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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Zankowski, S.P.; Van Hoecke, L.; Mattelaer, F.; de Raedt, M.; Richard, O.; Detavernier, C.; Vereecken, P.M. |
Redox layer deposition of thin films of MnO2 on nanostructured substrates from aqueous solutions |
2019 |
Chemistry of materials |
31 |
|
UA library record; WoS full record; WoS citing articles |
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Loo, R.; Arimura, H.; Cott, D.; Witters, L.; Pourtois, G.; Schulze, A.; Douhard, B.; Vanherle, W.; Eneman, G.; Richard, O.; Favia, P.; Mitard, J.; Mocuta, D.; Langer, R.; Collaert, N. |
Epitaxial CVD Growth of Ultra-Thin Si Passivation Layers on Strained Ge Fin Structures |
2018 |
ECS journal of solid state science and technology |
7 |
5 |
UA library record; WoS full record; WoS citing articles |
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Loo, R.; Arimura, H.; Cott, D.; Witters, L.; Pourtois, G.; Schulze, A.; Douhard, B.; Vanherle, W.; Eneman, G.; Richard, O.; Favia, P.; Mitard, J.; Mocuta, D.; Langer, R.; Collaert, N. |
Epitaxial CVD growth of ultra-thin Si passivation layers on strained Ge fin structures |
2017 |
Semiconductor Process Integration 10 |
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UA library record; WoS full record |
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Mehta, A.N.; Zhang, H.; Dabral, A.; Richard, O.; Favia, P.; Bender, H.; Delabie, A.; Caymax, M.; Houssa, M.; Pourtois, G.; Vandervorst, W. |
Structural characterization of SnS crystals formed by chemical vapour deposition |
2017 |
Journal of microscopy
T2 – 20th International Conference on Microscopy of Semiconducting Materials, (MSM), APR 09-13, 2017, Univ Oxford, Univ Oxford, Oxford, ENGLAND |
268 |
2 |
UA library record; WoS full record; WoS citing articles |
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Verleysen, E.; Bender, H.; Richard, O.; Schryvers, D.; Vandervorst, W. |
Compositional characterization of nickel silicides by HAADF-STEM imaging |
2011 |
Journal of materials science |
46 |
1 |
UA library record; WoS full record; WoS citing articles |
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Verleysen, E.; Bender, H.; Richard, O.; Schryvers, D.; Vandervorst, W. |
Characterization of nickel silicides using EELS-based methods |
2010 |
Journal of microscopy |
240 |
11 |
UA library record; WoS full record; WoS citing articles |
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Ghica, C.; Nistor, L.C.; Bender, H.; Richard, O.; Van Tendeloo, G.; Ulyashin, A. |
TEM characterization of extended defects induced in Si wafers by H-plasma treatment |
2007 |
Journal of physics: D: applied physics |
40 |
10 |
UA library record; WoS full record; WoS citing articles |
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Ghica, C.; Nistor, L.C.; Bender, H.; Richard, O.; Van Tendeloo, G.; Ulyashin, A.; |
Characterization of {111} planar defects induced in silicon by hydrogen plasma treatments |
2006 |
Philosophical magazine |
86 |
12 |
UA library record; WoS full record; WoS citing articles |
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Nistor, L.C.; Richard, O.; Zhao, C.; Bender, H.; Van Tendeloo, G. |
Thermal stability of atomic layer deposited Zr:Al mixed oxide thin films: an in situ transmission electron microscopy study |
2005 |
Journal of materials research |
20 |
|
UA library record; WoS full record |
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Nistor, L.C.; Richard, O.; Zhao, O.; Bender, H.; Stesmans, A.; Van Tendeloo, G. |
A microstructural study of the thermal stability of atomic layer deposited Al2O3 thin films |
2003 |
Institute of physics conference series
T2 – Microscopy of semiconducting materials |
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UA library record; WoS full record; |
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Ranjan, R.; Pandey, D.; Schuddinck, W.; Richard, O.; De Meulenaere, P.; van Landuyt, J.; Van Tendeloo, G. |
Evolution of crystallographic phases in (Sr1-xCax)TiO3 with composition (x) |
2001 |
Journal of solid state chemistry |
162 |
45 |
UA library record; WoS full record; WoS citing articles |
