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Record |
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Author |
Verlinden, G.; Gijbels, R.; Geuens, I. |
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Title |
Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals |
Type |
A1 Journal article |
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Year  |
1999 |
Publication |
Journal of the American Society for Mass Spectrometry |
Abbreviated Journal |
J Am Soc Mass Spectr |
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Volume |
10 |
Issue |
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Pages |
1016-1027 |
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Keywords |
A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
New York, N.Y. |
Editor |
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Language |
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Wos |
000082614500013 |
Publication Date |
2002-07-25 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1044-0305;1879-1123; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
2.786 |
Times cited |
4 |
Open Access |
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Notes |
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Approved |
Most recent IF: 2.786; 1999 IF: 3.460 |
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Call Number |
UA @ lucian @ c:irua:24930 |
Serial |
2760 |
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| Permanent link to this record |
