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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Rahemi, V.; Sarmadian, N.; Anaf, W.; Janssens, K.; Lamoen, D.; Partoens, B.; De Wael, K. |
Unique opto-electronic structure and photo reduction properties of sulfur doped lead chromates explaining their instability in paintings |
2017 |
Analytical chemistry |
89 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
Mosquera, J.; Wang, D.; Bals, S.; Liz-Marzan, L.M. |
Surfactant layers on gold nanorods |
2023 |
Accounts of chemical research |
56 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
Albrecht, W.; Van Aert, S.; Bals, S. |
Three-Dimensional Nanoparticle Transformations Captured by an Electron Microscope |
2021 |
Accounts Of Chemical Research |
54 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
Gasparotto, A.; Maccato, C.; Carraro, G.; Sada, C.; Štangar, U.L.; Alessi, B.; Rocks, C.; Mariotti, D.; La Porta, A.; Altantzis, T.; Barreca, D. |
Surface Functionalization of Grown-on-Tip ZnO Nanopyramids: From Fabrication to Light-Triggered Applications |
2019 |
Acs Applied Materials & Interfaces |
11 |
1 |
|
|
|
De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. |
Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM |
2022 |
Microscopy and microanalysis |
|
|
UA library record; WoS full record |
|
|
Vega Ibañez, F.; Béché, A.; Verbeeck, J. |
Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? |
2022 |
Microscopy and microanalysis |
|
3 |
UA library record; WoS full record; WoS citing articles |
|
|
Yu, C.-P.; Friedrich, T.; Jannis, D.; Van Aert, S.; Verbeeck, J. |
Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM |
2022 |
Microscopy and microanalysis |
|
7 |
UA library record; WoS full record; WoS citing articles |
|
|
Ning, S.; Xu, W.; Ma, Y.; Loh, L.; Pennycook, T.J.; Zhou, W.; Zhang, F.; Bosman, M.; Pennycook, S.J.; He, Q.; Loh, N.D. |
Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets |
2022 |
Microscopy and microanalysis |
|
|
UA library record; WoS full record; WoS citing articles |
|
|
Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. |
Fast electron low dose tomography for beam sensitive materials |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
|
|
MacArthur, K.E.; Yankovich, A.B.; Béché, A.; Luysberg, M.; Brown, H.G.; Findlay, S.D.; Heggen, M.; Allen, L.J. |
Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale |
2021 |
Microscopy And Microanalysis |
|
|
UA library record; WoS full record; WoS citing articles |
|
|
Paterson, G.W.; Webster, R.W.H.; Ross, A.; Paton, K.A.; Macgregor, T.A.; McGrouther, D.; MacLaren, I.; Nord, M. |
Fast pixelated detectors in scanning transmission electron microscopy. part II : post-acquisition data processing, visualization, and structural characterization |
2020 |
Microscopy And Microanalysis |
26 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
Nord, M.; Webster, R.W.H.; Paton, K.A.; McVitie, S.; McGrouther, D.; MacLaren, I.; Paterson, G.W. |
Fast pixelated detectors in scanning transmission electron microscopy. Part I: data acquisition, live processing, and storage |
2020 |
Microscopy And Microanalysis |
26 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
Goris, B.; Freitag, B.; Zanaga, D.; Bladt, E.; Altantzis, T.; Ringnalda, J.; Bals, S. |
Towards quantitative EDX results in 3 dimensions |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record |
|
|
Masenelli-Varlot, K.; Malchere, A.; Ferreira, J.; Heidari Mezerji, H.; Bals, S.; Messaoudi, C.; Garrido, S.M. |
Wet-STEM tomography : principles, potentialities and limitations |
2014 |
Microscopy and microanalysis |
20 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. |
Ultra-high resolution electron tomography for materials science : a roadmap |
2011 |
Microscopy and microanalysis |
17 |
|
UA library record |
|
|
Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. |
Computational aspects in quantitative EELS |
2010 |
Microscopy and microanalysis |
16 |
|
UA library record |
|
|
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. |
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy |
2009 |
Microscopy and microanalysis |
15 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Tian, H.; Schryvers, D.; Shabalovskaya, S.; van Humbeeck, J. |
Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwire |
2009 |
Microscopy and microanalysis |
15 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
Pennycook, T.J.; Martinez, G.T.; O'Leary, C.M.; Yang, H.; Nellist, P.D. |
Efficient Phase Contrast Imaging via Electron Ptychography, a Tutorial |
2019 |
Microscopy and microanalysis |
25 |
|
UA library record |
|
|
Tafuri, F.; Granozio, F.M.; Carillo, F.; Lombardi, F.; Di Uccio, U.S.; Verbist, K.; Lebedev, O.; Van Tendeloo, G. |
Josephson phenomenology and microstructure of YBaCuO artificial grain boundaries characterized by misalignment of the c-axes |
1999 |
Physica: C : superconductivity |
327 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
Yu, R.; Zeng, W.; Zhou, L.; Van Tendeloo, G.; Mai, L.; Yao, Z.; Wu, J. |
Layer-by-layer delithiation during lattice collapse as the origin of planar gliding and microcracking in Ni-rich cathodes |
2023 |
Cell reports physical science |
4 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Ding, Y.; Maitra, S.; Arenas Esteban, D.; Bals, S.; Vrielinck, H.; Barakat, T.; Roy, S.; Van Tendeloo, G.; Liu, J.; Li, Y.; Vlad, A.; Su, B.-L. |
Photochemical production of hydrogen peroxide by digging pro-superoxide radical carbon vacancies in carbon nitride |
2022 |
Cell reports physical science |
3 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
Sun, C.; Liao, X.; Peng, H.; Zhang, C.; Van Tendeloo, G.; Zhao, Y.; Wu, J. |
Interfacial gliding-driven lattice oxygen release in layered cathodes |
2022 |
Cell reports physical science |
3 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Adam, N.; Leroux, F.; Knapen, D.; Bals, S.; Blust, R. |
The uptake and elimination of ZnO and CuO nanoparticles in Daphnia magna under chronic exposure scenarios |
2015 |
Water research |
68 |
51 |
UA library record; WoS full record; WoS citing articles |
|
|
Şentürk, D.G.; De Backer, A.; Van Aert, S. |
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination |
2024 |
Ultramicroscopy |
259 |
|
UA library record |
|
|
Hofer, C.; Gao, C.; Chennit, T.; Yuan, B.; Pennycook, T.J. |
Phase offset method of ptychographic contrast reversal correction |
2024 |
Ultramicroscopy |
|
|
UA library record; WoS full record |
|
|
Gao, C.; Hofer, C.; Pennycook, T.J. |
On central focusing for contrast optimization in direct electron ptychography of thick samples |
2024 |
Ultramicroscopy |
256 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Şentürk, DG.; Yu, CP.; De Backer, A.; Van Aert, S. |
Atom counting from a combination of two ADF STEM images |
2024 |
Ultramicroscopy |
255 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Van den Broek, W.; Jannis, D.; Verbeeck, J. |
Convexity constraints on linear background models for electron energy-loss spectra |
2023 |
Ultramicroscopy |
254 |
|
UA library record |
|
|
Hofer, C.; Pennycook, T.J. |
Reliable phase quantification in focused probe electron ptychography of thin materials |
2023 |
Ultramicroscopy |
254 |
|
UA library record; WoS full record; WoS citing articles |
|