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Author Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. doi  openurl
  Title Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer Type Dataset
  Year (down) 2019 Publication Abbreviated Journal  
  Volume Issue Pages  
  Keywords Dataset; ADReM Data Lab (ADReM); Electron microscopy for materials research (EMAT)  
  Abstract  
  Address  
  Corporate Author Thesis  
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  Language Wos Publication Date  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:169114 Serial 6865  
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