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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Fatermans, J.; Van Aert, S.; den Dekker, A.J. |
The maximum a posteriori probability rule for atom column detection from HAADF STEM images |
2019 |
Ultramicroscopy |
201 |
1 |
UA library record; WoS full record; WoS citing articles |
|
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Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. |
Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose |
2019 |
Ultramicroscopy |
203 |
25 |
UA library record; WoS full record; WoS citing articles |
|
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Susi, T.; Madsen, J.; Ludacka, U.; Mortensen, J.J.; Pennycook, T.J.; Lee, Z.; Kotakoski, J.; Kaiser, U.; Meyer, J.C. |
Efficient first principles simulation of electron scattering factors for transmission electron microscopy |
2019 |
Ultramicroscopy |
197 |
3 |
UA library record; WoS full record; WoS citing articles |
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Pennycook, T.J.; Martinez, G.T.; Nellist, P.D.; Meyer, J.C. |
High dose efficiency atomic resolution imaging via electron ptychography |
2019 |
Ultramicroscopy |
196 |
1 |
UA library record; WoS full record; WoS citing articles |
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Leuthner, G.T.; Hummel, S.; Mangler, C.; Pennycook, T.J.; Susi, T.; Meyer, J.C.; Kotakoski, J. |
Scanning transmission electron microscopy under controlled low-pressure atmospheres |
2019 |
Ultramicroscopy |
203 |
4 |
UA library record; WoS full record; WoS citing articles |
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Vanrompay, H.; Skorikov, A.; Bladt, E.; Béché, A.; Freitag, B.; Verbeeck, J.; Bals, S. |
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges |
2021 |
Ultramicroscopy |
221 |
15 |
UA library record; WoS full record; WoS citing articles |
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Li, C.; Tardajos, A.P.; Wang, D.; Choukroun, D.; Van Daele, K.; Breugelmans, T.; Bals, S. |
A simple method to clean ligand contamination on TEM grids |
2021 |
Ultramicroscopy |
221 |
10 |
UA library record; WoS full record; WoS citing articles |
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De wael, A.; De Backer, A.; Lobato, I.; Van Aert, S. |
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt |
2021 |
Ultramicroscopy |
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UA library record; WoS full record; WoS citing articles |
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Koo, J.; Dahl, A.B.; Bærentzen, J.A.; Chen, Q.; Bals, S.; Dahl, V.A. |
Shape from projections via differentiable forward projector for computed tomography |
2021 |
Ultramicroscopy |
224 |
3 |
UA library record; WoS full record; WoS citing articles |
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Madsen, J.; Pennycook, T.J.; Susi, T. |
ab initio description of bonding for transmission electron microscopy |
2021 |
Ultramicroscopy |
231 |
|
UA library record; WoS full record; WoS citing articles |
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Abakumov, A.M.; Hadermann, J.; Van Tendeloo, G.; Antipov, E.V. |
Chemistry and structure of anion-deficient perovskites with translational interfaces |
2008 |
Journal of the American Ceramic Society |
91 |
39 |
UA library record; WoS full record; WoS citing articles |
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Fang, P.a.; Gu, H.; Wang, P.l.; Van Landuyt, J.; Vleugels, J.; Van der Biest, O.; |
Effect of powder coating on stabilizer distribution in CeO2-stabilized ZrO2 ceramics |
2005 |
Journal of the American Ceramic Society |
88 |
11 |
UA library record; WoS full record; WoS citing articles |
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Bals, S.; Verbeeck, J.; Van Tendeloo, G.; Liu, Y.-L.; Grivel, J.-C. |
Quantitative electron microscopy of (Bi,Pb)2Sr2Ca2Cu3O10+\delta/Ag multifilament tapes during initial stages of annealing |
2005 |
Journal of the American Ceramic Society |
88 |
1 |
UA library record; WoS full record; WoS citing articles |
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van Oeffelen, L.; Van Roy, W.; Idrissi, H.; Charlier, D.; Lagae, L.; Borghs, G. |
Ion current rectification, limiting and overlimiting conductances in nanopores |
2015 |
PLoS ONE |
10 |
11 |
UA library record; WoS full record; WoS citing articles |
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Ning, S.; Xu, W.; Ma, Y.; Loh, L.; Pennycook, T.J.; Zhou, W.; Zhang, F.; Bosman, M.; Pennycook, S.J.; He, Q.; Loh, N.D. |
Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets |
2022 |
Microscopy and microanalysis |
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UA library record; WoS full record; WoS citing articles |
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Yu, C.-P.; Friedrich, T.; Jannis, D.; Van Aert, S.; Verbeeck, J. |
Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM |
2022 |
Microscopy and microanalysis |
