toggle visibility
Search within Results:
Display Options:

Select All    Deselect All
List View
 |   | 
   print
  Author Title Year Publication Volume Times cited Additional Links Links
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. High-resolution electron microscopy and electron tomography: resolution versus precision 2002 Journal of structural biology 138 33 UA library record; WoS full record; WoS citing articles doi
Van Havenbergh, K.; Turner, S.; Driesen, K.; Bridel, J.-S.; Van Tendeloo, G. Solidelectrolyte interphase evolution of carbon-coated silicon nanoparticles for lithium-ion batteries monitored by transmission electron microscopy and impedance spectroscopy 2015 Energy technology 3 UA library record; WoS full record; WoS citing articles pdf url doi
Van Havenbergh, K.; Turner, S.; Marx, N.; Van Tendeloo, G. The mechanical behavior during (de)lithiation of coated silicon nanoparticles as anode material for lithium-ion batteries studied by InSitu transmission electron microscopy 2016 Energy technology 4 6 UA library record; WoS full record; WoS citing articles pdf doi
Rehor, I.; Mackova, H.; Filippov, S.K.; Kucka, J.; Proks, V.; Slegerova, J.; Turner, S.; Van Tendeloo, G.; Ledvina, M.; Hruby, M.; Cigler, P.; Fluorescent nanodiamonds with bioorthogonally reactive protein-resistant polymeric coatings 2014 ChemPlusChem 79 34 UA library record; WoS full record; WoS citing articles pdf doi
Corthals, S.; van Noyen, J.; Liang, D.; Ke, X.; Van Tendeloo, G.; Jacobs, P.; Sels, B. A cyclic catalyst pretreatment in CO2 for high yield production of Carbon nanofibers with narrow diameter distribution 2011 Catalysis letters 141 1 UA library record; WoS full record; WoS citing articles pdf doi
Wang, J.; Nguyen, M.D.; Gauquelin, N.; Verbeeck, J.; Do, M.T.; Koster, G.; Rijnders, G.; Houwman, E. On the importance of the work function and electron carrier density of oxide electrodes for the functional properties of ferroelectric capacitors 2020 Physica Status Solidi-Rapid Research Letters 14 6 UA library record; WoS full record; WoS citing articles url doi
Nord, M.; Webster, R.W.H.; Paton, K.A.; McVitie, S.; McGrouther, D.; MacLaren, I.; Paterson, G.W. Fast pixelated detectors in scanning transmission electron microscopy. Part I: data acquisition, live processing, and storage 2020 Microscopy And Microanalysis 26 4 UA library record; WoS full record; WoS citing articles url doi
Paterson, G.W.; Webster, R.W.H.; Ross, A.; Paton, K.A.; Macgregor, T.A.; McGrouther, D.; MacLaren, I.; Nord, M. Fast pixelated detectors in scanning transmission electron microscopy. part II : post-acquisition data processing, visualization, and structural characterization 2020 Microscopy And Microanalysis 26 3 UA library record; WoS full record; WoS citing articles url doi
Ning, S.; Xu, W.; Ma, Y.; Loh, L.; Pennycook, T.J.; Zhou, W.; Zhang, F.; Bosman, M.; Pennycook, S.J.; He, Q.; Loh, N.D. Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets 2022 Microscopy and microanalysis UA library record; WoS full record; WoS citing articles pdf url doi
Yu, C.-P.; Friedrich, T.; Jannis, D.; Van Aert, S.; Verbeeck, J. Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM 2022 Microscopy and microanalysis 7 UA library record; WoS full record; WoS citing articles pdf url doi
De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM 2022 Microscopy and microanalysis UA library record; WoS full record pdf url doi
Vega Ibañez, F.; Béché, A.; Verbeeck, J. Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? 2022 Microscopy and microanalysis 3 UA library record; WoS full record; WoS citing articles url doi
Friedrich, T.; Yu, C.-P.; Verbeeck, J.; Van Aert, S. Phase object reconstruction for 4D-STEM using deep learning 2023 Microscopy and microanalysis 29 1 UA library record; WoS full record; WoS citing articles url doi
