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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. |
Electron channelling based crystallography |
2007 |
Ultramicroscopy |
107 |
32 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Broek, W.; Van Aert, S.; van Dyck, D. |
A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
16 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
Direct structure inversion from exit waves: part 1: theory and simulations |
2010 |
Ultramicroscopy |
110 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bals, S.; Goris, B.; de Backer, A.; Van Aert, S.; Van Tendeloo, G. |
Atomic resolution electron tomography |
2016 |
MRS bulletin |
41 |
19 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Salje, E.K.H. |
Direct observation of ferrielectricity at ferroelastic domain boundaries in CaTiO3 by electron microscopy |
2012 |
Advanced materials |
24 |
150 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. |
Model-based electron microscopy : from images toward precise numbers for unknown structure parameters |
2012 |
Micron |
43 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Altantzis, T.; Lobato, I.; De Backer, A.; Béché, A.; Zhang, Y.; Basak, S.; Porcu, M.; Xu, Q.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Tendeloo, G.; Van Aert, S.; Bals, S. |
Three-Dimensional Quantification of the Facet Evolution of Pt Nanoparticles in a Variable Gaseous Environment |
2019 |
Nano letters |
19 |
82 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. |
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy |
2009 |
Microscopy and microanalysis |
15 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Varambhia, A.M.; Jones, L.; De Backer, A.; Fauske, V.T.; Van Aert, S.; Ozkaya, D.; Nellist, P.D. |
Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM |
2016 |
Particle and particle systems characterization |
33 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; den Dekker, A.J.; van Dyck, D. |
How to optimize the experimental design of quantitative atomic resolution TEM experiments? |
2004 |
Micron |
35 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Liao, Z.; Huijben, M.; Zhong, Z.; Gauquelin, N.; Macke, S.; Green, R.J.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Held, K.; Sawatzky, G.A.; Koster, G.; Rijnders, G. |
Controlled lateral anisotropy in correlated manganite heterostructures by interface-engineered oxygen octahedral coupling |
2016 |
Nature materials |
15 |
273 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Friedrich, T.; Yu, C.-P.; Verbeeck, J.; Van Aert, S. |
Phase object reconstruction for 4D-STEM using deep learning |
2023 |
Microscopy and microanalysis |
29 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; Batenburg, K.J.; Rossell, M.D.; Erni, R.; Van Tendeloo, G. |
Three-dimensional atomic imaging of crystalline nanoparticles |
2011 |
Nature |
470 |
341 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Klingstedt, M.; Sundberg, M.; Eriksson, L.; Haigh, S.; Kirkland, A.; Grüner, D.; de Backer, A.; Van Aert, S.; Tarasaki, O. |
Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x\sim0.11) |
2012 |
Zeitschrift für Kristallographie |
227 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Broek, W.; Van Aert, S.; van Dyck, D. |
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency |
2012 |
Microscopy and microanalysis |
18 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. |
Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy |
2007 |
Microscopy and microanalysis |
13 |
|
UA library record |
|
|
|
Van Aert, S.; Batenburg, J.; Van Tendeloo, S. |
Atomen tellen |
2011 |
Nederlands tijdschrift voor natuurkunde (1991) |
77 |
|
UA library record |
|
|
|
Van Aert, S. |
Statistical parameter estimation theory : a tool for quantitative electron microscopy |
2012 |
|
|
|
UA library record |
|
|
|
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. |
Does a monochromator improve the precision in quantitative HRTEM? |
2001 |
Ultramicroscopy |
89 |
22 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
Optimal experimental design of STEM measurement of atom column positions |
2002 |
Ultramicroscopy |
90 |
35 |
UA library record; WoS full record; WoS citing articles |
|
|
|
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
General conclusions and future perspectives |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
|
|
Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. |
Computational aspects in quantitative EELS |
2010 |
Microscopy and microanalysis |
16 |
|
UA library record |
|
|
|
van Dyck, D.; Van Aert, S.; Croitoru, M.D. |
Obstacles on the road towards atomic resolution tomography |
2005 |
Microscoy and microanalysis |
11 |
|
UA library record |
|
|
|
Van Aert, S.; Chang, L.Y.; Bals, S.; Kirkland, A.I.; Van Tendeloo, G. |
Effect of amorphous layers on the interpretation of restored exit waves |
2009 |
Ultramicroscopy |
109 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
De Backer, A.; Van Aert, S.; Faes, C.; Arslan Irmak, E.; Nellist, P.D.; Jones, L. |
Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm |
2022 |
N P J Computational Materials |
8 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Image-quality evaluation and model selection with maximum a posteriori probability |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
|
|
Verbeeck, J.; Van Aert, S. |
Model based quantification of EELS spectra |
2004 |
Ultramicroscopy |
101 |
147 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Schryvers, D.; Salje, E.K.H.; Nishida, M.; De Backer, A.; Idrissi, H.; Van Aert, S. |
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations |
2017 |
Ultramicroscopy |
176 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Alania, M.; Lobato Hoyos, I.P.; Van Aert, S. |
Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy : a comparison study in terms of integrated intensity and atomic column position measurement |
2018 |
Ultramicroscopy |
184 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Gauquelin, N.; van den Bos, K.H.W.; Béché, A.; Krause, F.F.; Lobato, I.; Lazar, S.; Rosenauer, A.; Van Aert, S.; Verbeeck, J. |
Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques |
2017 |
Ultramicroscopy |
181 |
34 |
UA library record; WoS full record; WoS citing articles |
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