; Reed, B.W.; Béché, A.; Velazco, A.; Verbeeck, J.; Koch, C.T. Various compressed sensing setups evaluated against Shannon sampling under constraint of constant illumination 2019 IEEE transactions on computational imaging 5 7 UA library record; WoS full record; WoS citing articles pdf doi
Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose 2019 Ultramicroscopy 203 25 UA library record; WoS full record; WoS citing articles pdf url doi
Bhat, S.G.; Gauquelin, N.; Sebastian, N.K.; Sil, A.; Béché, A.; Verbeeck, J.; Samal, D.; Kumar, P.S.A. Orthorhombic vs. hexagonal epitaxial SrIrO3 thin films : structural stability and related electrical transport properties 2018 Europhysics letters 122 4 UA library record; WoS full record; WoS citing articles pdf doi
Becker, M.; Guzzinati, G.; Béché, A.; Verbeeck, J.; Batelaan, H. Asymmetry and non-dispersivity in the Aharonov-Bohm effect 2019 Nature communications 10 12 UA library record; WoS full record; WoS citing articles url doi
Clark, L.; Béché, A.; Guzzinati, G.; Verbeeck, J. Quantitative measurement of orbital angular momentum in electron microscopy 2014 Physical review : A : atomic, molecular and optical physics 89 23 UA library record; WoS full record; WoS citing articles url doi
Egoavil, R.; Huehn, S.; Jungbauer, M.; Gauquelin, N.; Béché, A.; Van Tendeloo, G.; Verbeeck; Moshnyaga, V. Phase problem in the B-site ordering of La2CoMnO6 : impact on structure and magnetism 2015 Nanoscale 7 37 UA library record; WoS full record; WoS citing articles pdf url doi
de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting 2015 Ultramicroscopy 151 29 UA library record; WoS full record; WoS citing articles pdf url doi
Guzzinati, G.; Clark, L.; Béché, A.; Juchtmans, R.; Van Boxem, R.; Mazilu, M.; Verbeeck, J. Prospects for versatile phase manipulation in the TEM : beyond aberration correction 2015 Ultramicroscopy 151 19 UA library record; WoS full record; WoS citing articles pdf url doi
Mueller, K.; Krause, F.F.; Béché, A.; Schowalter, M.; Galioit, V.; Loeffler, S.; Verbeeck, J.; Zweck, J.; Schattschneider, P.; Rosenauer, A. Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction 2014 Nature communications 5 197 UA library record; WoS full record; WoS citing articles pdf url doi
Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. Quantitative STEM normalisation : the importance of the electron flux 2015 Ultramicroscopy 159 27 UA library record; WoS full record; WoS citing articles pdf url doi
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