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Real space maps of atomic transitions”. Schattschneider P, Verbeeck J, Hamon AL, Ultramicroscopy 109, 781 (2009). http://doi.org/10.1016/j.ultramic.2009.01.016
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Real space maps of magnetic moments on the atomic scale: theory and feasibility”. Schattschneider P, Ennen I, Stoger-Pollach M, Verbeeck J, Mauchamp V, Jaouen M, Ultramicroscopy 110, 1038 (2010). http://doi.org/10.1016/j.ultramic.2009.11.020
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Statistical consequences of applying a PCA noise filter on EELS spectrum images”. Lichtert S, Verbeeck J, Ultramicroscopy 125, 35 (2013). http://doi.org/10.1016/j.ultramic.2012.10.001
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Sub-nanometer free electrons with topological charge”. Schattschneider P, Stöger-Pollach M, Löffler S, Steiger-Thirsfeld A, Hell J, Verbeeck J, Ultramicroscopy 115, 21 (2012). http://doi.org/10.1016/j.ultramic.2012.01.010
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Theory of free electron vortices”. Schattschneider P, Verbeeck J, Ultramicroscopy 111, 1461 (2011). http://doi.org/10.1016/j.ultramic.2011.07.004
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Tomographic spectroscopic imaging, an experimental proof of concept”. van den Broek W, Verbeeck J, Schryvers D, de Backer S, Scheunders P, Ultramicroscopy 109, 296 (2009). http://doi.org/10.1016/j.ultramic.2008.11.022
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Progress and new advances in simulating electron microscopy datasets using MULTEM”. Lobato I, Van Aert S, Verbeeck J, Ultramicroscopy 168, 17 (2016). http://doi.org/10.1016/j.ultramic.2016.06.003
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Efficient creation of electron vortex beams for high resolution STEM imaging”. Béché, A, Juchtmans R, Verbeeck J, Ultramicroscopy 178, 12 (2017). http://doi.org/10.1016/j.ultramic.2016.05.006
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Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy”. Muller-Caspary K, Krause FF, Grieb T, Loffler S, Schowalter M, Béché, A, Galioit V, Marquardt D, Zweck J, Schattschneider P, Verbeeck J, Rosenauer A, Ultramicroscopy 178, 62 (2016). http://doi.org/10.1016/j.ultramic.2016.05.004
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Locating light and heavy atomic column positions with picometer precision using ISTEM”. van den Bos KHW, Krause FF, Béché, A, Verbeeck J, Rosenauer A, Van Aert S, Ultramicroscopy 172, 75 (2016). http://doi.org/10.1016/j.ultramic.2016.10.003
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Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques”. Gauquelin N, van den Bos KHW, Béché, A, Krause FF, Lobato I, Lazar S, Rosenauer A, Van Aert S, Verbeeck J, Ultramicroscopy 181, 178 (2017). http://doi.org/10.1016/j.ultramic.2017.06.002
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Bandgap measurement of high refractive index materials by off-axis EELS”. Vatanparast M, Egoavil R, Reenaas TW, Verbeeck J, Holmestad R, Vullum PE, Ultramicroscopy 182, 92 (2017). http://doi.org/10.1016/J.ULTRAMIC.2017.06.019
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Demonstration of a 2 × 2 programmable phase plate for electrons”. Verbeeck J, Béché, A, Müller-Caspary K, Guzzinati G, Luong MA, Den Hertog M, Ultramicroscopy 190, 58 (2018). http://doi.org/10.1016/j.ultramic.2018.03.017
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Exploring possibilities of band gap measurement with off-axis EELS in TEM”. Korneychuk S, Partoens B, Guzzinati G, Ramaneti R, Derluyn J, Haenen K, Verbeeck J, Ultramicroscopy 189, 76 (2018). http://doi.org/10.1016/J.ULTRAMIC.2018.03.021
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Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose”. Müller-Caspary K, Krause FF, Winkler F, Béché, A, Verbeeck J, Van Aert S, Rosenauer A, Ultramicroscopy 203, 95 (2019). http://doi.org/10.1016/J.ULTRAMIC.2018.12.018
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Evaluation of different rectangular scan strategies for STEM imaging”. Velazco A, Nord M, Béché, A, Verbeeck J, Ultramicroscopy , 113021 (2020). http://doi.org/10.1016/j.ultramic.2020.113021
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Atom column detection from simultaneously acquired ABF and ADF STEM images”. Fatermans J, den Dekker Aj, Müller-Caspary K, Gauquelin N, Verbeeck J, Van Aert S, Ultramicroscopy 219, 113046 (2020). http://doi.org/10.1016/j.ultramic.2020.113046
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HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale”. Prabhakara V, Jannis D, Guzzinati G, Béché, A, Bender H, Verbeeck J, Ultramicroscopy 219, 113099 (2020). http://doi.org/10.1016/j.ultramic.2020.113099
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Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges”. Vanrompay H, Skorikov A, Bladt E, Béché, A, Freitag B, Verbeeck J, Bals S, Ultramicroscopy 221, 113191 (2021). http://doi.org/10.1016/j.ultramic.2020.113191
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Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings”. Velazco A, Béché, A, Jannis D, Verbeeck J, Ultramicroscopy 232, 113398 (2022). http://doi.org/10.1016/j.ultramic.2021.113398
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Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications”. Jannis D, Hofer C, Gao C, Xie X, Béché, A, Pennycook Tj, Verbeeck J, Ultramicroscopy 233, 113423 (2022). http://doi.org/10.1016/j.ultramic.2021.113423
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Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process”. Jannis D, Velazco A, Béché, A, Verbeeck J, Ultramicroscopy , 113568 (2022). http://doi.org/10.1016/j.ultramic.2022.113568
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Characterization of a Timepix detector for use in SEM acceleration voltage range”. Denisov N, Jannis D, Orekhov A, Müller-Caspary K, Verbeeck J, Ultramicroscopy 253, 113777 (2023). http://doi.org/10.1016/j.ultramic.2023.113777
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Convexity constraints on linear background models for electron energy-loss spectra”. Van den Broek W, Jannis D, Verbeeck J, Ultramicroscopy 254, 113830 (2023). http://doi.org/10.1016/j.ultramic.2023.113830
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The Fresnel effect of a defocused biprism on the fringes in inelastic holography”. Verbeeck J, Bertoni G, Schattschneider P, Ultramicroscopy T2 –, 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN 108, 263 (2008). http://doi.org/10.1016/j.ultramic.2007.06.007
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Non-invasive and non-destructive examination of artistic pigments, paints, and paintings by means of X-Ray methods”. Janssens K, van der Snickt G, Vanmeert F, Legrand S, Nuyts G, Alfeld M, Monico L, Anaf W, de Nolf W, Vermeulen M, Verbeeck J, De Wael K, Topics in Current Chemistry 374, 81 (2016). http://doi.org/10.1007/S41061-016-0079-2
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Plasmon mapping in Au@Ag nanocube assemblies”. Goris B, Guzzinati G, Fernández-López C, Pérez-Juste J, Liz-Marzán LM, Trügler A, Hohenester U, Verbeeck J, Bals S, Van Tendeloo G, The journal of physical chemistry: C : nanomaterials and interfaces 118, 15356 (2014). http://doi.org/10.1021/jp502584t
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Synthesis and characterization of photoreactive TiO2carbon nanosheet composites”. Kurttepeli M, Deng S, Verbruggen SW, Guzzinati G, Cott DJ, Lenaerts S, Verbeeck J, Van Tendeloo G, Detavernier C, Bals S, The journal of physical chemistry: C : nanomaterials and interfaces 118, 21031 (2014). http://doi.org/10.1021/jp5067499
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Deeper insights into the photoluminescence properties and (photo)chemical reactivity of cadmium red (CdS1-xSex) paints in renowned twentieth century paintings by state-of-the-art investigations at multiple length scales”. Monico L, Rosi F, Vivani R, Cartechini L, Janssens K, Gauquelin N, Chezganov D, Verbeeck J, Cotte M, D'Acapito F, Barni L, Grazia C, Buemi LP, Andral J-L, Miliani C, Romani A, The European Physical Journal Plus 137, 311 (2022). http://doi.org/10.1140/EPJP/S13360-022-02447-7
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Using the macroscopic scale to predict the nano-scale behavior of YSZ thin films”. Lamas JS, Leroy WP, Lu Y-G, Verbeeck J, Van Tendeloo G, Depla D, Surface and coatings technology 238, 45 (2014). http://doi.org/10.1016/j.surfcoat.2013.10.034
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