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Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Skorikov, A.; Albrecht, W.; Bladt, E.; Xie, X.; van der Hoeven, J.E.S.; van Blaaderen, A.; Van Aert, S.; Bals, S. |
Quantitative 3D Characterization of Elemental Diffusion Dynamics in Individual Ag@Au Nanoparticles with Different Shapes |
2019 |
ACS nano |
13 |
29 |
UA library record; WoS full record; WoS citing articles |
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Kavak, S.; Kadu, A.A.; Claes, N.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Batenburg, K.J.; Bals, S. |
Quantitative 3D Investigation of Nanoparticle Assemblies by Volumetric Segmentation of Electron Tomography Data Sets |
2023 |
The journal of physical chemistry: C : nanomaterials and interfaces |
127 |
2 |
UA library record; WoS full record; WoS citing articles |
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Wang, D.; van der Wee, E.B.; Zanaga, D.; Altantzis, T.; Wu, Y.; Dasgupta, T.; Dijkstra, M.; Murray, C.B.; Bals, S.; van Blaaderen, A. |
Quantitative 3D real-space analysis of Laves phase supraparticles |
2021 |
Nature Communications |
12 |
10 |
UA library record; WoS full record; WoS citing articles |
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Lemberge, P.; Deraedt, I.; Janssens, K.; van Espen, P. |
Quantitative analysis of 16-17th century archaeological glass vessels using PLS regression of EPXMA and μ-XRF data |
2000 |
Journal of chemometrics |
14 |
|
UA library record; WoS full record; WoS citing articles |
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Poppe, R.; Vandemeulebroucke, D.; Neder, R.B.; Hadermann, J. |
Quantitative analysis of diffuse electron scattering in the lithium-ion battery cathode material Li1.2Ni0.13Mn0.54Co0.13O2 |
2022 |
IUCrJ |
9 |
|
UA library record; WoS full record; WoS citing articles |
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de Gendt, S.; Schelles, W.; Van Grieken, R.; Müller, V. |
Quantitative analysis of iron-rich and other oxide-based samples by means of glow discharge mass spectrometry |
1995 |
Journal of analytical atomic spectrometry |
10 |
|
UA library record; WoS full record; WoS citing articles |
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Schelles, W.; Van Grieken, R. |
Quantitative analysis of zirconium oxide by direct glow discharge mass spectrometry using a secondary cathode |
1997 |
Journal of analytical atomic spectrometry |
12 |
|
UA library record |
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de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits? |
2015 |
Journal of physics : conference series |
644 |
|
UA library record |
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Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. |
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy |
2009 |
Ultramicroscopy |
109 |
166 |
UA library record; WoS full record; WoS citing articles |
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Szalóki, I.; Braun, M.; Van Grieken, R. |
Quantitative characterisation of the leaching of lead and other elements from glazed surfaces of historical ceramics |
2000 |
Journal of analytical atomic spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
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Szalóki, I.; Osán, J.; Ro, C.-U.; Van Grieken, R. |
Quantitative characterization of individual aerosol particles by thin-window electron probe microanalysis combined with iterative simulation |
2000 |
Spectrochimica acta: part B : atomic spectroscopy |
55 |
|
UA library record; WoS full record; WoS citing articles |
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van Put, A.; Vertes, A.; Wegrzynek, D.; Treiger, B.; Van Grieken, R. |
Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images |
1994 |
Fresenius' journal of analytical chemistry |
350 |
|
UA library record; WoS full record; WoS citing articles |
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Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. |
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy |
2014 |
Ultramicroscopy |
137 |
74 |
UA library record; WoS full record; WoS citing articles |
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De Kerf, T.; Gestels, A.; Janssens, K.; Scheunders, P.; Steenackers, G.; Vanlanduit, S. |
Quantitative detection of corrosion minerals in carbon steel using shortwave infrared hyperspectral imaging |
2022 |
RSC advances |
12 |
|
UA library record; WoS full record |
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van Cleempoel, A.; Gijbels, R.; Zhu, D.; Claeys, M.; Richter, H.; Fonseca, A. |
Quantitative determination of C60 and C70 in soot extracts by high performance liquid chromatography and mass spectrometric characterization |
1996 |
Fullerene science and technology |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
