toggle visibility
Search within Results:
Display Options:

Select All    Deselect All
List View
 |   | 
   print
  Author (up) Title Year Publication Volume Times cited Additional Links Links
Korneychuk, S.; Partoens, B.; Guzzinati, G.; Ramaneti, R.; Derluyn, J.; Haenen, K.; Verbeeck, J. Exploring possibilities of band gap measurement with off-axis EELS in TEM 2018 Ultramicroscopy 189 7 UA library record; WoS full record; WoS citing articles pdf url doi
Krause, F.F.; Ahl, J.P.; Tytko, D.; Choi, P.P.; Egoavil, R.; Schowalter, M.; Mehrtens, T.; Müller-Caspary, K.; Verbeeck, J.; Raabe, D.; Hertkorn, J.; Engl, K.; Rosenauer, A. Homogeneity and composition of AlInGaN : a multiprobe nanostructure study 2015 Ultramicroscopy 156 11 UA library record; WoS full record; WoS citing articles pdf url doi
Kruse, P.; Schowalter, M.; Lamoen, D.; Rosenauer, A.; Gerthsen, D. Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography 2006 Ultramicroscopy 106 50 UA library record; WoS full record; WoS citing articles doi
Leuthner, G.T.; Hummel, S.; Mangler, C.; Pennycook, T.J.; Susi, T.; Meyer, J.C.; Kotakoski, J. Scanning transmission electron microscopy under controlled low-pressure atmospheres 2019 Ultramicroscopy 203 4 UA library record; WoS full record; WoS citing articles pdf doi
Li, C.; Tardajos, A.P.; Wang, D.; Choukroun, D.; Van Daele, K.; Breugelmans, T.; Bals, S. A simple method to clean ligand contamination on TEM grids 2021 Ultramicroscopy 221 10 UA library record; WoS full record; WoS citing articles url doi
Lichtert, S.; Verbeeck, J. Statistical consequences of applying a PCA noise filter on EELS spectrum images 2013 Ultramicroscopy 125 54 UA library record; WoS full record; WoS citing articles pdf doi
Lobato, I.; De Backer, A.; Van Aert, S. Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network 2023 Ultramicroscopy 251 UA library record; WoS full record pdf url doi
Lobato, I.; Van Aert, S.; Verbeeck, J. Progress and new advances in simulating electron microscopy datasets using MULTEM 2016 Ultramicroscopy 168 43 UA library record; WoS full record; WoS citing articles pdf doi
Lobato, I.; van Dyck, D. Improved multislice calculations for including higher-order Laue zones effects 2012 Ultramicroscopy 119 6 UA library record; WoS full record; WoS citing articles doi
Lobato, I.; Van Dyck, D. MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA 2015 Ultramicroscopy 156 32 UA library record; WoS full record; WoS citing articles pdf doi
Lubk, A.; Javon, E.; Cherkashin, N.; Reboh, S.; Gatel, C.; Hytch, M. Dynamic scattering theory for dark-field electron holography of 3D strain fields 2014 Ultramicroscopy 136 18 UA library record; WoS full record; WoS citing articles pdf doi
Luyten, W.; Krekels, T.; Amelinckx, S.; Van Tendeloo, G.; van Dyck, D.; van Landuyt, J. Electron diffraction effects of conical, helically wound, graphite whiskers 1993 Ultramicroscopy 49 14 UA library record; WoS full record; WoS citing articles doi
Madsen, J.; Pennycook, T.J.; Susi, T. ab initio description of bonding for transmission electron microscopy 2021 Ultramicroscopy 231 UA library record; WoS full record; WoS citing articles url doi
Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. Quantitative STEM normalisation : the importance of the electron flux 2015 Ultramicroscopy 159 27 UA library record; WoS full record; WoS citing articles pdf url doi
Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy 2014 Ultramicroscopy 137 74 UA library record; WoS full record; WoS citing articles pdf doi
Martinez, G.T.; van den Bos, K.H.W.; Alania, M.; Nellist, P.D.; Van Aert, S. Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy 2018 Ultramicroscopy 187 4 UA library record; WoS full record; WoS citing articles pdf url doi
Milat, O.; Van Tendeloo, G.; Amelinckx, S. Selective imaging of the “substructures” in incommensurately modulated intergrowth crystal structures 1992 Ultramicroscopy 41 5 UA library record; WoS full record; WoS citing articles doi
Müller, K.; Schowalter, M.; Jansen, J.; Tsuda, K.; Titantah, J.; Lamoen, D.; Rosenauer, A. Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data 2009 Ultramicroscopy 109 8 UA library record; WoS full record; WoS citing articles pdf doi
Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy 2016 Ultramicroscopy 178 93 UA library record; WoS full record; WoS citing articles pdf url doi
Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose 2019 Ultramicroscopy 203 25 UA library record; WoS full record; WoS citing articles pdf url doi
Niermann, T.; Verbeeck, J.; Lehmann, M. Creating arrays of electron vortices 2014 Ultramicroscopy 136 9 UA library record; WoS full record; WoS citing articles pdf doi
Pennycook, T.J.; Martinez, G.T.; Nellist, P.D.; Meyer, J.C. High dose efficiency atomic resolution imaging via electron ptychography 2019 Ultramicroscopy 196 1 UA library record; WoS full record; WoS citing articles doi
Potapov, P.; Lichte, H.; Verbeeck, J.; van Dyck, D. Experiments on inelastic electron holography 2006 Ultramicroscopy 106 28 UA library record; WoS full record; WoS citing articles doi
Potapov, P.L.; Schryvers, D. Measuring the absolute position of EELS ionisation edges in a TEM 2004 Ultramicroscopy 99 29 UA library record; WoS full record; WoS citing articles doi
Potapov, P.L.; Verbeeck, J.; Schattschneider, P.; Lichte, H.; van Dyck, D. Inelastic electron holography as a variant of the Feynman thought experiment 2007 Ultramicroscopy 107 13 UA library record; WoS full record; WoS citing articles pdf doi
Prabhakara, V.; Jannis, D.; Guzzinati, G.; Béché, A.; Bender, H.; Verbeeck, J. HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale 2020 Ultramicroscopy 219 4 UA library record; WoS full record; WoS citing articles url doi
Radtke, G.; Botton, G.A.; Verbeeck, J. Electron inelastic, scattering and anisotropy: the two-dimensional point of view 2006 Ultramicroscopy 106 5 UA library record; WoS full record; WoS citing articles pdf doi
Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution 2022 Ultramicroscopy 233 UA library record; WoS full record; WoS citing articles url doi
Roelandts, T.; Batenburg, K.J.; Biermans, E.; Kübel, C.; Bals, S.; Sijbers, J. Accurate segmentation of dense nanoparticles by partially discrete electron tomography 2012 Ultramicroscopy 114 34 UA library record; WoS full record; WoS citing articles pdf doi
Rosenauer, A.; Schowalter, M.; Titantah, J.T.; Lamoen, D. An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy 2008 Ultramicroscopy 108 25 UA library record; WoS full record; WoS citing articles doi
Select All    Deselect All
List View
 |   | 
   print

Save Citations:
Export Records: