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	Author	van Put, A.; Vertes, A.; Wegrzynek, D.; Treiger, B.; Van Grieken, R.
	Title	Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images			Type	A1 Journal article
	Year	1994	Publication	Fresenius' journal of analytical chemistry	Abbreviated Journal
	Volume	350	Issue		Pages	440-447
	Keywords	A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
	Abstract
	Address
	Corporate Author				Thesis
	Publisher		Place of Publication		Editor
	Language		Wos	A1994PR64400005	Publication Date	2004-10-19
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	0937-0633; 1432-1130	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor		Times cited		Open Access
	Notes				Approved	no
	Call Number	UA @ admin @ c:irua:9505			Serial	8442
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