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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Li, K.; Béché, A.; Song, M.; Sha, G.; Lu, X.; Zhang, K.; Du, Y.; Ringer, S.P.; Schryvers, D. |
Atomistic structure of Cu-containing \beta" precipitates in an Al-Mg-Si-Cu alloy |
2014 |
Scripta materialia |
75 |
22 |
UA library record; WoS full record; WoS citing articles |
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van Huis, M.A.; Figuerola, A.; Fang, C.; Béché, A.; Zandbergen, H.W.; Manna, L. |
Letter Chemical transformation of Au-tipped CdS nanorods into AuS/Cd core/shell particles by electron beam irradiation |
2011 |
Nano letters |
11 |
25 |
UA library record; WoS full record; WoS citing articles |
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Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. |
Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography |
2013 |
Ultramicroscopy |
131 |
73 |
UA library record; WoS full record; WoS citing articles |
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Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L. |
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope |
2016 |
Micron |
80 |
50 |
UA library record; WoS full record; WoS citing articles |
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Béché, A.; Rouvière, J.L.; Barnes, J.P.; Cooper, D. |
Dark field electron holography for strain measurement |
2011 |
Ultramicroscopy |
111 |
31 |
UA library record; WoS full record; WoS citing articles |
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Jalabert, D.; Pelloux-Gervais, D.; Béché, A.; Hartmann, J.M.; Gergaud, P.; Rouvière, J.L.; Canut, B. |
Depth strain profile with sub-nm resolution in a thin silicon film using medium energy ion scattering |
2012 |
Physica Status Solidi A-Applications And Materials Science |
209 |
3 |
UA library record; WoS full record; WoS citing articles |
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Cooper, D.; de la Peña, F.; Béché, A.; Rouvière, J.-L.; Servanton, G.; Pantel, R.; Morin, P. |
Field mapping with nanometer-scale resolution for the next generation of electronic devices |
2011 |
Nano letters |
11 |
12 |
UA library record; WoS full record; WoS citing articles |
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Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. |
Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record |
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Jones, E.; Cooper, D.; Rouvière, J.-L.; Béché, A.; Azize, M.; Palacios, T.; Gradecak, S. |
Towards rapid nanoscale measurement of strain in III-nitride heterostructures |
2013 |
Applied Physics Letters |
103 |
6 |
UA library record; WoS full record; WoS citing articles |
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de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits? |
2015 |
Journal of physics : conference series |
644 |
|
UA library record |
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Cooper, D.; Rouvière, J.-L.; Béché, A.; Kadkhodazadeh, S.; Semenova, E.S.; Dunin-Borkowsk, R. |
Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography |
2011 |
Applied physics letters |
99 |
26 |
UA library record; WoS full record; WoS citing articles |
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Denneulin, T.; Rouvière, J.L.; Béché, A.; Py, M.; Barnes, J.P.; Rochat, N.; Hartmann, J.M.; Cooper, D. |
The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography |
2011 |
Semiconductor science and technology |
26 |
|
UA library record; WoS full record; WoS citing articles |
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Cooper, D.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy |
2012 |
Applied Physics Letters |
100 |
|
UA library record; WoS full record; WoS citing articles |
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Cooper, D.; Denneulin, T.; Barnes, J.-P.; Hartmann, J.-M.; Hutin, L.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy |
2012 |
Applied Physics Letters |
112 |
14 |
UA library record; WoS full record; WoS citing articles |
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Rouvière, J.-L.; Béché, A.; Martin, Y.; Denneulin, T.; Cooper, D. |
Improved strain precision with high spatial resolution using nanobeam precession electron diffraction |
2013 |
Applied physics letters |
103 |
53 |
UA library record; WoS full record; WoS citing articles |
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Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. |
Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer |
2019 |
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UA library record |
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Guzzinati, G.; Béché, A.; McGrouther, D.; Verbeeck, J. |
Rotation of electron beams in the presence of localised, longitudinal magnetic fields |
2019 |
|
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UA library record |
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Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. |
Spectrocopic coincidence experiment in transmission electron microscopy |
2019 |
|
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UA library record |
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Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. |
Fast electron low dose tomography for beam sensitive materials |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
|
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Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. |
Quantitative STEM normalisation : the importance of the electron flux |
2015 |
Ultramicroscopy |
159 |
27 |
UA library record; WoS full record; WoS citing articles |
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Mueller, K.; Krause, F.F.; Béché, A.; Schowalter, M.; Galioit, V.; Loeffler, S.; Verbeeck, J.; Zweck, J.; Schattschneider, P.; Rosenauer, A. |
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction |
2014 |
Nature communications |
5 |
197 |
UA library record; WoS full record; WoS citing articles |
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Guzzinati, G.; Clark, L.; Béché, A.; Juchtmans, R.; Van Boxem, R.; Mazilu, M.; Verbeeck, J. |
Prospects for versatile phase manipulation in the TEM : beyond aberration correction |
2015 |
Ultramicroscopy |
151 |
19 |
UA library record; WoS full record; WoS citing articles |
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de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. |
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting |
2015 |
Ultramicroscopy |
151 |
29 |
UA library record; WoS full record; WoS citing articles |
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Egoavil, R.; Huehn, S.; Jungbauer, M.; Gauquelin, N.; Béché, A.; Van Tendeloo, G.; Verbeeck; Moshnyaga, V. |
Phase problem in the B-site ordering of La2CoMnO6 : impact on structure and magnetism |
2015 |
Nanoscale |
7 |
37 |
UA library record; WoS full record; WoS citing articles |
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Clark, L.; Béché, A.; Guzzinati, G.; Verbeeck, J. |
Quantitative measurement of orbital angular momentum in electron microscopy |
2014 |
Physical review : A : atomic, molecular and optical physics |
89 |
23 |
UA library record; WoS full record; WoS citing articles |
|
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Becker, M.; Guzzinati, G.; Béché, A.; Verbeeck, J.; Batelaan, H. |
Asymmetry and non-dispersivity in the Aharonov-Bohm effect |
2019 |
Nature communications |
10 |
12 |
UA library record; WoS full record; WoS citing articles |
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Bhat, S.G.; Gauquelin, N.; Sebastian, N.K.; Sil, A.; Béché, A.; Verbeeck, J.; Samal, D.; Kumar, P.S.A. |
Orthorhombic vs. hexagonal epitaxial SrIrO3 thin films : structural stability and related electrical transport properties |
2018 |
Europhysics letters |
122 |
4 |
UA library record; WoS full record; WoS citing articles |
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Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. |
Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose |
2019 |
Ultramicroscopy |
203 |
25 |
UA library record; WoS full record; WoS citing articles |
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Van den Broek, W.; Reed, B.W.; Béché, A.; Velazco, A.; Verbeeck, J.; Koch, C.T. |
Various compressed sensing setups evaluated against Shannon sampling under constraint of constant illumination |
2019 |
IEEE transactions on computational imaging |
5 |
7 |
UA library record; WoS full record; WoS citing articles |
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Guzzinati, G.; Béché, A.; Lourenço-Martins, H.; Martin, J.; Kociak, M.; Verbeeck, J. |
Probing the symmetry of the potential of localized surface plasmon resonances with phase-shaped electron beams |
2017 |
Nature communications |
8 |
84 |
UA library record; WoS full record; WoS citing articles |
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