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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. |
Fast electron low dose tomography for beam sensitive materials |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
|
|
|
Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. |
Novel thin film lift-off process for in situ TEM tensile characterization |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
|
|
|
Ning, S.; Xu, W.; Ma, Y.; Loh, L.; Pennycook, T.J.; Zhou, W.; Zhang, F.; Bosman, M.; Pennycook, S.J.; He, Q.; Loh, N.D. |
Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets |
2022 |
Microscopy and microanalysis |
|
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UA library record; WoS full record; WoS citing articles |
|
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Yu, C.-P.; Friedrich, T.; Jannis, D.; Van Aert, S.; Verbeeck, J. |
Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM |
2022 |
Microscopy and microanalysis |
|
7 |
UA library record; WoS full record; WoS citing articles |
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De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. |
Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM |
2022 |
Microscopy and microanalysis |
|
|
UA library record; WoS full record |
|
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Vega Ibañez, F.; Béché, A.; Verbeeck, J. |
Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? |
2022 |
Microscopy and microanalysis |
|
3 |
UA library record; WoS full record; WoS citing articles |
|
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Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. |
Evaluation of top, angle, and side cleaned FIB samples for TEM analysis |
2007 |
Microscopy research and technique |
70 |
36 |
UA library record; WoS full record; WoS citing articles |
|
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Bertoni, G.; Verbeeck, J.; Brosens, F. |
Fitting the momentum dependent loss function in EELS |
2011 |
Microscopy research and technique |
74 |
6 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Goessens, C.; Safran, G.; Toth, L. |
Internal calibration technique for HREM studies of nanoscale particles |
1993 |
Microscopy research and technique
T2 – JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM |
25 |
1 |
UA library record; WoS full record; WoS citing articles |
|
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Zelaya, E.; Schryvers, D. |
Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite |
2011 |
Microscopy research and technique |
74 |
2 |
UA library record; WoS full record; WoS citing articles |
|
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Van Tendeloo, G.; Krekels, T.; Amelinckx, S.; Babu, T.G.N.; Greaves, C.; Hervieu, M.; Michel, C.; Raveau, B. |
Structural investigations of recently discovered high Tc superconductors |
1995 |
Microscopy research and technique |
30 |
4 |
UA library record; WoS full record; WoS citing articles |
|
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De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. |
The study of partially ordered 11/20 alloys by HREM |
1993 |
Microscopy research and technique |
25 |
|
UA library record; WoS full record |
|
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Goessens, C.; Schryvers, D.; van Landuyt, J. |
Transmission electron microscopy studies of (111) twinned silver halide microcrystals |
1998 |
Microscopy research and technique |
42 |
8 |
UA library record; WoS full record; WoS citing articles |
|
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Pourbabak, S.; Orekhov, A.; Schryvers, D. |
Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires |
2020 |
Microscopy Research And Technique |
|
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UA library record; WoS full record; WoS citing articles |
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Lebedev, O.I.; Van Tendeloo, G.; Suvorova, A.A.; Usov, I.O.; Suvorov, A.V. |
HREM study of ion implantation in 6H-SiC at high temperatures |
1997 |
Journal of electron microscopy |
46 |
7 |
UA library record; WoS full record; WoS citing articles |
|
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Lemmens, H.; Richard, O.; Van Tendeloo, G.; Bismayer, U. |
Microstructure and phase transitions in Pb(Sc0.5Ta0.5)O3 |
1999 |
Journal of electron microscopy |
48 |
7 |
UA library record; WoS full record; WoS citing articles |
|
