List View
 |   | 
   web
Author Title Year Publication Volume Times cited Additional Links
Sanchez-Barriga, J.; Ogorodnikov, I.I.; Kuznetsov, M.V.; Volykhov, A.A.; Matsui, F.; Callaert, C.; Hadermann, J.; Verbitskiy, N.I.; Koch, R.J.; Varykhalov, A.; Rader, O.; Yashina, L.V. Observation of hidden atomic order at the interface between Fe and topological insulator Bi2Te3 2017 Physical chemistry, chemical physics 19 4 UA library record; WoS full record; WoS citing articles
Pramanik, G.; Humpolickova, J.; Valenta, J.; Kundu, P.; Bals, S.; Bour, P.; Dracinsky, M.; Cigler, P. Gold nanoclusters with bright near-infrared photoluminescence 2018 Nanoscale 10 97 UA library record; WoS full record; WoS citing articles
Lombardo, J.; Jelić, Ž.L.; Baumans, X.D.A.; Scheerder, J.E.; Nacenta, J.P.; Moshchalkov, V.V.; Van de Vondel, J.; Kramer, R.B.G.; Milošević, M.V.; Silhanek, A.V. In situ tailoring of superconducting junctions via electro-annealing 2018 Nanoscale 10 23 UA library record; WoS full record; WoS citing articles
Aierken, Y.; Sevik, C.; Gulseren, O.; Peeters, F.M.; Çakir, D. MXenes/graphene heterostructures for Li battery applications : a first principles study 2018 Journal of materials chemistry A : materials for energy and sustainability 6 131 UA library record; WoS full record; WoS citing articles
Rizzo, F.; Augieri, A.; Kursumovic, A.; Bianchetti, M.; Opherden, L.; Sieger, M.; Huehne, R.; Haenisch, J.; Meledin, A.; Van Tendeloo, G.; MacManus-Driscoll, J.L.; Celentano, G. Pushing the limits of applicability of REBCO coated conductor films through fine chemical tuning and nanoengineering of inclusions 2018 Nanoscale 10 9 UA library record; WoS full record; WoS citing articles
Kong, X.; Li, L.; Leenaerts, O.; Wang, W.; Liu, X.-J.; Peeters, F.M. Quantum anomalous Hall effect in a stable 1T-YN2 monolayer with a large nontrivial bandgap and a high Chern number 2018 Nanoscale 10 28 UA library record; WoS full record; WoS citing articles
Bueken, B.; Van Velthoven, N.; Willhammar, T.; Stassin, T.; Stassen, I.; Keen, D.A.; Baron, G.V.; Denayer, J.F.M.; Ameloot, R.; Bals, S.; De Vos, D.; Bennett, T.D. Gel-based morphological design of zirconium metal-organic frameworks 2017 Chemical science 8 168 UA library record; WoS full record; WoS citing articles
Leroux, F.; Bladt, E.; Timmermans, J.-P.; Van Tendeloo, G.; Bals, S. Annular dark-field transmission electron microscopy for low contrast materials 2013 Microscopy and microanalysis 19 5 UA library record; WoS full record; WoS citing articles
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy 2009 Microscopy and microanalysis 15 1 UA library record; WoS full record; WoS citing articles
Verlinden, G.; Gijbels, R.; Geuens, I. Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS 2002 Microscopy and microanalysis 8 1 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. Computational aspects in quantitative EELS 2010 Microscopy and microanalysis 16 UA library record
Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Verbeeck, J. EELS investigations of different niobium oxide phases 2006 Microscopy and microanalysis 12 50 UA library record; WoS full record; WoS citing articles
Bach, D.; Schneider, R.; Gerthsen, D.; Verbeeck, J.; Sigle, W. EELS of niobium and stoichiometric niobium-oxide phases: part 1: plasmon and Near-edges fine structure 2009 Microscopy and microanalysis 15 55 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Van Aert, S.; van Dyck, D. Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency 2012 Microscopy and microanalysis 18 15 UA library record; WoS full record; WoS citing articles
Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. High-quality sample preparation by low kV FIB thinning for analytical TEM measurements 2007 Microscopy and microanalysis 13 82 UA library record; WoS full record; WoS citing articles
Lu, J.; Roeffaers, M.B.J.; Bartholomeeusen, E.; Sels, B.F.; Schryvers, D. Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy 2014 Microscopy and microanalysis 20 7 UA library record; WoS full record; WoS citing articles
Tian, H.; Schryvers, D.; Shabalovskaya, S.; van Humbeeck, J. Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwire 2009 Microscopy and microanalysis 15 15 UA library record; WoS full record; WoS citing articles
Grieten, E.; Caen, J.; Schryvers, D. Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM 2014 Microscopy and microanalysis 20 UA library record; WoS full record; WoS citing articles
van Dyck, D.; Van Aert, S.; den Dekker, A.J. Physical limits on atomic resolution 2004 Microscopy and microanalysis 10 14 UA library record; WoS full record; WoS citing articles
Idrissi, H.; Turner, S.; Mitsuhara, M.; Wang, B.; Hata, S.; Coulombier, M.; Raskin, J.-P.; Pardoen, T.; Van Tendeloo, G.; Schryvers, D. Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study 2011 Microscopy and microanalysis 17 25 UA library record; WoS full record; WoS citing articles
Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy 2007 Microscopy and microanalysis 13 UA library record
Bals, S.; Radmilovic, V.; Kisielowski, C. TEM annular objective apertures fabricated by FIB 2004 Microscopy and microanalysis 10 UA library record
Ke, X.; Bals, S.; Cott, D.; Hantschel, T.; Bender, H.; Van Tendeloo, G. Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts 2010 Microscopy and microanalysis 16 42 UA library record; WoS full record; WoS citing articles
Goris, B.; Freitag, B.; Zanaga, D.; Bladt, E.; Altantzis, T.; Ringnalda, J.; Bals, S. Towards quantitative EDX results in 3 dimensions 2014 Microscopy and microanalysis 20 UA library record
Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. Ultra-high resolution electron tomography for materials science : a roadmap 2011 Microscopy and microanalysis 17 UA library record
Masenelli-Varlot, K.; Malchere, A.; Ferreira, J.; Heidari Mezerji, H.; Bals, S.; Messaoudi, C.; Garrido, S.M. Wet-STEM tomography : principles, potentialities and limitations 2014 Microscopy and microanalysis 20 9 UA library record; WoS full record; WoS citing articles
Gjorgievska, E.; Van Tendeloo, G.; Nicholson, J.W.; Coleman, N.J.; Slipper, I.J.; Booth, S. The incorporation of nanoparticles into conventional glass-ionomer dental restorative cements 2015 Microscopy and microanalysis 21 15 UA library record; WoS full record; WoS citing articles
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM 2014 Microscopy and microanalysis 20 UA library record
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C. Defect related growth of tabular AgCl(100) crystals: a TEM study 1998 UA library record; WoS full record;
Nistor, L.C.; van Landuyt, J.; Dincã, G. HREM of defects in cubic boron nitride single crystals 1998 UA library record; WoS full record;