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Author de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. pdf  doi
isbn  openurl
  Title Efficient fitting algorithm Type H2 Book chapter
  Year (down) 2021 Publication Advances in imaging and electron physics T2 – Advances in imaging and electron physics Abbreviated Journal  
  Volume Issue Pages 73-90  
  Keywords H2 Book chapter; Electron microscopy for materials research (EMAT)  
  Abstract An efficient model-based estimation algorithm is introduced to quantify the atomic column positions and intensities from atomic-resolution (scanning) transmission electron microscopy ((S)TEM) images. This algorithm uses the least squares estimator on image segments containing individual columns fully accounting for overlap between neighboring columns, enabling the analysis of a large field of view. To provide end-users with this well-established quantification method, a user friendly program, StatSTEM, is developed which is freely available under a GNU public license. In this chapter, this efficient algorithm is applied to three different nanostructures for which the analysis of a large field of view is required.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos Publication Date 2021-03-06  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume 217 Series Issue Edition  
  ISSN ISBN 978-0-12-824607-8; 1076-5670 Additional Links UA library record  
  Impact Factor Times cited Open Access Not_Open_Access  
  Notes ERC Consolidator project funded by the European Union grant #770887 Picometrics Approved Most recent IF: NA  
  Call Number UA @ admin @ c:irua:177528 Serial 6778  
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