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  Author Title Year Publication Volume Times cited Additional Links Links
Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. Plasmon holographic experiments: theoretical framework 2005 Ultramicroscopy 102 43 UA library record; WoS full record; WoS citing articles pdf doi
Van Eyndhoven, G.; Kurttepeli, M.; van Oers, C.J.; Cool, P.; Bals, S.; Batenburg, K.J.; Sijbers, J. Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials 2015 Ultramicroscopy 148 7 UA library record; WoS full record; WoS citing articles pdf url doi
Heidari Mezerji, H.; van den Broek, W.; Bals, S. A practical method to determine the effective resolution in incoherent experimental electron tomography 2011 Ultramicroscopy 111 26 UA library record; WoS full record; WoS citing articles pdf doi
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? 2012 Ultramicroscopy 114 5 UA library record; WoS full record; WoS citing articles pdf doi
Chen, D.; Goris, B.; Bleichrodt, F.; Heidari Mezerji, H.; Bals, S.; Batenburg, K.J.; de With, G.; Friedrich, H. The properties of SIRT, TVM, and DART for 3D imaging of tubular domains in nanocomposite thin-films and sections 2014 Ultramicroscopy 147 42 UA library record; WoS full record; WoS citing articles pdf url doi
Guzzinati, G.; Clark, L.; Béché, A.; Juchtmans, R.; Van Boxem, R.; Mazilu, M.; Verbeeck, J. Prospects for versatile phase manipulation in the TEM : beyond aberration correction 2015 Ultramicroscopy 151 19 UA library record; WoS full record; WoS citing articles pdf url doi
Bertoni, G.; Beyers, E.; Verbeeck, J.; Mertens, M.; Cool, P.; Vansant, E.F.; Van Tendeloo, G. Quantification of crystalline and amorphous content in porous TiO2 samples from electron energy loss spectroscopy 2006 Ultramicroscopy 106 83 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy 2009 Ultramicroscopy 109 166 UA library record; WoS full record; WoS citing articles pdf doi
Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy 2014 Ultramicroscopy 137 74 UA library record; WoS full record; WoS citing articles pdf doi
Heidari, H.; van den Broek, W.; Bals, S. Quantitative electron tomography : the effect of the three-dimensional point spread function 2013 Ultramicroscopy 135 6 UA library record; WoS full record; WoS citing articles pdf url doi
Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. Quantitative STEM normalisation : the importance of the electron flux 2015 Ultramicroscopy 159 27 UA library record; WoS full record; WoS citing articles pdf url doi
Schattschneider, P.; Verbeeck, J.; Hamon, A.L. Real space maps of atomic transitions 2009 Ultramicroscopy 109 10 UA library record; WoS full record; WoS citing articles doi
Schattschneider, P.; Ennen, I.; Stoger-Pollach, M.; Verbeeck, J.; Mauchamp, V.; Jaouen, M. Real space maps of magnetic moments on the atomic scale: theory and feasibility 2010 Ultramicroscopy 110 10 UA library record; WoS full record; WoS citing articles pdf doi
Müller, K.; Schowalter, M.; Jansen, J.; Tsuda, K.; Titantah, J.; Lamoen, D.; Rosenauer, A. Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data 2009 Ultramicroscopy 109 8 UA library record; WoS full record; WoS citing articles pdf doi
Lichtert, S.; Verbeeck, J. Statistical consequences of applying a PCA noise filter on EELS spectrum images 2013 Ultramicroscopy 125 54 UA library record; WoS full record; WoS citing articles pdf doi
Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography 2013 Ultramicroscopy 131 73 UA library record; WoS full record; WoS citing articles doi
Schattschneider, P.; Stöger-Pollach, M.; Löffler, S.; Steiger-Thirsfeld, A.; Hell, J.; Verbeeck, J. Sub-nanometer free electrons with topological charge 2012 Ultramicroscopy 115 24 UA library record; WoS full record; WoS citing articles pdf doi
Ke, X.; Bals, S.; Romo Negreira, A.; Hantschel, T.; Bender, H.; Van Tendeloo, G. TEM sample preparation by FIB for carbon nanotube interconnects 2009 Ultramicroscopy 109 21 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Bertoni, G.; Schattschneider, P. The Fresnel effect of a defocused biprism on the fringes in inelastic holography 2008 Ultramicroscopy T2 – 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN 108 15 UA library record; WoS full record; WoS citing articles pdf doi
Schattschneider, P.; Verbeeck, J. Theory of free electron vortices 2011 Ultramicroscopy 111 57 UA library record; WoS full record; WoS citing articles pdf url doi
van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. Throughput maximization of particle radius measurements by balancing size and current of the electron probe 2011 Ultramicroscopy 111 7 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Verbeeck, J.; Schryvers, D.; de Backer, S.; Scheunders, P. Tomographic spectroscopic imaging; an experimental proof of concept 2009 Ultramicroscopy 109 1 UA library record; WoS full record; WoS citing articles pdf doi
van Aarle, W.; Palenstijn, W.J.; De Beenhouwer, J.; Altantzis, T.; Bals, S.; Batenburg, K.J.; Sijbers, J. The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography 2015 Ultramicroscopy 157 562 UA library record; WoS full record; WoS citing articles pdf url doi
Zanaga, D.; Altantzis, T.; Sanctorum, J.; Freitag, B.; Bals, S. An alternative approach for ζ-factor measurement using pure element nanoparticles 2016 Ultramicroscopy 164 19 UA library record; WoS full record; WoS citing articles pdf url doi
Lobato, I.; Van Aert, S.; Verbeeck, J. Progress and new advances in simulating electron microscopy datasets using MULTEM 2016 Ultramicroscopy 168 43 UA library record; WoS full record; WoS citing articles pdf doi
Béché, A.; Juchtmans, R.; Verbeeck, J. Efficient creation of electron vortex beams for high resolution STEM imaging 2017 Ultramicroscopy 178 30 UA library record; WoS full record; WoS citing articles pdf url doi
Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy 2016 Ultramicroscopy 178 93 UA library record; WoS full record; WoS citing articles pdf url doi
Goris, B.; Meledina, M.; Turner, S.; Zhong, Z.; Batenburg, K.J.; Bals, S. Three dimensional mapping of Fe dopants in ceria nanocrystals using direct spectroscopic electron tomography 2016 Ultramicroscopy 171 13 UA library record; WoS full record; WoS citing articles pdf url doi
Kirilenko, D.A.; Brunkov, P.N. Measuring the height-to-height correlation function of corrugation in suspended graphene 2016 Ultramicroscopy 165 3 pdf doi
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design 2016 Ultramicroscopy 170 6 UA library record; WoS full record; WoS citing articles pdf url doi
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