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Choël, M.; Deboudt, K.; Osán, J.; Flament, P.; Van Grieken, R. |
Quantitative determination of low-Z elements in single atmospheric particles on boron substrates by automated scanning electron microscopy: energy-dispersive X-ray spectrometry |
2005 |
Analytical chemistry |
77 |
|
UA library record; WoS full record; WoS citing articles |
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Mahr, C.; Kundu, P.; Lackmann, A.; Zanaga, D.; Thiel, K.; Schowalter, M.; Schwan, M.; Bals, S.; Wittstock, A.; Rosenauer, A. |
Quantitative determination of residual silver distribution in nanoporous gold and its influence on structure and catalytic performance |
2017 |
Journal of catalysis |
352 |
42 |
UA library record; WoS full record; WoS citing articles |
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Tirry, W.; Schryvers, D. |
Quantitative determination of strain fields around Ni4Ti3 precipitates in NiTi |
2005 |
Acta materialia |
53 |
97 |
UA library record; WoS full record; WoS citing articles |
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Tirry, W.; Schryvers, D.; Jorissen, K.; Lamoen, D. |
Quantitative determination of the crystal structure of Ni4Ti3 precipitates |
2006 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
438 |
7 |
UA library record; WoS full record; WoS citing articles |
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Bals, S.; Verbeeck, J.; Van Tendeloo, G.; Liu, Y.-L.; Grivel, J.-C. |
Quantitative electron microscopy of (Bi,Pb)2Sr2Ca2Cu3O10+\delta/Ag multifilament tapes during initial stages of annealing |
2005 |
Journal of the American Ceramic Society |
88 |
1 |
UA library record; WoS full record; WoS citing articles |
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Heidari, H.; van den Broek, W.; Bals, S. |
Quantitative electron tomography : the effect of the three-dimensional point spread function |
2013 |
Ultramicroscopy |
135 |
6 |
UA library record; WoS full record; WoS citing articles |
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Cao, S.; Zeng, C.Y.; Li, Y.Y.; Yao, X.; Ma, X.; Samaee, V.; Schryvers, D.; Zhang, X.P. |
Quantitative FIB/SEM three-dimensional characterization of a unique Ni₄Ti₃ network in a porous Ni50.8Ti49.2 alloy undergoing a two-step martensitic transformation |
2020 |
Materials Characterization |
169 |
|
UA library record; WoS full record; WoS citing articles |
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Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. |
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation |
2018 |
Ultramicroscopy |
184 |
7 |
UA library record; WoS full record; WoS citing articles |
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Samaeeaghmiyoni, V.; Idrissi, H.; Groten, J.; Schwaiger, R.; Schryvers, D. |
Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach |
2017 |
Micron |
94 |
11 |
UA library record; WoS full record; WoS citing articles |
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Salje, E.K.H.; Zhang, H.; Schryvers, D.; Bartova, B. |
Quantitative Landau potentials for the martensitic transformation in Ni-Al |
2007 |
Applied physics letters |
90 |
9 |
UA library record; WoS full record; WoS citing articles |
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Li, K.; Idrissi, H.; Sha, G.; Song, M.; Lu, J.; Shi, H.; Wang, W.; Ringer, S.P.; Du, Y.; Schryvers, D. |
Quantitative measurement for the microstructural parameters of nano-precipitates in Al-Mg-Si-Cu alloys |
2016 |
Materials characterization |
118 |
9 |
UA library record; WoS full record; WoS citing articles |
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Clark, L.; Béché, A.; Guzzinati, G.; Verbeeck, J. |
Quantitative measurement of orbital angular momentum in electron microscopy |
2014 |
Physical review : A : atomic, molecular and optical physics |
89 |
23 |
UA library record; WoS full record; WoS citing articles |
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Bercx, M.; Partoens, B.; Lamoen, D. |
Quantitative modeling of secondary electron emission from slow-ion bombardment on semiconductors |
2019 |
Physical review B |
99 |
5 |
UA library record; WoS full record; WoS citing articles |
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Payne, L.M.; Masia, F.; Zilli, A.; Albrecht, W.; Borri, P.; Langbein, W. |
Quantitative morphometric analysis of single gold nanoparticles by optical extinction microscopy: Material permittivity and surface damping effects |
2021 |
Journal Of Chemical Physics |
154 |
|
UA library record; WoS full record; WoS citing articles |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals |
1999 |
Journal of the American Society for Mass Spectrometry |
10 |
4 |
UA library record; WoS full record; WoS citing articles |
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