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	Author	Nistor, L.C.; Richard, O.; Zhao, C.; Bender, H.; Van Tendeloo, G.
	Title	Thermal stability of atomic layer deposited Zr:Al mixed oxide thin films: an in situ transmission electron microscopy study			Type	A1 Journal article
	Year	2005	Publication	Journal of materials research	Abbreviated Journal	J Mater Res
	Volume	20	Issue	7	Pages	1741-1750
	Keywords	A1 Journal article; Electron microscopy for materials research (EMAT)
	Abstract
	Address
	Corporate Author				Thesis
	Publisher		Place of Publication	New York, N.Y.	Editor
	Language		Wos	000230296100012	Publication Date	2005-07-12
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	0884-2914;2044-5326;	ISBN		Additional Links	UA library record; WoS full record
	Impact Factor	1.673	Times cited		Open Access
	Notes	Bil 01/73; IAP V-1			Approved	Most recent IF: 1.673; 2005 IF: 2.104
	Call Number	UA @ lucian @ c:irua:54884			Serial	3631
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