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End-to-end assembly of shape-controlled nanocrystals via a nanowelding approach mediated by gold domains”. Figuerola A, Franchini IR, Fiore A, Mastria R, Falqui A, Bertoni G, Bals S, Van Tendeloo G, Kudera S, Cingolani R, Manna L, Advanced materials 21, 550 (2009). http://doi.org/10.1002/adma.200801928
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Three-dimensional characterization of helical silver nanochains mediated by protein assemblies”. Leroux F, Gysemans M, Bals S, Batenburg KJ, Snauwaert J, Verbiest T, van Haesendonck C, Van Tendeloo G, Advanced materials 22, 2193 (2010). http://doi.org/10.1002/adma.200903657
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Advanced electron microscopy for advanced materials”. Van Tendeloo G, Bals S, Van Aert S, Verbeeck J, van Dyck D, Advanced materials 24, 5655 (2012). http://doi.org/10.1002/adma.201202107
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Enhanced self-assembly of metal oxides and metal-organic frameworks from precursors with magnetohydrodynamically induced long-lived collective spin states”. Breynaert E, Emmerich J, Mustafa D, Bajpe SR, Altantzis T, Van Havenbergh K, Taulelle F, Bals S, Van Tendeloo G, Kirschhock CEA, Martens JA;, Advanced materials 26, 5173 (2014). http://doi.org/10.1002/adma.201400835
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Intracellular fate of hydrophobic nanocrystal self-assemblies in tumor cells”. Nicolas-Boluda A, Yang Z, Dobryden I, Carn F, Winckelmans N, Pechoux C, Bonville P, Bals S, Claesson PM, Gazeau F, Pileni MP, Advanced Functional Materials 30, 2004274 (2020). http://doi.org/10.1002/ADFM.202004274
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Assisted spray pyrolysis production and characterisation of ZnO nanoparticles with narrow size distribution”. Turner S, Tavernier SMF, Huyberechts G, Bals S, Batenburg KJ, Van Tendeloo G, Journal of nanoparticle research 12, 615 (2010). http://doi.org/10.1007/s11051-009-9630-1
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Seeing and measuring in 3D with electrons”. Bals S, Goris B, Altantzis T, Heidari H, Van Aert S, Van Tendeloo G, Comptes rendus : physique 15, 140 (2014). http://doi.org/10.1016/j.crhy.2013.09.015
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Phase formation and texture of thin nickel germanides on Ge(001) and Ge(111)”. De Schutter B, Van Stiphout K, Santos NM, Bladt E, Jordan-Sweet J, Bals S, Lavoie C, Comrie CM, Vantomme A, Detavernier C, Journal of applied physics 119, 135305 (2016). http://doi.org/10.1063/1.4945317
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Controlling the formation and stability of ultra-thin nickel silicides : an alloying strategy for preventing agglomeration”. Geenen FA, van Stiphout K, Nanakoudis A, Bals S, Vantomme A, Jordan-Sweet J, Lavoie C, Detavernier C, Journal of applied physics 123, 075303 (2018). http://doi.org/10.1063/1.5009641
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Structural characterization of Er-doped Li2O-Al2O3-SiO2 glass ceramics”. Krsmanovic R, Bals S, Bertoni G, Van Tendeloo G, Optical materials 30, 1183 (2008). http://doi.org/10.1016/j.optmat.2007.05.045
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A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection”. De Backer A, Bals S, Van Aert S, Ultramicroscopy , 113702 (2023). http://doi.org/10.1016/j.ultramic.2023.113702
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The influence of acids on tuning the pore size of mesoporous TiO2 templated by non-ionic block copolymers”. Loreto S, Vanrompay H, Mertens M, Bals S, Meynen V, European journal of inorganic chemistry 2018, 62 (2018). http://doi.org/10.1002/EJIC.201701266
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A new Bi4Mn1/3W2/3O8Cl Sillén-Aurivillius intergrowth: synthesis and structural characterisation by quantitative transmission electron microscopy”. Avila-Brande D, Otero-Díaz LC, Landa-Cánovas AR, Bals S, Van Tendeloo G, European journal of inorganic chemistry , 1853 (2006). http://doi.org/10.1002/ejic.200501021
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Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals”. Jain N, Hao Y, Parekh U, Kaltenegger M, Pedrazo-Tardajos A, Lazzaroni R, Resel R, Geerts YH, Bals S, Van Aert S, Micron 169, 103444 (2023). http://doi.org/10.1016/j.micron.2023.103444
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On the use of TEM in the characterization of nanocomposites”. Monticelli O, Musina Z, Russo S, Bals S, Materials letters 61, 3446 (2007). http://doi.org/10.1016/j.matlet.2006.11.086