|
7 |
UA library record; WoS full record; WoS citing articles |
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De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. |
Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM |
2022 |
Microscopy and microanalysis |
|
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UA library record; WoS full record |
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Vega Ibañez, F.; Béché, A.; Verbeeck, J. |
Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? |
2022 |
Microscopy and microanalysis |
|
3 |
UA library record; WoS full record; WoS citing articles |
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Chen, Q.; Skorikov, A.; van der Hoeven, J.E.S.; van Blaaderen, A.; Albrecht, W.; Perez-Garza, H.H.; Bals, S. |
Estimation of temperature homogeneity in MEMS-based heating nanochips via quantitative HAADF-STEM tomography |
2023 |
Particle and particle systems characterization |
41 |
|
UA library record; WoS full record |
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Vanrompay, H.; Buurlage, J.‐W.; Pelt, D.M.; Kumar, V.; Zhuo, X.; Liz‐Marzán, L.M.; Bals, S.; Batenburg, K.J. |
Real‐Time Reconstruction of Arbitrary Slices for Quantitative and In Situ 3D Characterization of Nanoparticles |
2020 |
Particle & Particle Systems Characterization |
37 |
10 |
UA library record; WoS full record; WoS citing articles |
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Lebedev, N.; Stehno, M.; Rana, A.; Gauquelin, N.; Verbeeck, J.; Brinkman, A.; Aarts, J. |
Inhomogeneous superconductivity and quasilinear magnetoresistance at amorphous LaTiO₃/SrTiO₃ interfaces |
2020 |
Journal Of Physics-Condensed Matter |
33 |
1 |
UA library record; WoS full record; WoS citing articles |
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Corthals, S.; van Noyen, J.; Liang, D.; Ke, X.; Van Tendeloo, G.; Jacobs, P.; Sels, B. |
A cyclic catalyst pretreatment in CO2 for high yield production of Carbon nanofibers with narrow diameter distribution |
2011 |
Catalysis letters |
141 |
1 |
UA library record; WoS full record; WoS citing articles |
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Rehor, I.; Mackova, H.; Filippov, S.K.; Kucka, J.; Proks, V.; Slegerova, J.; Turner, S.; Van Tendeloo, G.; Ledvina, M.; Hruby, M.; Cigler, P.; |
Fluorescent nanodiamonds with bioorthogonally reactive protein-resistant polymeric coatings |
2014 |
ChemPlusChem |
79 |
34 |
UA library record; WoS full record; WoS citing articles |
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Van Havenbergh, K.; Turner, S.; Driesen, K.; Bridel, J.-S.; Van Tendeloo, G. |
Solidelectrolyte interphase evolution of carbon-coated silicon nanoparticles for lithium-ion batteries monitored by transmission electron microscopy and impedance spectroscopy |
2015 |
Energy technology |
3 |
|
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Boullay, P.; Potapov, P.L.; Kohn, R.V.; Ball, J.M. |
Microstructures and interfaces in Ni-Al martensite: comparing HRTEM observations with continuum theories |
2002 |
International journal of solids and structures |
39 |
13 |
UA library record; WoS full record; WoS citing articles |
|
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Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
High-resolution electron microscopy and electron tomography: resolution versus precision |
2002 |
Journal of structural biology |
138 |
33 |
UA library record; WoS full record; WoS citing articles |
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Tang, Y.; Chen, Z.; Borbely, A.; Ji, G.; Zhong, S.Y.; Schryvers, D.; Ji, V.; Wang, H.W. |
Quantitative study of particle size distribution in an in-situ grown Al-TiB2 composite by synchrotron X-ray diffraction and electron microscopy |
2015 |
Materials characterization |
102 |
41 |
UA library record; WoS full record; WoS citing articles |
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Yan, L.; Tan, Z.; Ji, G.; Li, Z.; Fan, G.; Schryvers, D.; Shan, A.; Zhang, D. |
A quantitative method to characterize the Al4C3-formed interfacial reaction: the case study of MWCNT/Al composites |
2015 |
Materials characterization |
112 |
24 |
UA library record; WoS full record; WoS citing articles |
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Espinoza Torres, C.; Condó, A.M.; Haberkorn, N.; Zelaya, E.; Schryvers, D.; Guimpel, J.; Lovey, F.C. |
Structures in textured Cu-Al-Ni shape memory thin films grown by sputtering |
2014 |
Materials characterization |
96 |
9 |
UA library record; WoS full record; WoS citing articles |
|
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Ji, G.; Tan, Z.; Shabadi, R.; Li, Z.; Grünewald, W.; Addad, A.; Schryvers, D.; Zhang, D. |
Triple ion beam cutting of diamond/Al composites for interface characterization |
2014 |
Materials characterization |
89 |
9 |
UA library record; WoS full record; WoS citing articles |
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