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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. |
A comparative investigation of replication techniques used for the study of (S+Au) sensitized AgBr microcrystals |
1996 |
The journal of imaging science and technology |
40 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Zelaya, E.; Schryvers, D. |
FCC surface precipitation in Cu-Zn-Al after low angle GA+ ion irradiation |
2010 |
Materials transactions |
51 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Santamarta, R.; Schryvers, D. |
Microstructure of a partially crystallised Ti50Ni25Cu25 melt-spun ribbon |
2003 |
Materials transactions |
44 |
23 |
UA library record; WoS full record; WoS citing articles |
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|
|
Schryvers, D.; Potapov, P.L. |
R-phase structure refinement using electron diffraction data |
2002 |
Materials transactions |
43 |
25 |
UA library record; WoS full record; WoS citing articles |
|
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Yang, Z.; Schryvers, D. |
Composition gradients surrounding Ni4Ti3 precipitates in a NiTi alloy studied by EELS, EFTEM and EDX |
2006 |
International journal of applied electromagnetics and mechanics |
23 |
|
UA library record; WoS full record; |
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Penders, A.; Konstantinovic, M.J.; Van Renterghem, W.; Bosch, R.W.; Schryvers, D. |
TEM investigation of SCC crack tips in high Si stainless steel tapered specimens |
2021 |
Corrosion Engineering Science And Technology |
|
|
UA library record; WoS full record; WoS citing articles |
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Yandouzi, M.; Toth, L.; Vasudevan, V.; Cannaerts, M.; van Haesendonck, C.; Schryvers, D. |
Epitaxial Ni-Al thin films on NaCl using a Ag buffer layer |
2000 |
Philosophical magazine letters |
80 |
2 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Van Aert, S.; Delville, R.; Idrissi, H.; Turner, S.; Salje, E.K.H. |
Dedicated TEM on domain boundaries from phase transformations and crystal growth |
2013 |
Phase transitions |
86 |
|
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Ding, X.; Salje, E.K.H. |
Functional twin boundaries |
2013 |
Phase transitions |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
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Jacobs, M.; Bodart, F.; Terwagne, G.; Schryvers, D.; Poulet, A. |
Nanohardness and structure of nitrogen implanted SixAly coatings post-implanted with oxygen |
1999 |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms |
147 |
3 |
UA library record; WoS full record; WoS citing articles |
|
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Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. |
Evaluation of top, angle, and side cleaned FIB samples for TEM analysis |
2007 |
Microscopy research and technique |
70 |
36 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Zelaya, E.; Schryvers, D. |
Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite |
2011 |
Microscopy research and technique |
74 |
2 |
UA library record; WoS full record; WoS citing articles |
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Goessens, C.; Schryvers, D.; van Landuyt, J. |
Transmission electron microscopy studies of (111) twinned silver halide microcrystals |
1998 |
Microscopy research and technique |
42 |
8 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Goessens, C.; Safran, G.; Toth, L. |
Internal calibration technique for HREM studies of nanoscale particles |
1993 |
Microscopy research and technique
T2 – JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM |
25 |
1 |
UA library record; WoS full record; WoS citing articles |
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Tian, H.; Schryvers, D.; Mohanchandra, K.P.; Carman, G.P.; van Humbeeck, J. |
Fabrication and characterization of functionally graded Ni-Ti multilayer thin films |
2009 |
Functional materials letters |
2 |
9 |
UA library record; WoS full record; WoS citing articles |
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Malard, B.; Pilch, J.; Sittner, P.; Gartnerova, V.; Delville, R.; Schryvers, D.; Curfs, C. |
Microstructure and functional property changes in thin Ni-Ti wires heat teated by electric current: high energy X-ray and TEM investigations |
2009 |
Functional materials letters |
2 |
21 |
UA library record; WoS full record; WoS citing articles |
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Pourbabak, S.; Wang, X.; Van Dyck, D.; Verlinden, B.; Schryvers, D. |
Ni cluster formation in low temperature annealed Ni50.6Ti49.4 |
