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	Author	Fredrickx, P.; de Ryck, I.; Janssens, K.; Schryvers, D.; Petit, J.-P.; Döcking, H.
	Title	EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments			Type	A1 Journal article
	Year	2004	Publication	X-ray spectrometry	Abbreviated Journal	X-Ray Spectrom
	Volume	33	Issue	5	Pages	326-333
	Keywords	A1 Journal article; Electron microscopy for materials research (EMAT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
	Abstract
	Address
	Corporate Author				Thesis
	Publisher		Place of Publication	London	Editor
	Language		Wos	000223880800002	Publication Date	2004-04-01
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	0049-8246;1097-4539;	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor	1.298	Times cited	13	Open Access
	Notes				Approved	Most recent IF: 1.298; 2004 IF: 1.391
	Call Number	UA @ lucian @ c:irua:48786			Serial	1076
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