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  Author Title Year Publication Volume Times cited Additional Links (up) Links
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. Locating light and heavy atomic column positions with picometer precision using ISTEM 2016 Ultramicroscopy 172 8 UA library record; WoS full record; WoS citing articles url doi
Béché, A.; Rouvière, J.L.; Barnes, J.P.; Cooper, D. Dark field electron holography for strain measurement 2011 Ultramicroscopy 111 31 UA library record; WoS full record; WoS citing articles doi
Denneulin, T.; Rouvière, J.L.; Béché, A.; Py, M.; Barnes, J.P.; Rochat, N.; Hartmann, J.M.; Cooper, D. The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography 2011 Semiconductor science and technology 26 UA library record; WoS full record; WoS citing articles pdf doi
Cooper, D.; Rouvière, J.-L.; Béché, A.; Kadkhodazadeh, S.; Semenova, E.S.; Dunin-Borkowsk, R. Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography 2011 Applied physics letters 99 26 UA library record; WoS full record; WoS citing articles doi
Rouvière, J.-L.; Béché, A.; Martin, Y.; Denneulin, T.; Cooper, D. Improved strain precision with high spatial resolution using nanobeam precession electron diffraction 2013 Applied physics letters 103 53 UA library record; WoS full record; WoS citing articles doi
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM 2014 Microscopy and microanalysis 20 UA library record doi
Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L. Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope 2016 Micron 80 50 UA library record; WoS full record; WoS citing articles url doi
Lepot, K.; Addad, A.; Knoll, A.H.; Wang, J.; Troadec, D.; Béché, A.; Javaux, E.J. Iron minerals within specific microfossil morphospecies of the 1.88 Ga Gunflint Formation 2017 Nature communications 8 20 UA library record; WoS full record; WoS citing articles pdf url doi
Guzzinati, G.; Béché, A.; Lourenço-Martins, H.; Martin, J.; Kociak, M.; Verbeeck, J. Probing the symmetry of the potential of localized surface plasmon resonances with phase-shaped electron beams 2017 Nature communications 8 84 UA library record; WoS full record; WoS citing articles pdf url doi
Bliokh, K.Y.; Ivanov, I.P.; Guzzinati, G.; Clark, L.; Van Boxem, R.; Béché, A.; Juchtmans, R.; Alonso, M.A.; Schattschneider, P.; Nori, F.; Verbeeck, J. Theory and applications of free-electron vortex states 2017 Physics reports 690 210 UA library record; WoS full record; WoS citing articles url doi
Kleibert, A.; Balan, A.; Yanes, R.; Derlet, P.M.; Vaz, C.A.F.; Timm, M.; Fraile Rodríguez, A.; Béché, A.; Verbeeck, J.; Dhaka, R.S.; Radovic, M.; Nowak, U.; Nolting, F. Direct observation of enhanced magnetism in individual size- and shape-selected 3d transition metal nanoparticles 2017 Physical review B 95 21 UA library record; WoS full record; WoS citing articles pdf url doi
Gauquelin, N.; van den Bos, K.H.W.; Béché, A.; Krause, F.F.; Lobato, I.; Lazar, S.; Rosenauer, A.; Van Aert, S.; Verbeeck, J. Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques 2017 Ultramicroscopy 181 34 UA library record; WoS full record; WoS citing articles pdf url doi
Verbeeck, J.; Béché, A.; Müller-Caspary, K.; Guzzinati, G.; Luong, M.A.; Den Hertog, M. Demonstration of a 2 × 2 programmable phase plate for electrons 2018 Ultramicroscopy 190 73 UA library record; WoS full record; WoS citing articles pdf url doi
Bhat, S.G.; Gauquelin, N.; Sebastian, N.K.; Sil, A.; Béché, A.; Verbeeck, J.; Samal, D.; Kumar, P.S.A. Orthorhombic vs. hexagonal epitaxial SrIrO3 thin films : structural stability and related electrical transport properties 2018 Europhysics letters 122 4 UA library record; WoS full record; WoS citing articles pdf doi
Vanrompay, H.; Bladt, E.; Albrecht, W.; Béché, A.; Zakhozheva, M.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Bals, S. 3D characterization of heat-induced morphological changes of Au nanostars by fast in situ electron tomography 2018 Nanoscale 10 55 UA library record; WoS full record; WoS citing articles url doi
Altantzis, T.; Lobato, I.; De Backer, A.; Béché, A.; Zhang, Y.; Basak, S.; Porcu, M.; Xu, Q.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Tendeloo, G.; Van Aert, S.; Bals, S. Three-Dimensional Quantification of the Facet Evolution of Pt Nanoparticles in a Variable Gaseous Environment 2019 Nano letters 19 82 UA library record; WoS full record; WoS citing articles url doi
Van Aert, S.; De Backer, A.; Jones, L.; Martinez, G.T.; Béché, A.; Nellist, P.D. Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy 2019 Physical review letters 122 3 UA library record; WoS full record; WoS citing articles pdf url doi
Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. Spectroscopic coincidence experiments in transmission electron microscopy 2019 Applied physics letters 114 18 UA library record; WoS full record; WoS citing articles pdf url doi
Becker, M.; Guzzinati, G.; Béché, A.; Verbeeck, J.; Batelaan, H. Asymmetry and non-dispersivity in the Aharonov-Bohm effect 2019 Nature communications 10 12 UA library record; WoS full record; WoS citing articles url doi
Vanrompay, H.; Béché, A.; Verbeeck, J.; Bals, S. Experimental Evaluation of Undersampling Schemes for Electron Tomography of Nanoparticles 2019 Particle and particle systems characterization 36 12 UA library record; WoS full record; WoS citing articles pdf doi
Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping 2019 Applied physics letters 114 17 UA library record; WoS full record; WoS citing articles url doi
Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose 2019 Ultramicroscopy 203 25 UA library record; WoS full record; WoS citing articles pdf url doi
Van den Broek, W.; Reed, B.W.; Béché, A.; Velazco, A.; Verbeeck, J.; Koch, C.T. Various compressed sensing setups evaluated against Shannon sampling under constraint of constant illumination 2019 IEEE transactions on computational imaging 5 7 UA library record; WoS full record; WoS citing articles pdf doi
Idrissi, H.; Ghidelli, M.; Béché, A.; Turner, S.; Gravier, S.; Blandin, J.-J.; Raskin, J.-P.; Schryvers, D.; Pardoen, T. Atomic-scale viscoplasticity mechanisms revealed in high ductility metallic glass films 2019 Scientific reports 9 UA library record; WoS full record; WoS citing articles url doi
Guzzinati, G.; Béché, A.; McGrouther, D.; Verbeeck, J. Prospects for out-of-plane magnetic field measurements through interference of electron vortex modes in the TEM 2019 Journal of optics 21 3 UA library record; WoS full record; WoS citing articles pdf url doi
Prabhakara, V.; Jannis, D.; Béché, A.; Bender, H.; Verbeeck, J. Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique 2019 Semiconductor science and technology 8 UA library record; WoS full record; WoS citing articles url doi
Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. Spectrocopic coincidence experiment in transmission electron microscopy 2019 UA library record doi
Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer 2019 UA library record doi
Guzzinati, G.; Béché, A.; McGrouther, D.; Verbeeck, J. Rotation of electron beams in the presence of localised, longitudinal magnetic fields 2019 UA library record doi
Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. Evaluation of different rectangular scan strategies for STEM imaging 2020 Ultramicroscopy 13 UA library record; WoS full record; WoS citing articles url doi
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