van Oeffelen, L.; Van Roy, W.; Idrissi, H.; Charlier, D.; Lagae, L.; Borghs, G. Ion current rectification, limiting and overlimiting conductances in nanopores 2015 PLoS ONE 10 11 UA library record; WoS full record; WoS citing articles url doi
Abakumov, A.M.; Hadermann, J.; Van Tendeloo, G.; Antipov, E.V. Chemistry and structure of anion-deficient perovskites with translational interfaces 2008 Journal of the American Ceramic Society 91 39 UA library record; WoS full record; WoS citing articles pdf doi
Fang, P.a.; Gu, H.; Wang, P.l.; Van Landuyt, J.; Vleugels, J.; Van der Biest, O.; Effect of powder coating on stabilizer distribution in CeO2-stabilized ZrO2 ceramics 2005 Journal of the American Ceramic Society 88 11 UA library record; WoS full record; WoS citing articles doi
Bals, S.; Verbeeck, J.; Van Tendeloo, G.; Liu, Y.-L.; Grivel, J.-C. Quantitative electron microscopy of (Bi,Pb)2Sr2Ca2Cu3O10+\delta/Ag multifilament tapes during initial stages of annealing 2005 Journal of the American Ceramic Society 88 1 UA library record; WoS full record; WoS citing articles pdf doi
Batenburg, K.J.; Bals, S.; Sijbers, J.; Kübel, C.; Midgley, P.A.; Hernandez, J.C.; Kaiser, U.; Encina, E.R.; Coronado, E.A.; Van Tendeloo, G. 3D imaging of nanomaterials by discrete tomography 2009 Ultramicroscopy 109 220 UA library record; WoS full record; WoS citing articles pdf doi
Bertoni, G.; Verbeeck, J. Accuracy and precision in model based EELS quantification 2008 Ultramicroscopy 108 44 UA library record; WoS full record; WoS citing articles doi
Roelandts, T.; Batenburg, K.J.; Biermans, E.; Kübel, C.; Bals, S.; Sijbers, J. Accurate segmentation of dense nanoparticles by partially discrete electron tomography 2012 Ultramicroscopy 114 34 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Verbeeck, J.; de Backer, S.; Scheunders, P.; Schryvers, D. Acquisition of the EELS data cube by tomographic reconstruction 2006 Ultramicroscopy 106 6 UA library record; WoS full record; WoS citing articles pdf doi
Goris, B.; Roelandts, T.; Batenburg, K.J.; Heidari Mezerji, H.; Bals, S. Advanced reconstruction algorithms for electron tomography : from comparison to combination 2013 Ultramicroscopy 127 63 UA library record; WoS full record; WoS citing articles pdf url doi
Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. An alternative approach to determine attainable resolution directly from HREM images 2013 Ultramicroscopy 133 UA library record; WoS full record pdf url doi
Xu, Q.; Zandbergen, H.W.; van Dyck, D. Applying an information transmission approach to extract valence electron information from reconstructed exit waves 2011 Ultramicroscopy 111 1 UA library record; WoS full record; WoS citing articles pdf doi
de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations 2013 Ultramicroscopy 134 48 UA library record; WoS full record; WoS citing articles pdf url doi
Egoavil, R.; Gauquelin, N.; Martinez, G.T.; Van Aert, S.; Van Tendeloo, G.; Verbeeck, J. Atomic resolution mapping of phonon excitations in STEM-EELS experiments 2014 Ultramicroscopy 147 22 UA library record; WoS full record; WoS citing articles pdf url doi
Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging 1997 Ultramicroscopy 69 11 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. Correction of non-linear thickness effects in HAADF STEM electron tomography 2012 Ultramicroscopy 116 67 UA library record; WoS full record; WoS citing articles pdf doi
Niermann, T.; Verbeeck, J.; Lehmann, M. Creating arrays of electron vortices 2014 Ultramicroscopy 136 9 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Bertoni, G. Deconvolution of core electron energy loss spectra 2009 Ultramicroscopy 109 13 UA library record; WoS full record; WoS citing articles pdf doi
Select All    Deselect All
List View
 |   | 
   print

Save Citations:
Export Records: