NANOlab Center of Excellence literature database -- Query Results

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Author	Title	Year	Publication	Volume	Times cited	Additional Links
Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.	Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy	2007	Microscopy and microanalysis	13		UA library record
Goris, B.; de Backer, A.; Van Aert, S.; Gómez-Graña, S.; Liz-Marzán, L.M.; Van Tendeloo, G.; Bals, S.	Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals	2013	Nano letters	13	90	UA library record; WoS full record; WoS citing articles
Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J.	Ultra-high resolution electron tomography for materials science : a roadmap	2011	Microscopy and microanalysis	17		UA library record
Molina-Luna, L.; Duerrschnabel, M.; Turner, S.; Erbe, M.; Martinez, G.T.; Van Aert, S.; Holzapfel, B.; Van Tendeloo, G.	Atomic and electronic structures of BaHfO₃-doped TFA-MOD-derived YBa₂Cu₃O_7−δthin films	2015	Superconductor science and technology	28	4	UA library record; WoS full record; WoS citing articles
Liao, Z.; Huijben, M.; Zhong, Z.; Gauquelin, N.; Macke, S.; Green, R.J.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Held, K.; Sawatzky, G.A.; Koster, G.; Rijnders, G.	Controlled lateral anisotropy in correlated manganite heterostructures by interface-engineered oxygen octahedral coupling	2016	Nature materials	15	273	UA library record; WoS full record; WoS citing articles
De Backer, A.; De Wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S.	Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?	2015	Journal of physics : conference series	644		UA library record; WoS full record
Varambhia, A.M.; Jones, L.; De Backer, A.; Fauske, V.T.; Van Aert, S.; Ozkaya, D.; Nellist, P.D.	Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM	2016	Particle and particle systems characterization	33	4	UA library record; WoS full record; WoS citing articles
Lobato, I.; Van Aert, S.; Verbeeck, J.	Progress and new advances in simulating electron microscopy datasets using MULTEM	2016	Ultramicroscopy	168	43	UA library record; WoS full record; WoS citing articles
Liao, Z; , Green, R.J; Gauquelin, N; Macke, S.; Li, L.; Gonnissen, J; Sutarto, R.; Houwman, E.P.; Zhong, Z.; Van Aert, S.; Verbeeck, J.; Sawatzky, G.A.; Huijben, M.; Koster, G.; Rijnders, G.	Long-Range Domain Structure and Symmetry Engineering by Interfacial Oxygen Octahedral Coupling at Heterostructure Interface	2016	Advanced functional materials	26	23	UA library record; WoS full record; WoS citing articles
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S.	Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design	2016	Ultramicroscopy	170	6	UA library record; WoS full record; WoS citing articles
Gonnissen, J.; Batuk, D.; Nataf, G.F.; Jones, L.; Abakumov, A.M.; Van Aert, S.; Schryvers, D.; Salje, E.K.H.	Direct Observation of Ferroelectric Domain Walls in LiNbO₃: Wall-Meanders, Kinks, and Local Electric Charges	2016	Advanced functional materials	26	23	UA library record; WoS full record; WoS citing articles
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S.	StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images	2016	Ultramicroscopy	171	43	UA library record; WoS full record; WoS citing articles
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S.	Locating light and heavy atomic column positions with picometer precision using ISTEM	2016	Ultramicroscopy	172	8	UA library record; WoS full record; WoS citing articles
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S.	Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question	2016	Ultramicroscopy	174	2	UA library record; WoS full record; WoS citing articles
Goris, B.; De Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, J.; Sanchez-Iglesias, A.; Liz-Marzan, L.; Van Aert, S.; Sijbers, J.; Van Tendeloo, G.; Bals, S.	Investigating lattice strain in Au nanodecahedrons	2016				UA library record
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S.	Atom column detection	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	Atom counting	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	Efficient fitting algorithm	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	General conclusions and future perspectives	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S.	Image-quality evaluation and model selection with maximum a posteriori probability	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	Introduction	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	Optimal experiment design for nanoparticle atom counting from ADF STEM images	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	Statistical parameter estimation theory : principles and simulation studies	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics			UA library record
Hao, Y.; Velpula, G.; Kaltenegger, M.; Bodlos, W.R.; Vibert, F.; Mali, K.S.; De Feyter, S.; Resel, R.; Geerts, Y.H.; Van Aert, S.; Beljonne, D.; Lazzaroni, R.	From 2D to 3D : bridging self-assembled monolayers to a substrate-induced polymorph in a molecular semiconductor	2022	Chemistry of materials	34		UA library record; WoS full record; WoS citing articles
Ren, P.; Zhang, T.; Jain, N.; Ching, H.Y.V.; Jaworski, A.; Barcaro, G.; Monti, S.; Silvestre-Albero, J.; Celorrio, V.; Chouhan, L.; Rokicinska, A.; Debroye, E.; Kustrowski, P.; Van Doorslaer, S.; Van Aert, S.; Bals, S.; Das, S.	An atomically dispersed Mn-photocatalyst for generating hydrogen peroxide from seawater via the Water Oxidation Reaction (WOR)	2023	Journal of the American Chemical Society	145	21	UA library record; WoS full record; WoS citing articles
Zhang, Z.; Lobato, I.; Brown, H.; Jannis, D.; Verbeeck, J.; Van Aert, S.; Nellist, P.	Generalised oscillator strength for core-shell electron excitation by fast electrons based on Dirac solutions	2023				UA library record
Hugenschmidt, M.; Jannis, D.; Kadu, A.A.; Grünewald, L.; De Marchi, S.; Perez-Juste, J.; Verbeeck, J.; Van Aert, S.; Bals, S.	Low-dose 4D-STEM tomography for beam-sensitive nanocomposites	2023	ACS materials letters	6		UA library record; WoS full record
Grünewald, L.; Chezganov, D.; De Meyer, R.; Orekhov, A.; Van Aert, S.; Bogaerts, A.; Bals, S.; Verbeeck, J.	Supplementary Information for “In-situ Plasma Studies using a Direct Current Microplasma in a Scanning Electron Microscope”	2023				UA library record
Martinez, G.T.; van den Bos, K.H.W.; Alania, M.; Nellist, P.D.; Van Aert, S.	Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy	2018	Ultramicroscopy	187	4	UA library record; WoS full record; WoS citing articles
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G.	Advanced electron crystallography through model-based imaging	2016	IUCrJ	3	30	UA library record; WoS full record; WoS citing articles