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Optimized fabrication of high-quality La0.67Sr0.33MnO3 thin films considering all essential characteristics”. Boschker H, Huijben M, Vailinois A, Verbeeck J, Van Aert S, Luysberg M, Bals S, Van Tendeloo G, Houwman EP, Koster G, Blank DHA, Rijnders G, Journal of physics: D: applied physics 44, 205001 (2011). http://doi.org/10.1088/0022-3727/44/20/205001
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Tuning of the size and the lattice parameter of ion-beam synthesized Pb nanoparticles embedded in Si”. Wang H, Cuppens J, Biermans E, Bals S, Fernandez-Ballester L, Kvashnina KO, Bras W, van Bael MJ, Temst K, Vantomme A, Journal of physics: D: applied physics 45, 035301 (2012). http://doi.org/10.1088/0022-3727/45/3/035301
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Oxidation barrier of Cu and Fe powder by Atomic Layer Deposition”. Cremers V, Rampelberg G, Barhoum A, Walters P, Claes N, Oliveira TM de, Assche GV, Bals S, Dendooven J, Detavernier C, Surface and coatings technology 349, 1032 (2018). http://doi.org/10.1016/j.surfcoat.2018.06.048
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Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp”. Guzzinati G, Altantzis T, Batuk M, De Backer A, Lumbeeck G, Samaee V, Batuk D, Idrissi H, Hadermann J, Van Aert S, Schryvers D, Verbeeck J, Bals S, Materials 11, 1304 (2018). http://doi.org/10.3390/ma11081304
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Real‐Time Reconstruction of Arbitrary Slices for Quantitative and In Situ 3D Characterization of Nanoparticles”. Vanrompay H, Buurlage J‐W, Pelt DM, Kumar V, Zhuo X, Liz‐Marzán LM, Bals S, Batenburg KJ, Particle &, Particle Systems Characterization 37, 2000073 (2020). http://doi.org/10.1002/ppsc.202000073
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Estimation of temperature homogeneity in MEMS-based heating nanochips via quantitative HAADF-STEM tomography”. Chen Q, Skorikov A, van der Hoeven JES, van Blaaderen A, Albrecht W, Perez-Garza HH, Bals S, Particle and particle systems characterization 41, 1 (2023). http://doi.org/10.1002/PPSC.202300070
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Quantitative electron microscopy of (Bi,Pb)2Sr2Ca2Cu3O10+\delta/Ag multifilament tapes during initial stages of annealing”. Bals S, Verbeeck J, Van Tendeloo G, Liu Y-L, Grivel J-C, Journal of the American Ceramic Society 88, 431 (2005). http://doi.org/10.1111/j.1551-2916.2005.00094.x
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An alternative approach for ζ-factor measurement using pure element nanoparticles”. Zanaga D, Altantzis T, Sanctorum J, Freitag B, Bals S, Ultramicroscopy 164, 11 (2016). http://doi.org/10.1016/j.ultramic.2016.03.002
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Three dimensional mapping of Fe dopants in ceria nanocrystals using direct spectroscopic electron tomography”. Goris B, Meledina M, Turner S, Zhong Z, Batenburg KJ, Bals S, Ultramicroscopy 171, 55 (2016). http://doi.org/10.1016/j.ultramic.2016.08.017
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Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure”. Alania M, Altantzis T, De Backer A, Lobato I, Bals S, Van Aert S, Ultramicroscopy 177, 36 (2016). http://doi.org/10.1016/j.ultramic.2016.11.002
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An alternative approach for \zeta-factor measurement using pure element nanoparticles”. Zanaga D, Altantzis T, Sanctorum J, Freitag B, Bals S, Ultramicroscopy 164, 11 (2016). http://doi.org/10.1016/J.ULTRAMIC.2016.03.002
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A bimodal tomographic reconstruction technique combining EDS-STEM and HAADF-STEM”. Zhong Z, Goris B, Schoenmakers R, Bals S, Batenburg KJ, Ultramicroscopy 174, 35 (2017). http://doi.org/10.1016/j.ultramic.2016.12.008
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Automated discrete electron tomography &ndash, Towards routine high-fidelity reconstruction of nanomaterials”. Zhuge X, Jinnai H, Dunin-Borkowski RE, Migunov V, Bals S, Cool P, Bons A-J, Batenburg KJ, Ultramicroscopy 175, 87 (2017). http://doi.org/10.1016/j.ultramic.2017.01.009
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Automatic correction of nonlinear damping effects in HAADF-STEM tomography for nanomaterials of discrete compositions”. Zhong Z, Aveyard R, Rieger B, Bals S, Palenstijn WJ, Batenburg KJ, Ultramicroscopy 184, 57 (2018). http://doi.org/10.1016/J.ULTRAMIC.2017.10.013
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Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges”. Vanrompay H, Skorikov A, Bladt E, Béché, A, Freitag B, Verbeeck J, Bals S, Ultramicroscopy 221, 113191 (2021). http://doi.org/10.1016/j.ultramic.2020.113191
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