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Author van Put, A.; Vertes, A.; Wegrzynek, D.; Treiger, B.; Van Grieken, R. doi  openurl
  Title Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images Type A1 Journal article
  Year (down) 1994 Publication Fresenius' journal of analytical chemistry Abbreviated Journal  
  Volume 350 Issue Pages 440-447  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos A1994PR64400005 Publication Date 2004-10-19  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0937-0633; 1432-1130 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:9505 Serial 8442  
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