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	Author	Pennycook, T.J.; Martinez, G.T.; Nellist, P.D.; Meyer, J.C.
	Title	High dose efficiency atomic resolution imaging via electron ptychography			Type	A1 Journal article
	Year	2019	Publication	Ultramicroscopy	Abbreviated Journal	Ultramicroscopy
	Volume	196	Issue	196	Pages	131-135
	Keywords	A1 Journal article; Electron microscopy for materials research (EMAT)
	Abstract	Radiation damage places a fundamental limitation on the ability of microscopy to resolve many types of materials at high resolution. Here we evaluate the dose efficiency of phase contrast imaging with electron ptychography. The method is found to be far more resilient to temporal incoherence than conventional and spherical aberration optimized phase contrast imaging, resulting in significantly greater clarity at a given dose. This robustness is explained by the presence of achromatic lines in the four dimensional ptychographic dataset.
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	Corporate Author				Thesis
	Publisher		Place of Publication		Editor
	Language		Wos	000451180800018	Publication Date	2018-10-18
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	0304-3991	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor	2.843	Times cited	1	Open Access
	Notes				Approved	Most recent IF: 2.843
	Call Number	UA @ admin @ c:irua:165939			Serial	6301
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