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Author |
Title |
Year |
Publication  |
Volume |
Times cited |
Additional Links |
Links |
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|
Nord, M.; Webster, R.W.H.; Paton, K.A.; McVitie, S.; McGrouther, D.; MacLaren, I.; Paterson, G.W. |
Fast pixelated detectors in scanning transmission electron microscopy. Part I: data acquisition, live processing, and storage |
2020 |
Microscopy And Microanalysis |
26 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Paterson, G.W.; Webster, R.W.H.; Ross, A.; Paton, K.A.; Macgregor, T.A.; McGrouther, D.; MacLaren, I.; Nord, M. |
Fast pixelated detectors in scanning transmission electron microscopy. part II : post-acquisition data processing, visualization, and structural characterization |
2020 |
Microscopy And Microanalysis |
26 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
MacArthur, K.E.; Yankovich, A.B.; Béché, A.; Luysberg, M.; Brown, H.G.; Findlay, S.D.; Heggen, M.; Allen, L.J. |
Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale |
2021 |
Microscopy And Microanalysis |
|
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. |
Fast electron low dose tomography for beam sensitive materials |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
|
|
|
Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. |
Novel thin film lift-off process for in situ TEM tensile characterization |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
|
|
|
Ning, S.; Xu, W.; Ma, Y.; Loh, L.; Pennycook, T.J.; Zhou, W.; Zhang, F.; Bosman, M.; Pennycook, S.J.; He, Q.; Loh, N.D. |
Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets |
2022 |
Microscopy and microanalysis |
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|
UA library record; WoS full record; WoS citing articles |
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Yu, C.-P.; Friedrich, T.; Jannis, D.; Van Aert, S.; Verbeeck, J. |
Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM |
2022 |
Microscopy and microanalysis |
|
7 |
UA library record; WoS full record; WoS citing articles |
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De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. |
Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM |
2022 |
Microscopy and microanalysis |
|
|
UA library record; WoS full record |
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|
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Vega Ibañez, F.; Béché, A.; Verbeeck, J. |
Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? |
2022 |
Microscopy and microanalysis |
|
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Friedrich, T.; Yu, C.-P.; Verbeeck, J.; Van Aert, S. |
Phase object reconstruction for 4D-STEM using deep learning |
2023 |
Microscopy and microanalysis |
29 |
1 |
UA library record; WoS full record; WoS citing articles |
|