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Richard, O.; Van Tendeloo, G.; Lemée, N.; le Lannic, J.; Guilloux-Viry, M.; Perrin, A. |
Microstructure of CuXMo6S8 Chevrel phase thin films on R-plane sapphire |
2000 |
Journal of electron microscopy |
49 |
|
UA library record; WoS full record; WoS citing articles |
|
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Morimura, T.; Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Hasaka, M.; Hisatsune, K. |
Microstructure of Mn-doped, spin-cast FeSi2 |
1997 |
Journal of electron microscopy |
46 |
3 |
UA library record; WoS full record; WoS citing articles |
|
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Chen, J.H.; Van Tendeloo, G. |
Microstructure of tough polycrystalline natural diamond |
1999 |
Journal of electron microscopy |
48 |
9 |
UA library record; WoS full record; WoS citing articles |
|
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Sanchez-Munoz, L.; Nistor, L.; Van Tendeloo, G.; Sanz, J. |
Modulated structures in KAISi3O8: a study by high resolution electron microscopy and 29Si MAS-NMR spectroscopy |
1998 |
Journal of electron microscopy |
47 |
10 |
UA library record; WoS full record; WoS citing articles |
|
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Hervieu, M.; Van Tendeloo, G.; Schuddinck, W.; Richard, O.; Caignaert, V.; Millange, F.; Raveau, B. |
Structural phase transition in the manganite Nd0.5Ca0.2Sr0.3MnO3-\delta |
1997 |
Journal of electron microscopy |
46 |
2 |
UA library record; WoS full record; WoS citing articles |
|
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Van Tendeloo, G.; Lebedev, O.I.; Shpanchenko, R.V.; Antipov, E.V. |
Structure determination of YBCO fluorinated phases by HREM |
1997 |
Journal of electron microscopy |
1 |
|
UA library record |
|
|
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Bindi, L.; Rossell, M.D.; Van Tendeloo, G.; Spry, P.G.; Cipriani, C. |
Inferred phase relations in part of the system Au-Ag-Te: an integrated analytical study of gold ore from the Golden Mile, Kalgoorlie, Australia |
2005 |
Mineralogy and petrology |
83 |
15 |
UA library record; WoS full record; WoS citing articles |
|
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Bismayer, U.; Mathes, D.; Bosbach, D.; Putnis, A.; Van Tendeloo, G.; Novak, J.; Salje, E.K.H. |
Ferroelastic orientation states and domain walls in lead phosphate type crystals |
2000 |
Mineralogical magazine |
64 |
16 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bercx, M.; Slap, L.; Partoens, B.; Lamoen, D. |
First-Principles Investigation of the Stability of the Oxygen Framework of Li-Rich Battery Cathodes |
2019 |
MRS advances |
4 |
3 |
UA library record; WoS full record; WoS citing articles |
|
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Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S. |
Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp |
1994 |
MRS bulletin |
|
|
UA library record; WoS full record; |
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Evans, J.E.; Friedrich, H.; |
Advanced tomography techniques for inorganic, organic, and biological materials |
2016 |
MRS bulletin |
41 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
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Bals, S.; Goris, B.; de Backer, A.; Van Aert, S.; Van Tendeloo, G. |
Atomic resolution electron tomography |
2016 |
MRS bulletin |
41 |
19 |
UA library record; WoS full record; WoS citing articles |
|
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Sankaran, K.J.; Deshmukh, S.; Korneychuk, S.; Yeh, C.-J.; Thomas, J.P.; Drijkoningen, S.; Pobedinskas, P.; Van Bael, M.K.; Verbeeck, J.; Leou, K.-C.; Leung, K.-T.; Roy, S.S.; Lin, I.-N.; Haenen, K. |
Fabrication, microstructure, and enhanced thermionic electron emission properties of vertically aligned nitrogen-doped nanocrystalline diamond nanorods |
2018 |
MRS communications |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
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Vantomme, A.; Wu, M.F.; Hogg, S.; van Landuyt, J.; et al. |
Comparative study of structural properties and photoluminescence in InGaN layers with a high In content |
2000 |
Internet journal of nitride semiconductor research
T2 – Symposium on GaN and Related Alloys Held at the MRS Fall Meeting, NOV 29-DEC 03, 1999, BOSTON, MASSACHUSETTS |
5 |
|
UA library record; WoS full record; |
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