2017 |
Functional materials letters |
10 |
4 |
UA library record; WoS full record; WoS citing articles |
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Renard, K.; Idrissi, H.; Schryvers, D.; Jacques, P.J. |
Multiscale characterization of the work hardening mechanisms in Fe-Mn based TWIP steels |
2012 |
Steel research international |
83 |
12 |
UA library record; WoS full record; WoS citing articles |
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Fredrickx, P.; de Ryck, I.; Janssens, K.; Schryvers, D.; Petit, J.-P.; Döcking, H. |
EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments |
2004 |
X-ray spectrometry |
33 |
13 |
UA library record; WoS full record; WoS citing articles |
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Fredrickx, P.; Helary, D.; Schryvers, D.; Darque-Ceretti, E. |
A TEM study of nanoparticles in lustre glazes |
2004 |
Applied physics A : materials science & processing |
79 |
16 |
UA library record; WoS full record; WoS citing articles |
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Schalm, O.; Crabbé, A.; Storme, P.; Wiesinger, R.; Gambirasi, A.; Grieten, E.; Tack, P.; Bauters, S.; Kleber, C.; Favaro, M.; Schryvers, D.; Vincze, L.; Terryn, H.; Patelli, A. |
The corrosion process of sterling silver exposed to a Na2S solution: monitoring and characterizing the complex surface evolution using a multi-analytical approach |
2016 |
Applied Physics A-Materials Science & Processing |
122 |
9 |
|
|
|
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Idrissi, H.; Renard, K.; Schryvers, D.; Jacques, P.J. |
TEM investigation of the formation mechanism of deformation twins in Fe-Mn-Si-Al TWIP steels |
2013 |
Philosophical magazine |
93 |
15 |
UA library record; WoS full record; WoS citing articles |
|
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Delville, R.; Kasinathan, S.; Zhang, Z.; van Humbeeck, J.; James, R.D.; Schryvers, D. |
Transmission electron microscopy study of phase compatibility in low hysteresis shape memory alloys |
2010 |
Philosophical magazine |
90 |
70 |
UA library record; WoS full record; WoS citing articles |
|
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Van Tendeloo, G.; De Meulenaere, P.; Schryvers, D. |
Landscape roughness at an atomic scale |
1997 |
Physica: D : nonlinear phenomena |
107 |
2 |
UA library record; WoS full record; WoS citing articles |
|
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Satto, S.; Jansen, J.; Lexcellent, C.; Schryvers, D. |
Structure refinement of L21 Cu-Zn-Al austenite, using dynamical electron diffraction data |
2000 |
Solid state communications |
116 |
7 |
UA library record; WoS full record; WoS citing articles |
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Boulay, E.; Nakano, J.; Turner, S.; Idrissi, H.; Schryvers, D.; Godet, S. |
Critical assessments and thermodynamic modeling of BaO-SiO2 and SiO2-TiO2 systems and their extensions into liquid immiscibility in the BaO-SiO2-TiO2 system |
2014 |
Calphad computer coupling of phase diagrams and thermochemistry |
47 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
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Lu, J.; Martinez, G.T.; Van Aert, S.; Schryvers, D. |
Lattice deformations in quasi-dynamic strain glass visualised and quantified by aberration corrected electron microscopy |
2014 |
Physica status solidi: B: basic research |
251 |
2 |
UA library record; WoS full record; WoS citing articles |
|
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Idrissi, H.; Amin-Ahmadi, B.; Wang, B.; Schryvers, D. |
Review on TEM analysis of growth twins in nanocrystalline palladium thin films : toward better understanding of twin-related mechanisms in high stacking fault energy metals |
2014 |
Physica status solidi: B: basic research |
251 |
7 |
UA library record; WoS full record; WoS citing articles |
|
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Verleysen, E.; Bender, H.; Richard, O.; Schryvers, D.; Vandervorst, W. |
Characterization of nickel silicides using EELS-based methods |
2010 |
Journal of microscopy |
240 |
11 |
UA library record; WoS full record; WoS citing articles |
|
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Yang, Z.; Schryvers, D.; Roels, F.; d' Haese, P.C.; de Broe, M.E. |
Demonstration of lanthanum in liver cells by energy-dispersive X-ray spectroscopy, electron energy loss spectroscopy and high-resolution transmission electron microscopy |
2006 |
Journal of microscopy |
223 |
29 |
UA library record; WoS full record; WoS citing articles |
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