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Author |
Ji, G.; Tan, Z.; Shabadi, R.; Li, Z.; Grünewald, W.; Addad, A.; Schryvers, D.; Zhang, D. |
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Title |
Triple ion beam cutting of diamond/Al composites for interface characterization |
Type |
A1 Journal article |
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Year  |
2014 |
Publication |
Materials characterization |
Abbreviated Journal |
Mater Charact |
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Volume |
89 |
Issue |
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Pages |
132-137 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
A novel triple ion beam cutting technique was employed to prepare high-quality surfaces of diamond/Al composites for interfacial characterization, which has been unachievable so far. Near-perfect and artifact-free surfaces were obtained without mechanical pre-polishing. Hence, the as-prepared surfaces are readily available for further study and also, ready to be employed in a focus ion beam system for preferential selection of transmission electron microscopy samples. Dramatically different diamond/Al interface configurations – sub-micrometer Al2O3 particles and clean interfaces were unambiguously revealed. |
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Publisher |
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Place of Publication |
New York |
Editor |
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Wos |
000333513400015 |
Publication Date |
2014-01-18 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Edition |
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ISSN |
1044-5803; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
2.714 |
Times cited |
9 |
Open Access |
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Notes |
Fwo |
Approved |
Most recent IF: 2.714; 2014 IF: 1.845 |
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Call Number |
UA @ lucian @ c:irua:113394 |
Serial |
3735 |
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| Permanent link to this record |