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Richard, O.; Van Tendeloo, G.; Lemée, N.; le Lannic, J.; Guilloux-Viry, M.; Perrin, A. |
Microstructure of CuXMo6S8 Chevrel phase thin films on R-plane sapphire |
2000 |
Journal of electron microscopy |
49 |
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UA library record; WoS full record; WoS citing articles |
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Ferroni, M.; Carotta, M.C.; Guidi, V.; Martinelli, G.; Ronconi, F.; Richard, O.; van Dyck, D.; van Landuyt, J. |
Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application |
2000 |
Sensors and actuators : B : chemical |
68 |
51 |
UA library record; WoS full record; WoS citing articles |
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Lemmens, H.; Richard, O.; Van Tendeloo, G.; Bismayer, U. |
Microstructure and phase transitions in Pb(Sc0.5Ta0.5)O3 |
1999 |
Journal of electron microscopy |
48 |
7 |
UA library record; WoS full record; WoS citing articles |
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Seo, J.W.; Schryvers, D.; Vermeulen, W.; Richard, O.; Potapov, P. |
Electron microscopy investigation of ternary \gamma-brass-type precipitation in a Ni39.6Mn47.5Ti12.9 alloy |
1999 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
79 |
3 |
UA library record; WoS full record; WoS citing articles |
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Leroux, C.; Badeche, T.; Nihoul, G.; Richard, O.; Van Tendeloo, G. |
A homologous series Pb2n+1Nb2n-1O7n-1 studied by electron microscopy |
1999 |
European physical journal: applied physics |
7 |
4 |
UA library record; WoS full record; WoS citing articles |
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Richard, O.; Schuddinck, W.; Van Tendeloo, G.; Millange, F.; Hervieu, M.; Caignaert, C.; Raveau, B. |
Room temperature and low-temperature structure of Nd1-xCaxMnO3 (0.3*x*0.5) |
1999 |
Acta crystallographica: section A: foundations of crystallography |
55 |
24 |
UA library record; WoS full record; WoS citing articles |
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Fröba, M.; Köhn, R.; Bouffaud, G.; Richard, O.; Van Tendeloo, G. |
_Fe2O3 nanoparticles with mesoporous MCM-48 silica: in situ formation and characterisation |
1999 |
Chemistry of materials |
11 |
202 |
UA library record; WoS full record; WoS citing articles |
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Rembeza, E.S.; Richard, O.; van Landuyt, J. |
Influence of laser and isothermal treatments on microstructural properties of SnO2 films |
1999 |
Materials research bulletin |
34 |
17 |
UA library record; WoS full record; WoS citing articles |
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Seo, J.W.; Schryvers, D.; Vermeulen, W.; Richard, O.; Potapov, P. |
EM investigation of precursors and precipitation in a Ni39.6Mn47.5Ti12.9 alloy |
1999 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
79 |
3 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Seo, J.W.; Richard, O.; Vermeulen, W.; Potapov, P. |
Decomposition phenomena in Ni-Mn-Ti austenite |
1999 |
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UA library record; WoS full record; |
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Francesconi, M.G.; Kirbyshire, A.L.; Greaves, C.; Richard, O.; Van Tendeloo, G. |
Synthesis and structure of Bi14O20(SO4), a new bismuth oxide sulfate |
1998 |
Chem. mater. |
10 |
30 |
UA library record; WoS full record; WoS citing articles |
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Van Tendeloo, G.; Richard, O.; Schuddinck, W.; Hervieu, M. |
Fine structure of CMR perovskites by HREM and CBEM |
1998 |
Electron microscopy: vol. 1 |
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UA library record; WoS full record; |
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Hervieu, M.; Van Tendeloo, G.; Schuddinck, W.; Richard, O.; Caignaert, V.; Millange, F.; Raveau, B. |
Structural phase transition in the manganite Nd0.5Ca0.2Sr0.3MnO3-\delta |
1997 |
Journal of electron microscopy |
46 |
2 |
UA library record; WoS full record; WoS citing articles |
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