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  Author Title Year Publication Volume Times cited Additional Links Links
Li, K.; Béché, A.; Song, M.; Sha, G.; Lu, X.; Zhang, K.; Du, Y.; Ringer, S.P.; Schryvers, D. Atomistic structure of Cu-containing \beta" precipitates in an Al-Mg-Si-Cu alloy 2014 Scripta materialia 75 22 UA library record; WoS full record; WoS citing articles doi
Ghidelli, M.; Orekhov, A.; Bassi, A.L.; Terraneo, G.; Djemia, P.; Abadias, G.; Nord, M.; Béché, A.; Gauquelin, N.; Verbeeck, J.; Raskin, J.-p.; Schryvers, D.; Pardoen, T.; Idrissi, H. Novel class of nanostructured metallic glass films with superior and tunable mechanical properties 2021 Acta Materialia 27 UA library record; WoS full record; WoS citing articles url doi
Idrissi, H.; Béché, A.; Gauquelin, N.; Ul-Haq, I.; Bollinger, C.; Demouchy, S.; Verbeeck, J.; Pardoen, T.; Schryvers, D.; Cordier, P. On the formation mechanisms of intragranular shear bands in olivine by stress-induced amorphization 2022 Acta materialia 239 5 UA library record; WoS full record; WoS citing articles url doi
Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures 2013 Physical review : B : condensed matter and materials physics 88 15 UA library record; WoS full record; WoS citing articles url doi
Juchtmans, R.; Béché, A.; Abakumov, A.; Batuk, M.; Verbeeck, J. Using electron vortex beams to determine chirality of crystals in transmission electron microscopy 2015 Physical review : B : condensed matter and materials physics 91 54 UA library record; WoS full record; WoS citing articles url doi
Guzzinati, G.; Clark, L.; Béché, A.; Verbeeck, J. Measuring the orbital angular momentum of electron beams 2014 Physical review : A : atomic, molecular and optical physics 89 42 UA library record; WoS full record; WoS citing articles url doi
Clark, L.; Béché, A.; Guzzinati, G.; Verbeeck, J. Quantitative measurement of orbital angular momentum in electron microscopy 2014 Physical review : A : atomic, molecular and optical physics 89 23 UA library record; WoS full record; WoS citing articles url doi
Béché, A.; Winkler, R.; Plank, H.; Hofer, F.; Verbeeck, J. Focused electron beam induced deposition as a tool to create electron vortices 2015 Micron 80 21 UA library record; WoS full record; WoS citing articles pdf url doi
Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L. Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope 2016 Micron 80 50 UA library record; WoS full record; WoS citing articles url doi
Vanrompay, H.; Béché, A.; Verbeeck, J.; Bals, S. Experimental Evaluation of Undersampling Schemes for Electron Tomography of Nanoparticles 2019 Particle and particle systems characterization 36 12 UA library record; WoS full record; WoS citing articles pdf doi
Wolf, D.; Rodriguez, L.A.; Béché, A.; Javon, E.; Serrano, L.; Magen, C.; Gatel, C.; Lubk, A.; Lichte, H.; Bals, S.; Van Tendeloo, G.; Fernández-Pacheco, A.; De Teresa, J.M.; Snoeck, E. 3D Magnetic Induction Maps of Nanoscale Materials Revealed by Electron Holographic Tomography 2015 Chemistry of materials 27 50 UA library record; WoS full record; WoS citing articles url doi
Bliokh, K.Y.; Ivanov, I.P.; Guzzinati, G.; Clark, L.; Van Boxem, R.; Béché, A.; Juchtmans, R.; Alonso, M.A.; Schattschneider, P.; Nori, F.; Verbeeck, J. Theory and applications of free-electron vortex states 2017 Physics reports 690 210 UA library record; WoS full record; WoS citing articles url doi
de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting 2015 Ultramicroscopy 151 29 UA library record; WoS full record; WoS citing articles pdf url doi
Verbeeck, J.; Béché, A.; van den Broek, W. A holographic method to measure the source size broadening in STEM 2012 Ultramicroscopy 120 29 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Tian, H.; Béché, A. A new way of producing electron vortex probes for STEM 2012 Ultramicroscopy 113 62 UA library record; WoS full record; WoS citing articles pdf doi
Guzzinati, G.; Clark, L.; Béché, A.; Juchtmans, R.; Van Boxem, R.; Mazilu, M.; Verbeeck, J. Prospects for versatile phase manipulation in the TEM : beyond aberration correction 2015 Ultramicroscopy 151 19 UA library record; WoS full record; WoS citing articles pdf url doi
Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. Quantitative STEM normalisation : the importance of the electron flux 2015 Ultramicroscopy 159 27 UA library record; WoS full record; WoS citing articles pdf url doi
Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography 2013 Ultramicroscopy 131 73 UA library record; WoS full record; WoS citing articles doi
Béché, A.; Juchtmans, R.; Verbeeck, J. Efficient creation of electron vortex beams for high resolution STEM imaging 2017 Ultramicroscopy 178 30 UA library record; WoS full record; WoS citing articles pdf url doi
Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy 2016 Ultramicroscopy 178 93 UA library record; WoS full record; WoS citing articles pdf url doi
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. Locating light and heavy atomic column positions with picometer precision using ISTEM 2016 Ultramicroscopy 172 8 UA library record; WoS full record; WoS citing articles url doi
Béché, A.; Rouvière, J.L.; Barnes, J.P.; Cooper, D. Dark field electron holography for strain measurement 2011 Ultramicroscopy 111 31 UA library record; WoS full record; WoS citing articles doi
Gauquelin, N.; van den Bos, K.H.W.; Béché, A.; Krause, F.F.; Lobato, I.; Lazar, S.; Rosenauer, A.; Van Aert, S.; Verbeeck, J. Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques 2017 Ultramicroscopy 181 34 UA library record; WoS full record; WoS citing articles pdf url doi
Verbeeck, J.; Béché, A.; Müller-Caspary, K.; Guzzinati, G.; Luong, M.A.; Den Hertog, M. Demonstration of a 2 × 2 programmable phase plate for electrons 2018 Ultramicroscopy 190 73 UA library record; WoS full record; WoS citing articles pdf url doi
Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose 2019 Ultramicroscopy 203 25 UA library record; WoS full record; WoS citing articles pdf url doi
Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. Evaluation of different rectangular scan strategies for STEM imaging 2020 Ultramicroscopy 13 UA library record; WoS full record; WoS citing articles url doi
Prabhakara, V.; Jannis, D.; Guzzinati, G.; Béché, A.; Bender, H.; Verbeeck, J. HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale 2020 Ultramicroscopy 219 4 UA library record; WoS full record; WoS citing articles url doi
Vanrompay, H.; Skorikov, A.; Bladt, E.; Béché, A.; Freitag, B.; Verbeeck, J.; Bals, S. Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges 2021 Ultramicroscopy 221 15 UA library record; WoS full record; WoS citing articles url doi
Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings 2022 Ultramicroscopy 232 18 UA library record; WoS full record; WoS citing articles url doi
Jannis, D.; Hofer, C.; Gao, C.; Xie, X.; Béché, A.; Pennycook, Tj.; Verbeeck, J. Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications 2022 Ultramicroscopy 233 31 UA library record; WoS full record; WoS citing articles pdf url doi
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