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	Author	Verlinden, G.; Gijbels, R.; Geuens, I.
	Title	Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals			Type	A1 Journal article
	Year	1999	Publication	Journal of the American Society for Mass Spectrometry	Abbreviated Journal	J Am Soc Mass Spectr
	Volume	10	Issue		Pages	1016-1027
	Keywords	A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
	Abstract
	Address
	Corporate Author				Thesis
	Publisher		Place of Publication	New York, N.Y.	Editor
	Language		Wos	000082614500013	Publication Date	2002-07-25
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	1044-0305;1879-1123;	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor	2.786	Times cited	4	Open Access
	Notes				Approved	Most recent IF: 2.786; 1999 IF: 3.460
	Call Number	UA @ lucian @ c:irua:24930			Serial	2760
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