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  Author Title Year Publication (down) Volume Times cited Additional Links Links
De Backer, A.; Van Aert, S.; Faes, C.; Arslan Irmak, E.; Nellist, P.D.; Jones, L. Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm 2022 N P J Computational Materials 8 UA library record; WoS full record; WoS citing articles url doi
Muto, S.; Schryvers, D. Electron-irridation-induced martensitic transformation in a Ni63Al37 observed in-situ by HREM 1993 MRS Japan: shape memory materials 18 UA library record
Schryvers, D.; Tanner, L.E. On the phase-like nature of the 7M structure in Ni-Al 1993 MRS Japan: shape memory materials 18 1 UA library record; WoS full record; WoS citing articles
Sankaran, K.J.; Deshmukh, S.; Korneychuk, S.; Yeh, C.-J.; Thomas, J.P.; Drijkoningen, S.; Pobedinskas, P.; Van Bael, M.K.; Verbeeck, J.; Leou, K.-C.; Leung, K.-T.; Roy, S.S.; Lin, I.-N.; Haenen, K. Fabrication, microstructure, and enhanced thermionic electron emission properties of vertically aligned nitrogen-doped nanocrystalline diamond nanorods 2018 MRS communications 8 1 UA library record; WoS full record; WoS citing articles pdf doi
Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S. Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp 1994 MRS bulletin UA library record; WoS full record;
Evans, J.E.; Friedrich, H.; Advanced tomography techniques for inorganic, organic, and biological materials 2016 MRS bulletin 41 12 UA library record; WoS full record; WoS citing articles pdf doi
Bals, S.; Goris, B.; de Backer, A.; Van Aert, S.; Van Tendeloo, G. Atomic resolution electron tomography 2016 MRS bulletin 41 19 UA library record; WoS full record; WoS citing articles pdf url doi
Bercx, M.; Slap, L.; Partoens, B.; Lamoen, D. First-Principles Investigation of the Stability of the Oxygen Framework of Li-Rich Battery Cathodes 2019 MRS advances 4 3 UA library record; WoS full record; WoS citing articles pdf url doi
Muto, S.; Merk, N.; Schryvers, D.; Tanner, L.E. Displacive and diffusive components in the formation of the Ni2Al structure studied by HREM, SAED and micro-ED 1992 Monterey Institute for Advances Studies UA library record
Bindi, L.; Rossell, M.D.; Van Tendeloo, G.; Spry, P.G.; Cipriani, C. Inferred phase relations in part of the system Au-Ag-Te: an integrated analytical study of gold ore from the Golden Mile, Kalgoorlie, Australia 2005 Mineralogy and petrology 83 15 UA library record; WoS full record; WoS citing articles pdf doi
Bismayer, U.; Mathes, D.; Bosbach, D.; Putnis, A.; Van Tendeloo, G.; Novak, J.; Salje, E.K.H. Ferroelastic orientation states and domain walls in lead phosphate type crystals 2000 Mineralogical magazine 64 16 UA library record; WoS full record; WoS citing articles pdf doi
Giorgio, S.; Henry, C.R.; Pauwels, B.; Van Tendeloo, G. Au particles supported on (110) anatase-TiO2 2001 Microstructure And Processing 297 40 UA library record; WoS full record; WoS citing articles pdf doi
Weng, Y.; Jia, Z.; Ding, L.; Muraishi, S.; Liu, Q. Clustering behavior during natural aging and artificial aging in Al-Mg-Si alloys with different Ag and Cu addition 2018 Microstructure And Processing 732 11 UA library record; WoS full record; WoS citing articles pdf url doi
Zhao, L.; Macias, J.G.S.; Ding, L.; Idrissi, H.; Simar, A. Damage mechanisms in selective laser melted AlSi10Mg under as built and different post-treatment conditions 2019 Microstructure And Processing 764 1 UA library record; WoS full record; WoS citing articles pdf doi
van Dyck, D.; Van Aert, S.; Croitoru, M.D. Obstacles on the road towards atomic resolution tomography 2005 Microscoy and microanalysis 11 UA library record
Van Tendeloo, G. TEM of phase transitions in tridymite and cristobalite based materials 2000 Microscoy and microanalysis 6 UA library record
Verbist, K.; Van Tendeloo, G.; Ye, M.; Schroeder, J.; Mehbod, M.; Deltour, R. Inclusions in magnetron sputtered YBa2Cu3-x MxO7-d thin films: a study by means of electron microscopy 1996 Microscopy, microanalysis, microstructures 7 6 UA library record; WoS full record; WoS citing articles doi
Hervieu; Van Tendeloo, G.; Michel; Pelloquin; Raveau Mixed layers in copper based superconducting materials 1996 Microscopy, microanalysis, microstructures 7 2 UA library record; WoS full record; WoS citing articles doi
Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. Evaluation of top, angle, and side cleaned FIB samples for TEM analysis 2007 Microscopy research and technique 70 36 UA library record; WoS full record; WoS citing articles pdf doi
Bertoni, G.; Verbeeck, J.; Brosens, F. Fitting the momentum dependent loss function in EELS 2011 Microscopy research and technique 74 6 UA library record; WoS full record; WoS citing articles pdf doi
Zelaya, E.; Schryvers, D. Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite 2011 Microscopy research and technique 74 2 UA library record; WoS full record; WoS citing articles pdf doi
Van Tendeloo, G.; Krekels, T.; Amelinckx, S.; Babu, T.G.N.; Greaves, C.; Hervieu, M.; Michel, C.; Raveau, B. Structural investigations of recently discovered high Tc superconductors 1995 Microscopy research and technique 30 4 UA library record; WoS full record; WoS citing articles pdf doi
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. The study of partially ordered 11/20 alloys by HREM 1993 Microscopy research and technique 25 UA library record; WoS full record pdf doi
Goessens, C.; Schryvers, D.; van Landuyt, J. Transmission electron microscopy studies of (111) twinned silver halide microcrystals 1998 Microscopy research and technique 42 8 UA library record; WoS full record; WoS citing articles doi
Pourbabak, S.; Orekhov, A.; Schryvers, D. Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires 2020 Microscopy Research And Technique UA library record; WoS full record; WoS citing articles pdf url doi
Schryvers, D.; Goessens, C.; Safran, G.; Toth, L. Internal calibration technique for HREM studies of nanoscale particles 1993 Microscopy research and technique T2 – JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM 25 1 UA library record; WoS full record; WoS citing articles pdf doi
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. Measurement of the mean inner potential of ZnO nanorods by transmission electron holography 2005 Microscopy of Semiconducting Materials 107 UA library record; WoS full record; pdf
Leroux, F.; Bladt, E.; Timmermans, J.-P.; Van Tendeloo, G.; Bals, S. Annular dark-field transmission electron microscopy for low contrast materials 2013 Microscopy and microanalysis 19 5 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy 2009 Microscopy and microanalysis 15 1 UA library record; WoS full record; WoS citing articles url doi
Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. Computational aspects in quantitative EELS 2010 Microscopy and microanalysis 16 UA library record url doi
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