|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Dabaghmanesh, S.; Sarmadian, N.; Neyts, E.C.; Partoens, B. |
A first principles study of p-type defects in LaCrO3 |
2017 |
Physical chemistry, chemical physics |
19 |
16 |
UA library record; WoS full record; WoS citing articles |
|
|
Sanchez-Barriga, J.; Ogorodnikov, I.I.; Kuznetsov, M.V.; Volykhov, A.A.; Matsui, F.; Callaert, C.; Hadermann, J.; Verbitskiy, N.I.; Koch, R.J.; Varykhalov, A.; Rader, O.; Yashina, L.V. |
Observation of hidden atomic order at the interface between Fe and topological insulator Bi2Te3 |
2017 |
Physical chemistry, chemical physics |
19 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
Pramanik, G.; Humpolickova, J.; Valenta, J.; Kundu, P.; Bals, S.; Bour, P.; Dracinsky, M.; Cigler, P. |
Gold nanoclusters with bright near-infrared photoluminescence |
2018 |
Nanoscale |
10 |
97 |
UA library record; WoS full record; WoS citing articles |
|
|
Lombardo, J.; Jelić, Ž.L.; Baumans, X.D.A.; Scheerder, J.E.; Nacenta, J.P.; Moshchalkov, V.V.; Van de Vondel, J.; Kramer, R.B.G.; Milošević, M.V.; Silhanek, A.V. |
In situ tailoring of superconducting junctions via electro-annealing |
2018 |
Nanoscale |
10 |
23 |
UA library record; WoS full record; WoS citing articles |
|
|
Aierken, Y.; Sevik, C.; Gulseren, O.; Peeters, F.M.; Çakir, D. |
MXenes/graphene heterostructures for Li battery applications : a first principles study |
2018 |
Journal of materials chemistry A : materials for energy and sustainability |
6 |
131 |
UA library record; WoS full record; WoS citing articles |
|
|
Rizzo, F.; Augieri, A.; Kursumovic, A.; Bianchetti, M.; Opherden, L.; Sieger, M.; Huehne, R.; Haenisch, J.; Meledin, A.; Van Tendeloo, G.; MacManus-Driscoll, J.L.; Celentano, G. |
Pushing the limits of applicability of REBCO coated conductor films through fine chemical tuning and nanoengineering of inclusions |
2018 |
Nanoscale |
10 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
Kong, X.; Li, L.; Leenaerts, O.; Wang, W.; Liu, X.-J.; Peeters, F.M. |
Quantum anomalous Hall effect in a stable 1T-YN2 monolayer with a large nontrivial bandgap and a high Chern number |
2018 |
Nanoscale |
10 |
28 |
UA library record; WoS full record; WoS citing articles |
|
|
Bueken, B.; Van Velthoven, N.; Willhammar, T.; Stassin, T.; Stassen, I.; Keen, D.A.; Baron, G.V.; Denayer, J.F.M.; Ameloot, R.; Bals, S.; De Vos, D.; Bennett, T.D. |
Gel-based morphological design of zirconium metal-organic frameworks |
2017 |
Chemical science |
8 |
168 |
UA library record; WoS full record; WoS citing articles |
|
|
Leroux, F.; Bladt, E.; Timmermans, J.-P.; Van Tendeloo, G.; Bals, S. |
Annular dark-field transmission electron microscopy for low contrast materials |
2013 |
Microscopy and microanalysis |
19 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. |
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy |
2009 |
Microscopy and microanalysis |
15 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS |
2002 |
Microscopy and microanalysis |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. |
Computational aspects in quantitative EELS |
2010 |
Microscopy and microanalysis |
16 |
|
UA library record |
|
|
Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Verbeeck, J. |
EELS investigations of different niobium oxide phases |
2006 |
Microscopy and microanalysis |
12 |
50 |
UA library record; WoS full record; WoS citing articles |
|
|
Bach, D.; Schneider, R.; Gerthsen, D.; Verbeeck, J.; Sigle, W. |
EELS of niobium and stoichiometric niobium-oxide phases: part 1: plasmon and Near-edges fine structure |
2009 |
Microscopy and microanalysis |
15 |
55 |
UA library record; WoS full record; WoS citing articles |
|
|
van den Broek, W.; Van Aert, S.; van Dyck, D. |
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency |
2012 |
Microscopy and microanalysis |
18 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. |
High-quality sample preparation by low kV FIB thinning for analytical TEM measurements |
2007 |
Microscopy and microanalysis |
13 |
82 |
UA library record; WoS full record; WoS citing articles |
|
|
Lu, J.; Roeffaers, M.B.J.; Bartholomeeusen, E.; Sels, B.F.; Schryvers, D. |
Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy |
2014 |
Microscopy and microanalysis |
20 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
Tian, H.; Schryvers, D.; Shabalovskaya, S.; van Humbeeck, J. |
Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwire |
2009 |
Microscopy and microanalysis |
15 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
Grieten, E.; Caen, J.; Schryvers, D. |
Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record; WoS full record; WoS citing articles |
|
|
van Dyck, D.; Van Aert, S.; den Dekker, A.J. |
Physical limits on atomic resolution |
2004 |
Microscopy and microanalysis |
10 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
Idrissi, H.; Turner, S.; Mitsuhara, M.; Wang, B.; Hata, S.; Coulombier, M.; Raskin, J.-P.; Pardoen, T.; Van Tendeloo, G.; Schryvers, D. |
Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study |
2011 |
Microscopy and microanalysis |
17 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. |
Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy |
2007 |
Microscopy and microanalysis |
13 |
|
UA library record |
|
|
Bals, S.; Radmilovic, V.; Kisielowski, C. |
TEM annular objective apertures fabricated by FIB |
2004 |
Microscopy and microanalysis |
10 |
|
UA library record |
|
|
Ke, X.; Bals, S.; Cott, D.; Hantschel, T.; Bender, H.; Van Tendeloo, G. |
Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts |
2010 |
Microscopy and microanalysis |
16 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
Goris, B.; Freitag, B.; Zanaga, D.; Bladt, E.; Altantzis, T.; Ringnalda, J.; Bals, S. |
Towards quantitative EDX results in 3 dimensions |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record |
|
|
Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. |
Ultra-high resolution electron tomography for materials science : a roadmap |
2011 |
Microscopy and microanalysis |
17 |
|
UA library record |
|
|
Masenelli-Varlot, K.; Malchere, A.; Ferreira, J.; Heidari Mezerji, H.; Bals, S.; Messaoudi, C.; Garrido, S.M. |
Wet-STEM tomography : principles, potentialities and limitations |
2014 |
Microscopy and microanalysis |
20 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
Gjorgievska, E.; Van Tendeloo, G.; Nicholson, J.W.; Coleman, N.J.; Slipper, I.J.; Booth, S. |
The incorporation of nanoparticles into conventional glass-ionomer dental restorative cements |
2015 |
Microscopy and microanalysis |
21 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. |
Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record |
|
|
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C. |
Defect related growth of tabular AgCl(100) crystals: a TEM study |
1998 |
|
|
|
UA library record; WoS full record; |
|